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Mini In-Circuit Tester - Data Sheet 
Keysight Mini In-Circuit Tester is a modular in-circuit test unit fitting a typical 19-inch rack to flexibly complement existing tests in your manufacturing line to increase defects test coverage.

產品型錄 2016-03-07

Mini In-Circuit Tester - Application Note 
This application note discusses the SCPI commands and the potential use models with the modular Keysight Mini In-Circuit Tester.

應用手冊 2016-03-02

PXIe Vector Network Analyzer M937xA - Product Fact Sheet 
This two page flyer highlights the features and benefits of the Keysight PXI vector network analyzer which is a full two-port VNA that fits in just one slot.

型錄 2016-02-25

PDF PDF 617 KB
Keysight Unveils Latest Release of its Device Modeling and Characterization Software Tool Suite 
Keysight announces the newest release of its industry-leading device modeling and characterization software suite: IC-CAP 2016, MBP 2016, and MQA 2016.

新聞資料 2016-02-22

 
Right Load Switching and Simulation Design Choices for High Current and Mechatronic Functional Tests 
Key considerations for designing a cost-effective high-power switching and load management automotive functional test solution.

應用手冊 2016-02-22

PDF PDF 967 KB
Testing a Network Communication PCBA from Prototype to Manufacturing - Article Reprint 
Early implementation of BST can cut test costs and time.

專文 2016-02-17

PDF PDF 178 KB
New IEEE Standards for Board and System Tests - Article Reprint 
This article highlights of changes to IEEE Std 1149.1, IEEE Std 1149.6, IEEE P1149.10 and IEEE P1838.

專文 2016-02-16

PDF PDF 190 KB
The Boundary Scan Toolbox - Article Reprint 
Find out how boundary scan can enable embedded and other value-added test in your toolbox.

專文 2016-02-16

PDF PDF 409 KB
I'm a Board Test Engineer and I'm Loving It! - Article Reprint 
Life on the road can be relentless, but it’s never boring. Find out why from this personal story of a test engineer.

專文 2016-02-12

PDF PDF 178 KB
How to Model RF Passive Devices: Spiral Inductors 
This video explains and demonstrates a method to develop accurate Spice models based on verified S-parameter measurements. The video walks you through the entire modeling flow for two RF spiral inductors using IC-CAP.

使用說明影片 2016-02-11

 
Genesys Overview 
Genesys continues to offer the industry’s most powerful RF circuit and system synthesis capabilities in an affordable, accurate and easy-to-use simulation software that you’ve come to love. Keysight Sys-Parameters provide breakthrough convenience in using component datasheet parameters such as amplifier P1dB, IP3, gain and noise figure over frequency, temperature and bias for simulation without the need to create custom files and equations.

基本展示 2016-02-11

 
Emulating Analog Input Sensors in Automotive Electronics Functional Test - Article Reprint 
This article discusses guidelines for evaluating the digital-analog converters for your automotive electronics functional test needs.

專文 2016-02-09

PDF PDF 318 KB
Manufacturing Test Solutions for SSDS - Article Reprint 
A new system performs both ICT and boundary scan in high-volume settings.

專文 2016-02-09

PDF PDF 222 KB
Tester for Hire - Article Reprint 
This article explores the possibility of renting test equipment to help electronics manufacturers juggle capacity according to production demand and available resources.

專文 2016-02-09

PDF PDF 381 KB
Testing the Internet of Things - Article Reprint 
Connectivity is embedded in the electronics ecosystem. And test should be embedded in the devices that support it.

專文 2016-02-09

PDF PDF 79 KB
Finding Fault - Article Reprint 
testing mission-critical functions in automotive electronics.

專文 2016-02-05

PDF PDF 452 KB
Making Boundary Scan Easy - Article Reprint 
Testing boundary scan devices no longer need be a laborious task.

專文 2016-02-03

PDF PDF 217 KB
Testing of Small Form-Factor Products - Article Reprint 
Boundary scan and embedded test will need to make up for ICT gaps.

專文 2016-02-03

PDF PDF 546 KB
Testing New Grounds in Automotive Electronics - Article Reprint 
Manufacturers are increasingly designing products for ease of test.

專文 2016-02-02

PDF PDF 279 KB
Automating In-Circuit Test - Article Reprint 
Inline ICT is not as cumbersome as it used to be, and in the longer run, will help manufacturers save costs.

專文 2016-02-02

PDF PDF 87 KB
在 YouTube 網站上觀看 ADS 影片 
YouTube 網站上 Keysight EEsof EDA 頻道的先進設計系統(ADS)影片播放清單

基本展示 2016-01-28

 
TS-8989 PXI Functional Test System - Brochure 
The TS-8989 PXI functional tester helps you achieve a lower cost of test for automotive electronic control units and industrial electronics.

型錄 2016-01-28

PDF PDF 671 KB
Genesys 2015 Software Enables Industry’s Fastest Realization of RF Systems and Circuits 
Keysight announces the latest release of its industry leading, affordable RF simulation and synthesis software, Genesys 2015. Designed for circuit and system designers, the software features breakthrough Keysight Sys-Parameters that enables RF system simulation with off-the-shelf component datasheets; and comprehensive RF circuit synthesis to enable the industry’s fastest realization of RF systems and circuits.

新聞資料 2016-01-26

 
Low-Frequency Noise Measurement System Adopted by China CEPREI Laboratory for Reliability Studies 
Keysight announces that CEPREI Laboratory has successfully adopted the Keysight EEsof EDA E4727A Advanced Low-Frequency Noise Analyzer (A-LFNA) for measurement and analysis of flicker noise (1/f noise) and random telegraph noise (RTN) during its reliability studies of semiconductor devices including MOSFETs, HEMTs and TFTs.

新聞資料 2016-01-25

 
模型建構程式(MBP)軟體 
MBP 是一應俱全的解決方案,能夠自動、靈活地進行矽元件建模。

型錄 2016-01-25

PDF PDF 930 KB

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