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Challenges and Solutions for Power Electronics Testing Applications - Technical Overview 
This technical overview introduces Keysight solutions for power electronics applications.

Technical Overview 2015-09-03

Challenges and Solutions for Power Testing in Automotive Applications - Technical Overview 
This technical overview provides a synopsis of automotive electronic systems, the challenges they face and what tools automotive electronics engineers need to meet them. It concludes with a discussion of Keysight’s solutions to these challenges.

Technical Overview 2015-06-25

Characterization of PCB Insertion Loss with a New Calibration Method - Application Note 
In this application note a new method for characterizing PCB loss by using AFR with 1X Open fixtures is proposed.

Application Note 2015-03-26

PDF PDF 700 KB
Characterizing Electromagnetic MEMS Optical Scanner using the E4980A 
This application brief describes how the Keysight E4980A can greatly improve the test efficiency of electromagnetic MEMS optical scanners.

Application Note 2007-04-04

Characterizing Electromagnetic MEMS Optical Switch Actuator using the E4980A 
This application brief describes how the Keysight E4980A improves the test efficiency of electromagnetic MEMS optical switch actuators.

Application Note 2007-04-04

Characterizing MEMS Magneto-Impedance Sensor using the Keysight Impedance Analyzer 
This application note describes the benefits of using Agilent impedance analyzers for device characterization of MEMS Magneto-Impedance (MI) sensors and how they improve design and test efficiency while offering a wide variety of design-automation tools and functions.

Application Note 2015-10-05

Characterizing the I-V Curve of Solar Cells and Modules 
This measurement brief explores the various test and measurement tools you can use for I-V curve characterization and provides tips to help you choose the instrument or instruments that best fit your solar cell or module measurement needs.

Application Note 2014-07-31

Cheetah PNA RCS and Antenna Measurement System 
Introducing a radar measurement system based on Keysight's PNA network analyzer. Reprinted with permission of SPC Corp.

Application Note 2004-03-03

PDF PDF 582 KB
Compact Hierarchical Bipolar Transistor Modeling with HiCUM 
An international series on advances in solid state electronics and technology by Michael Schroter and Anjan Chakravorty.

Promotional Materials 2010-08-01

PDF PDF 330 KB
Comparing AOI and AXI 
Choosing the right technology requires looking at board mix, capital budget and other business considerations. But most of all, you need to understand the typical characteristics of each technology.

Application Note 2001-07-25

PDF PDF 42 KB
Comparing Boundary Scan Methods White Paper 
The need for reusable tests is driving standalone boundary scan-ICT integration. This article first appeared in the September 2009 issue of Circuits Assembly and is reprinted with kind permission.

Article 2014-07-31

PDF PDF 2.75 MB
Comparing In-house and Commercial Load Solutions for Automotive Test 

Article 2012-07-17

 
Comparison of Mixer Characterization using New Vector Characterization Techniques – White Paper 
This paper presents a novel method for characterizing RF mixers, yielding magnitude, phase, and group delay response of the conversion loss, as well as the input match and output match.

Application Note 2002-10-04

Complete Analysis of Erbium-Doped Fiber Amplifiers 
This Technical Paper discusses methods and instruments for measuring EDFAs with respect to gain and noise figure, both in static and dynamic form, polarization dependence, polarization mode dispersion, WDM characteristics and more. The influence of the spectral width of the laser source on the...

Application Note 1996-03-01

PDF PDF 142 KB
Complete S-Parameter and Distortion Measurement for Wide Band Video Amplifier (AN 357-2) 
This Application Note is for information only. Keysight no longer sells or supports these products.

Application Note 1988-02-01

PDF PDF 367 KB
Configuring Signal and Load Switching Using Keysight TestExec SL 
This application note describes how users of the Keysight TestExec SL software can easily configure and set up switching for the increasing number of channels on units under test with the Switch Manager feature in the software.

Application Note 2009-08-13

PDF PDF 286 KB
Connecting a UPS to a 3070 Controller 
This paper describes how to connect a UPS to the 3070 testhead controller. It uses the Advanced Power Conversion Smart-UPS with PowerChute Plus software.

Application Note 2003-01-07

PDF PDF 87 KB
Considerations in Making Small Signal Measurements - Application Brief 
The increasing demand for battery-powered mobile devices and energy-efficient green products has triggered a rising demand for a scope measurement solution that can measure the small signals.

Application Note 2013-10-29

Constant Power-Delivered Load Pull Simulation 
Video series demostrating the power and flexibility of MMIC desktop tools in ADS.

Demo 2009-10-26

 
Creating Hardware Handler in C/C++ for Keysight TestExec SL 
A hardware handler enhances the Keysight TestExec SL's ability to control devices by communicating directly with the instrument's driver. This application note describes how to create hardware handlers for the TestExec SL.

Application Note 2009-09-10

PDF PDF 181 KB
Creating Measurement-Based Amplifier Behavioral Models 
This Application Note describes a behavioral model used in circuit and system simulations to verify performance of the amplifier within a circuit or system.

Application Note 2003-10-01

Current Drain Analysis Enhances WLAN Network Card Design and Test - Application Note 
This application note explains how to simplify the complex task of accurately measuring and evaluating the current drain of a WLAN network card for its various operating modes.

Application Note 2006-12-14

Customizing the Keysight TestExec SL Operator Interface using Visual Basic 
This application note describes how users of the Keysight TestExec SL software can customize the operator user interface using Visual Basic.

Application Note 2009-07-07

PDF PDF 312 KB
Database Connectivity Guide for TestExec SL  
This application note outlines the importance of proper data logging in a database and discusses best practices to import extensible markup language (XML) files from TestExec into a database.

Application Note 2009-07-16

PDF PDF 434 KB
DC Output Analysis: Output Ripple; Using InfiniiVision X-Series Oscilloscopes 
Johnnie Hancock; Oscilloscope Product Manager; DSOXxPWR Power Analysis Application; InfiniiVision X-Series Oscilloscopes

Demo 2015-02-12

 

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