您可能感興趣的網頁。 觀看搜尋結果:

 

聯絡是德專家

元件與特定裝置

縮小範圍

依產業/技術

依內容類型

依產品分類

101-125 / 518

排序:
Model Quality Assurance (MQA) 
MQA provides the complete solution and framework to fabless design companies, IDMs, and foundries for SPICE model library validation, comparison, and documentation.

型錄 2016-01-25

PDF PDF 3.13 MB
Low-Frequency Noise Measurement System Adopted by China CEPREI Laboratory for Reliability Studies 
Keysight announces that CEPREI Laboratory has successfully adopted the Keysight EEsof EDA E4727A Advanced Low-Frequency Noise Analyzer (A-LFNA) for measurement and analysis of flicker noise (1/f noise) and random telegraph noise (RTN) during its reliability studies of semiconductor devices including MOSFETs, HEMTs and TFTs.

新聞資料 2016-01-25

 
Model Builder Program (MBP) 
MBP is a one-stop solution that provides both automation and flexibility for silicon device modeling.

型錄 2016-01-25

PDF PDF 930 KB
模型建構程式(MBP)軟體 
MBP 是一應俱全的解決方案,能夠自動、靈活地進行矽元件建模。

型錄 2016-01-25

PDF PDF 930 KB
Boundary Scan DFT Guidelines for Good Chain Integrity and Test Coverage - Application Note 
This application note provides some key guidelines to enable good design for testability using boundary scan.

應用手冊 2016-01-21

PDF PDF 1.99 MB
TS-8989 Automotive Body and Safety Test Reference Solution – Configuration Guide 
This configuration guide contains information to help you configure your body and safety test reference solution with the TS-8989 functional tester, and tailor the system to meet your requirements.

配置設定指南 2016-01-20

PDF PDF 2.55 MB
Increasing Reliability and Efficiency in Power Converter Designs Part 1 - Application Note 
This application note will provide insight into increasing reliability and efficiency in next-generation power converter designs.

應用手冊 2016-01-12

PDF PDF 2.20 MB
Increasing Reliability and Efficiency in Power Converter Designs Part 2 - Application Note 
This application note part 2 will provide insight into increasing reliability and efficiency in next-generation power converter designs.

應用手冊 2016-01-11

PDF PDF 977 KB
Increasing Reliability and Efficiency in Power Converter Designs Part 3 - Application Note 
This application note part 3 will provide insight into increasing reliability and efficiency in next-generation power converter designs.

應用手冊 2016-01-11

PDF PDF 1.29 MB
Increasing Reliability and Efficiency in Power Converter Designs Part 4 - Application Note 
This application note part 4 is the final in the series, and will provide insight into increasing reliability and efficiency in next-generation power converter designs.

應用手冊 2016-01-11

PDF PDF 1.55 MB
The Modelithics COMPLETE Library v12.3 for Keysight Technologies' Genesys RF Simulation Tool 
Modelithics announces the release of a new version of The Modelithics® COMPLETE Library, version 12.3, for use with Genesys RF simulation and synthesis software.

新聞資料 2016-01-08

 
Leti to collaborate with Keysight Technologies to enable expansion of FD-SOI technology 
CEA-Leti announces it has signed an agreement with Keysight Technologies, a device-modeling software supplier, to adapt Leti’s UTSOI extraction flow methodology within Keysight’s device modeling solutions for high-volume SPICE model generation.

新聞資料 2015-12-08

 
E5080A ENA Series Network Analyzer - Configuration Guide 
This configuration guide describes standard configurations, options, accessories and peripherals for the E5080A network analyzers.

配置設定指南 2015-12-01

Quickly Validate Designs for DOCSIS 3.1 Compliance - Application Brief 
This “DOCSIS 3.1 Test Solution" app brief gives insight into Keysight solutions that can be used for testing DOCSIS 3.1 transmitters, receivers and components.

應用手冊 2015-11-14

TS-8989 System Integration Guide - Application Note 
In today’s manufacturing environment, floor space is an increasingly invaluable variable in the cost of test equation.

應用手冊 2015-11-11

PDF PDF 2.87 MB
Alliance for Wireless Power (A4WP) Measurements Using an Oscilloscope (Part 1) - Application Note 
This application note is Part 1 of a 3-part series on A4WP wireless charging measurements. This part focuses on performing ITX_COIL measurements during the power transfer state (non-beacons).

應用手冊 2015-11-06

Alliance for Wireless Power (A4WP) Measurements Using an Oscilloscope (Part 3) - Application Note 
Power and Efficiency Measurements. This application note is Part 3 of a 3-part series on A4WP wireless charging measurements. This part focuses on performing power and efficiency measurements.

應用手冊 2015-11-06

Alliance for Wireless Power (A4WP) Measurements Using an Oscilloscope (Part 2) - Application Note 
This application note is Part 2 of a 3-part series on A4WP wireless charging measurements. This part focuses on performing ITX_COIL measurements during the power save state (beacons), including beacon.

應用手冊 2015-11-06

Automotive Body and Safety Electronics Test - Solution Brochure 
These Keysight PXI-based reference solutions for automotive electronics body and safety functional tests help halve the time to design, integrate and implement systems for electronics functional test.

型錄 2015-11-05

PDF PDF 1.87 MB
Keysight Selects Fraunhofer EMFT as its First Low-Frequency Noise Reference Center for EMEAI 
Keysight announces that Fraunhofer Research Institution for Microsystems and Solid State Technologies EMFT (Fraunhofer EMFT) is the first low-frequency noise measurements reference center able to demonstrate the Keysight EEsof EDAs E4727A Advanced Low-Frequency Noise Analyzer in Europe, the Middle East, Africa and India (EMEAI).

新聞資料 2015-11-04

 
Using Automatic Synthesis of RF, Microwave & Analog Circuits to Increase Design Productivity by 10x 
Microwave Product Digest's October 2015 Featured Article written by How-Siang Yap of Keysight Technologies.

專題報導 2015-10-28

 
How to Model RF Passive Devices: Capacitors and Resistors 
This video explains and demonstrates a method to develop accurate Spice models from verified S-parameter measurements. The video walks you through the entire modeling flow for an on-wafer capacitor using IC-CAP.

使用說明影片 2015-10-27

 
Ensure your mobile and smart devices comply with the CTIA Battery Life Test Plan – W2BI 
Ensure your mobile and smart devices comply with the CTIA Battery Life Test Plan – W2BI and Keysight

解決方案簡介 2015-10-09

 
Keysight Technologies to Demonstrate Latest Simulation Software Solutions at CSICS 
Keysight announces it will demonstrate its latest RF circuit, system and 3-D electromagnetic design and electro-thermal simulation software solutions at the Compound Semiconductor IC Symposium (CSICS 2015), Sheraton New Orleans, Booth 601, New Orleans, Oct. 11-14.

新聞資料 2015-10-08

 
Characterizing MEMS Magneto-Impedance Sensor using the Keysight Impedance Analyzer 
This application note describes the benefits of using Agilent impedance analyzers for device characterization of MEMS Magneto-Impedance (MI) sensors and how they improve design and test efficiency while offering a wide variety of design-automation tools and functions.

應用手冊 2015-10-05

上一個 1 2 3 4 5 6 7 8 9 10 ... 下一頁