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Testing New Grounds in Automotive Electronics - Article Reprint 
Manufacturers are increasingly designing products for ease of test.

專文 2016-02-02

PDF PDF 279 KB
在 YouTube 網站上觀看 ADS 影片 
YouTube 網站上 Keysight EEsof EDA 頻道的先進設計系統(ADS)影片播放清單

基本展示 2016-01-28

 
TS-8989 PXI Functional Test System - Brochure 
The TS-8989 PXI functional tester helps you achieve a lower cost of test for automotive electronic control units and industrial electronics.

型錄 2016-01-28

PDF PDF 671 KB
Genesys 2015 Software Enables Industry’s Fastest Realization of RF Systems and Circuits 
Keysight announces the latest release of its industry leading, affordable RF simulation and synthesis software, Genesys 2015. Designed for circuit and system designers, the software features breakthrough Keysight Sys-Parameters that enables RF system simulation with off-the-shelf component datasheets; and comprehensive RF circuit synthesis to enable the industry’s fastest realization of RF systems and circuits.

新聞資料 2016-01-26

 
Model Quality Assurance (MQA) 
MQA provides the complete solution and framework to fabless design companies, IDMs, and foundries for SPICE model library validation, comparison, and documentation.

型錄 2016-01-25

PDF PDF 3.13 MB
Low-Frequency Noise Measurement System Adopted by China CEPREI Laboratory for Reliability Studies 
Keysight announces that CEPREI Laboratory has successfully adopted the Keysight EEsof EDA E4727A Advanced Low-Frequency Noise Analyzer (A-LFNA) for measurement and analysis of flicker noise (1/f noise) and random telegraph noise (RTN) during its reliability studies of semiconductor devices including MOSFETs, HEMTs and TFTs.

新聞資料 2016-01-25

 
模型建構程式(MBP)軟體 
MBP 是一應俱全的解決方案,能夠自動、靈活地進行矽元件建模。

型錄 2016-01-25

PDF PDF 930 KB
Model Builder Program (MBP) 
MBP is a one-stop solution that provides both automation and flexibility for silicon device modeling.

型錄 2016-01-25

PDF PDF 930 KB
Boundary Scan DFT Guidelines for Good Chain Integrity and Test Coverage - Application Note 
This application note provides some key guidelines to enable good design for testability using boundary scan.

應用手冊 2016-01-21

PDF PDF 1.99 MB
TS-8989 Automotive Body and Safety Test Reference Solution – Configuration Guide 
This configuration guide contains information to help you configure your body and safety test reference solution with the TS-8989 functional tester, and tailor the system to meet your requirements.

配置設定指南 2016-01-20

PDF PDF 2.55 MB
E5080A Network Analyzer & E5092A Configurable Multiport Test Set - Data Sheet 
This literature describes the technical specifications for E5080A and E5092A.

產品型錄 2016-01-19

PDF PDF 5.88 MB
Increasing Reliability and Efficiency in Power Converter Designs Part 1 - Application Note 
This application note will provide insight into increasing reliability and efficiency in next-generation power converter designs.

應用手冊 2016-01-12

PDF PDF 2.20 MB
Increasing Reliability and Efficiency in Power Converter Designs Part 3 - Application Note 
This application note part 3 will provide insight into increasing reliability and efficiency in next-generation power converter designs.

應用手冊 2016-01-11

PDF PDF 1.29 MB
Increasing Reliability and Efficiency in Power Converter Designs Part 4 - Application Note 
This application note part 4 is the final in the series, and will provide insight into increasing reliability and efficiency in next-generation power converter designs.

應用手冊 2016-01-11

PDF PDF 1.55 MB
Increasing Reliability and Efficiency in Power Converter Designs Part 2 - Application Note 
This application note part 2 will provide insight into increasing reliability and efficiency in next-generation power converter designs.

應用手冊 2016-01-11

PDF PDF 977 KB
The Modelithics COMPLETE Library v12.3 for Keysight Technologies' Genesys RF Simulation Tool 
Modelithics announces the release of a new version of The Modelithics® COMPLETE Library, version 12.3, for use with Genesys RF simulation and synthesis software.

新聞資料 2016-01-08

 
Leti to collaborate with Keysight Technologies to enable expansion of FD-SOI technology 
CEA-Leti announces it has signed an agreement with Keysight Technologies, a device-modeling software supplier, to adapt Leti’s UTSOI extraction flow methodology within Keysight’s device modeling solutions for high-volume SPICE model generation.

新聞資料 2015-12-08

 
E5080A ENA Series Network Analyzer - Configuration Guide 
This configuration guide describes standard configurations, options, accessories and peripherals for the E5080A network analyzers.

配置設定指南 2015-12-01

Quickly Validate Designs for DOCSIS 3.1 Compliance - Application Brief 
This “DOCSIS 3.1 Test Solution" app brief gives insight into Keysight solutions that can be used for testing DOCSIS 3.1 transmitters, receivers and components.

應用手冊 2015-11-14

TS-8989 System Integration Guide - Application Note 
In today’s manufacturing environment, floor space is an increasingly invaluable variable in the cost of test equation.

應用手冊 2015-11-11

PDF PDF 2.87 MB
Alliance for Wireless Power (A4WP) Measurements Using an Oscilloscope (Part 3) - Application Note 
Power and Efficiency Measurements. This application note is Part 3 of a 3-part series on A4WP wireless charging measurements. This part focuses on performing power and efficiency measurements.

應用手冊 2015-11-06

Alliance for Wireless Power (A4WP) Measurements Using an Oscilloscope (Part 2) - Application Note 
This application note is Part 2 of a 3-part series on A4WP wireless charging measurements. This part focuses on performing ITX_COIL measurements during the power save state (beacons), including beacon.

應用手冊 2015-11-06

Alliance for Wireless Power (A4WP) Measurements Using an Oscilloscope (Part 1) - Application Note 
This application note is Part 1 of a 3-part series on A4WP wireless charging measurements. This part focuses on performing ITX_COIL measurements during the power transfer state (non-beacons).

應用手冊 2015-11-06

Automotive Body and Safety Electronics Test - Solution Brochure 
These Keysight PXI-based reference solutions for automotive electronics body and safety functional tests help halve the time to design, integrate and implement systems for electronics functional test.

型錄 2015-11-05

PDF PDF 1.87 MB
Keysight Selects Fraunhofer EMFT as its First Low-Frequency Noise Reference Center for EMEAI 
Keysight announces that Fraunhofer Research Institution for Microsystems and Solid State Technologies EMFT (Fraunhofer EMFT) is the first low-frequency noise measurements reference center able to demonstrate the Keysight EEsof EDAs E4727A Advanced Low-Frequency Noise Analyzer in Europe, the Middle East, Africa and India (EMEAI).

新聞資料 2015-11-04

 

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