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Paving the Way for Research and Innovations - Brochure 
This is a selection guide for engineering researchers. It highlights the key research areas that Keysight is involved in, and solutions that can help to meet the research & development objectives.

型錄 2017-05-17

PDF PDF 5.91 MB
Early Design Review or Boundary Scan in Enhancing Testability and Optimazation of Test Strategy 
With complexities of PCB design scaling and manufacturing processes adopting to environmentally friendly practices raise challenges in ensuring structural quality of PCBs.

專文 2017-05-08

PDF PDF 624 KB
SRAM Cell Model Generation and Modeling Efficiency Take Center Stage in New Software Releases 
Accurate and efficient modeling is critical to successful design, especially when it comes to the Static Random Access Memory (SRAM) cell, the minimum geometry devices in integrated circuit technology.

專文 2017-05-04

 
Model Quality Assurance (MQA) 
MQA provides the complete solution and framework to fabless design companies, IDMs, and foundries for SPICE model library validation, comparison, and documentation.

型錄 2017-04-25

PDF PDF 3.12 MB
eCall/ERA-GLONASS Conformance Testing with Keysight E6950A - Application Note 
This application note discusses how designers can use the Keysight eCall test setup to emulate the various elements of a real eCall environment comprising GPS, automobile, cellular network and PSAP.

應用手冊 2017-04-12

PDF PDF 2.89 MB
EV1003A Hybrid-Electric/Electric Vehicle Power Converter Test Solution - Brochure 
EV1003A Solution Brochure.

型錄 2017-04-10

PDF PDF 1.69 MB
Making Conducted and Radiated Emissions Measurements - Application Note 
This application note provides an overview of radiated and conducted emissions measurements as well as a methodology for EMI precompliance testing.

應用手冊 2017-04-10

Keysight EEsof EDA Newsletter - Product and Application News 
Keep tabs on the latest product and application news and review the archives of the Keysight EEsof EDA Newsletter.

新聞簡訊 2017-04-04

 
E6950A eCall Conformance Test Solution - Configuration Guide 
This configuration guide helps you configure your eCall test reference solution with the E7515A UXM Wireless Test Set with PSAP software, and N5172B EXG X-Series RF Vector Signal Generator with N7609B.

配置設定指南 2017-03-30

PDF PDF 2.08 MB
Automotive FMCW Radar System Design using 3D Framework for Scenario Modeling 
Automotive Radar Architects can take advantage of Keysight SystemVue’s 3D simulation framework, radar reference designs, and links to MATLAB and T&M equipment to model FMCW radar system scenarios.

應用手冊 2017-03-28

Limited Parts Agreement 
Keysight understands these difficult challenges that manufacturers face, and has designed the Limited Parts Agreement – a new affordably-priced supportprogram targeting our customers’ special needs.

型錄 2017-03-28

PDF PDF 589 KB
i3070 In-Circuit Test System Onsite Agreement - Data Sheet 
Keysight's system onsite agreement provides short term rental of the i3070 system, preconfigured according to the customer’s needs, together with the latest hardware and software.

產品型錄 2017-03-22

PDF PDF 728 KB
STMicroelectronics and University of Lyon Predict EMI Using ADS - Case Study 
Learn how STMicroelectronics and University of Lyon designers used ADS to develop a network parameter block technique to satisfy their need for accurate and general EMI modeling.

案例研究 2017-03-17

PDF PDF 509 KB
連網汽車技術測試解決方案 
克服設計、驗證和測試最新連網汽車技術的挑戰。

競爭產品比較 2017-03-16

 
Global Device Modeling Services - Brochure 
Keysight Technologies' Device Modeling Services delivers accurate device parameters rapidly for your advanced devices.

型錄 2017-03-16

PDF PDF 1.59 MB
Electronic Components Tolerance and Test Limits for In-Circuit Test - Technical Overview 
In order for all assembled components to function correctly, components are measured and analyzed electrically using the In-circuit tester to ensure its value and performance are optimal.

技術總覽 2017-03-10

PDF PDF 634 KB
PXI Vector Network Analyzer - Configuration Guide 
This configuration guide describes standard configurations, options, accessories, upgrade kits and compatible peripherals for the M937xA PXIe vector network analyzers.

配置設定指南 2017-03-03

PDF PDF 3.65 MB
x1149 Boundary Scan Solution for Blade Server Board - Application Note 
This application note describes in detail what the Keysight x1149 Boundary Scan Analyzer performs during the Integrity test.

應用手冊 2017-03-02

PDF PDF 6.17 MB
汽車測試解決方案 
車內匯流排、動力傳動電路設計、奈米級材料分析等等。

應用手冊 2017-03-02

 
WaferPro Express Software 
WaferPro Express software is an efficient and powerful automated measurement test platform for wafer-level characterization.

型錄 2017-02-22

PDF PDF 2.75 MB
Understanding x1149 Integrity Test - Application Note 
This application note describes in detail what the Keysight x1149 Boundary Scan Analyzer performs during the Integrity test.

應用手冊 2017-02-16

PDF PDF 2.48 MB
Advanced Design System - Brochure 
This Brochure highlights the features of Keysight EEsof EDA's Advanced Design System (ADS); the industry's premier RF, Microwave and High-Speed Design platform.

型錄 2017-02-10

PDF PDF 2.45 MB
Electrochemistry 3-Electrode Measurement Workflows for Li-ion Cells and Sensors Using the B2900 SMU 
This application note shows the B2900A is well suited for electrochemical measurements with its capability to source and measure both voltage and current very accurately at 10 fA and 100 nV resolution.

應用手冊 2017-02-08

為何需要元件建模服務? 
元件建模和特性分析是成功 IC 設計的基礎。

專文 2017-02-03

 
N5393F/G PCI Express® 4.0 (Gen4) Software for Infiniium Oscilloscopes - Data Sheet 
The N5393F/G PCI Express electrical performance validation and compliance software provides accurate and automated transmitter testing devices for single and multi lane test setup reducing test time.

產品型錄 2017-01-25

PDF PDF 1008 KB

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