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自動車テストソリューションのまとめページ 
お客様の導入事例、技術セミナー資料、測定器の適用例などを随時更新中。

アプリケーション・ノート 2017-04-24

 
Keysight EEsof EDAユーザ向けメールマガジン -- しみゅレター 
キーサイトEDAソリューションの技術情報やアプリケーション情報を定期的にお知らせするEメールニュースレターです。

ニュースレター 2017-04-21

 
Connected Car Technology Test Solutions 
Address challenges of designing, verifying and testing the latest connected car technologies

競合比較 2017-04-19

 
eCall/ERA-GLONASS Conformance Testing with Keysight E6950A - Application Note 
This application note discusses how designers can use the Keysight eCall test setup to emulate the various elements of a real eCall environment comprising GPS, automobile, cellular network and PSAP.

アプリケーション・ノート 2017-04-12

PDF PDF 2.89 MB
EV1003A Hybrid-Electric/Electric Vehicle Power Converter Test Solution - Brochure 
EV1003A Solution Brochure.

ブローシャ 2017-04-10

PDF PDF 1.69 MB
Early Design Review or Boundary Scan in Enhancing Testability and Optimazation of Test Strategy 
With complexities of PCB design scaling and manufacturing processes adopting to environmentally friendly practices raise challenges in ensuring structural quality of PCBs.

記事 2017-04-01

PDF PDF 417 KB
E6950A eCall Conformance Test Solution - Configuration Guide 
This configuration guide helps you configure your eCall test reference solution with the E7515A UXM Wireless Test Set with PSAP software, and N5172B EXG X-Series RF Vector Signal Generator with N7609B.

構成ガイド 2017-03-30

PDF PDF 2.08 MB
Limited Parts Agreement 
Keysight understands these difficult challenges that manufacturers face, and has designed the Limited Parts Agreement – a new affordably-priced supportprogram targeting our customers’ special needs.

ブローシャ 2017-03-28

PDF PDF 589 KB
i3070 In-Circuit Test System Onsite Agreement - Data Sheet 
Keysight's system onsite agreement provides short term rental of the i3070 system, preconfigured according to the customer’s needs, together with the latest hardware and software.

データシート 2017-03-22

PDF PDF 728 KB
STMicroelectronics and University of Lyon Predict EMI Using ADS - Case Study 
Learn how STMicroelectronics and University of Lyon designers used ADS to develop a network parameter block technique to satisfy their need for accurate and general EMI modeling.

事例紹介 2017-03-17

PDF PDF 509 KB
Python Programming integration with IC-CAP 
Learn what versions of IC-CAP are supported and see an example of how to get the MOSFET threshold voltage using Python in this blog post.

記事 2017-03-16

 
Global Device Modeling Services - Brochure 
Keysight Technologies' Device Modeling Services delivers accurate device parameters rapidly for your advanced devices.

ブローシャ 2017-03-16

PDF PDF 1.59 MB
Electronic Components Tolerance and Test Limits for In-Circuit Test - Technical Overview 
In order for all assembled components to function correctly, components are measured and analyzed electrically using the In-circuit tester to ensure its value and performance are optimal.

技術概要 2017-03-10

PDF PDF 634 KB
x1149 Boundary Scan Solution for Blade Server Board - Application Note 
This application note describes in detail what the Keysight x1149 Boundary Scan Analyzer performs during the Integrity test.

アプリケーション・ノート 2017-03-02

PDF PDF 6.17 MB
Understanding x1149 Integrity Test - Application Note 
This application note describes in detail what the Keysight x1149 Boundary Scan Analyzer performs during the Integrity test.

アプリケーション・ノート 2017-02-16

PDF PDF 2.48 MB
Advanced Design System - Brochure 
This Brochure highlights the features of Keysight EEsof EDA's Advanced Design System (ADS); the industry's premier RF, Microwave and High-Speed Design platform.

ブローシャ 2017-02-10

PDF PDF 2.45 MB
B2900 SMUを使用した3電極法によるリチウムイオン電池/センサの電気化学測定 

アプリケーション・ノート 2017-02-08

Why Device Modeling Services? 
IC design stands on the shoulders of device modeling and characterization.

記事 2017-02-03

 
Automotive Serial Bus Testing - Application Note 
This application note will show examples of characterizing the performance of various automotive serial buses using Keysight oscilloscopes and provide a summary of recommended probing solutions.

アプリケーション・ノート 2017-01-26

N5393F/G PCI Express® 4.0 (Gen4) Software for Infiniium Oscilloscopes - Data Sheet 
The N5393F/G PCI Express electrical performance validation and compliance software provides accurate and automated transmitter testing devices for single and multi lane test setup reducing test time.

データシート 2017-01-25

PDF PDF 1008 KB
Transconductance Modeling for Low-Power Design 
Raj Sodhi explains how to extract Gm near Vth using Keysight’s Model Builder Program (MBP) in 3 simple steps.

雑誌記事 2017-01-18

 
【コネクテッドカー】eCall / ERA-GRONASS 車載デバイスの性能評価およびコンフォーマンス・テスト 
- 安価なテスト環境が欲しい! - 基本性能の検証だけじゃなく、 オプション機能や性能評価もしたい! - 信頼できるテスト環境が欲しい! そんな声に応えます!

ブローシャ 2017-01-16

PDF PDF 579 KB
CAN Eye-Diagram Mask Testing - Application Note 
InfiniiVision X-Series scopes can trigger, decode, and perform eye-diagram mask test measurements on differential CAN bus signals, as well as perform analysis on other serial bus standards.

アプリケーション・ノート 2017-01-12

PDF PDF 3.90 MB
Using Oscilloscope Segmented Memory for Serial Bus Applications - Application Note 
Learn how to use an oscilloscope's segmented memory to capture a longer time span and more serial packets while still digitizing at a high sample rate.

アプリケーション・ノート 2017-01-10

【車載レーダー】24 / 76 / 79GHz帯 送受信/部品性能評価 
高分解能、広視野角なミリ波衝突防止レーダーの設計評価に

ブローシャ 2016-12-28

PDF PDF 597 KB

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