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Application Information About Specific Components & Devices

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International Microwave Symposium (IMS) 2017 
June 4 - 9, 2017; Honolulu, Hawaii

Tradeshow

 
Automated Test / Board Test User Groups (ATUG) 
These User Group meetings (ATUG) are held at various cities across the US.

Seminar

 
89th ARFTG Microwave Measurement Conference 
Ala Moana Hotel; June 9, 2017

Tradeshow

 
Keysight Test-Drive 2017 
Various dates and locations in 2017

Seminar

 
IEEE Symposium on Electromagnetic Compatibility and Signal Integrity  
Washington, DC; August 8 – 10, 2017

Tradeshow

 
RF Back to Basics Seminar 
Various dates and locations

Seminar

 
Design Automation Conference (DAC) 2017 
June 19 - 22 2017; Austin, TX

Tradeshow

 
Digital Design and Test Webcast Series 
Live and on-demand broadcasts that will teach you new measurement techniques that will help you get your product to market faster

Webcast

 
Advancements in Non-Destructive Testing of Composite Materials Webcast 
Original broadcast April 26, 2017

Webcast - recorded

 
2017 Electronic Measurement Course Calendar for the United States and Canada 
List of Electronic Measurement courses offered in for the United States and Canada

Classroom Training

 
Test at Breakneck Speeds with System Power Supplies Webcast 
Original broadcast March 30, 2017

Webcast - recorded

 
RF Design and Test Webcast Series 
Master the basics and understand future trends with these live and on-demand webcasts

Webcast

 
Millimeter-wave Challenges Webcast 
Original broadcast February 23, 2017

Webcast - recorded

 
Fundamentals of IV Measurements Webcast 
Original broadcast February 8, 2017

Webcast - recorded

 
mmWave Antenna Design Made Easy in ADS 
Original broadcast February 2, 2017

Webcast - recorded

 
Making Sense of Wireless Sensor Power Consumption Webcast 
Original broadcast January 31, 2017

Webcast - recorded

 
2017 Keysight EEsof EDA Training Course Calendar 
Scheduled Keysight EEsof courses for the United States and Canada

Classroom Training

 
Build-a-Beam - Hands-on Phased Array/Beamforming Workshop 
Various dates and locations in 2017

Seminar

 
High Sensitivity Current Measurements and Probing Solutions 
Original broadcast January 11, 2017

Webcast - recorded

 
Solving Design and Test Challenges for Medical Devices 
Webcast series

Webcast

 
Using WaferPro Express with B2200A Switch Matrix 
We demonstrate sequencing measurements on packaged devices using a B2200A switch matrix, E5270B source measurement unit and socket test fixture. In this paper, we successfully automated the measurement of 8 BJT devices in a single 24 pin package.

Seminar Materials 2016-12-21

PDF PDF 2.35 MB
3070 Family Maintenance Fundamentals 
Gain an understanding of the Keysight 3070 service documentation, Confirmation and Diagnostics, System level card operation, power, analog, digital, and control subsystem operation and troubleshooting.

Classroom Training

 
5DX Cooperative Maintenance Training, Part 2 
Troubleshooting and repairing a Keysight 5DX in-house gets you back in production fast.

Classroom Training

 
3070 Boundary Scan 
Learn concepts of Boundary-Scan technology. TAP (test access port), the functionality of registers (BYPASS, boundary, IDCODE), and the structure of the "boundary-cell" are described.

Classroom Training

 
Fundamentals of Transient Low-Current Measurement Webcast 
Original broadcast October 25, 2016

Webcast - recorded

 

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