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Increasing Reliability and Efficiency in Power Converter Designs Part 1 - Application Note 
This application note will provide insight into increasing reliability and efficiency in next-generation power converter designs.

Application Note 2016-01-12

PDF PDF 2.20 MB
Increasing Reliability and Efficiency in Power Converter Designs Part 3 - Application Note 
This application note part 3 will provide insight into increasing reliability and efficiency in next-generation power converter designs.

Application Note 2016-01-11

PDF PDF 1.29 MB
Increasing Reliability and Efficiency in Power Converter Designs Part 4 - Application Note 
This application note part 4 is the final in the series, and will provide insight into increasing reliability and efficiency in next-generation power converter designs.

Application Note 2016-01-11

PDF PDF 1.55 MB
Increasing Reliability and Efficiency in Power Converter Designs Part 2 - Application Note 
This application note part 2 will provide insight into increasing reliability and efficiency in next-generation power converter designs.

Application Note 2016-01-11

PDF PDF 977 KB
The Modelithics COMPLETE Library v12.3 for Keysight Technologies' Genesys RF Simulation Tool 
Modelithics announces the release of a new version of The Modelithics® COMPLETE Library, version 12.3, for use with Genesys RF simulation and synthesis software.

Press Materials 2016-01-08

 
IV Characterizations of Solar Cells Using the B2900A Series of SMUs - Application Note 
The Keysight B2900A Series Precision SMU allows you to accurately and quickly make characterization of photovoltaic cells with its intuitive GUI and free PC-based application software.

Application Note 2015-12-14

Leti to collaborate with Keysight Technologies to enable expansion of FD-SOI technology 
CEA-Leti announces it has signed an agreement with Keysight Technologies, a device-modeling software supplier, to adapt Leti’s UTSOI extraction flow methodology within Keysight’s device modeling solutions for high-volume SPICE model generation.

Press Materials 2015-12-08

 
Network Analyzer - Selection Guide 
Provides an overview of Keysight’s network analyzer families, recommended solutions for various applications, related network analyzer products, and a comparison of specifications and features.

Selection Guide 2015-12-04

E5080A ENA Series Network Analyzer - Configuration Guide 
This configuration guide describes standard configurations, options, accessories and peripherals for the E5080A network analyzers.

Configuration Guide 2015-12-01

Build Dependable PCB Test Stations with the Keysight E5063A PCB Analyzer - Flyer 
This highlights key features of the E5063A ENA Series PCB Analyzer, the best solution for PCB manufacturing test providing both impedance (TDR) and return loss (S-parameter) measurement capability.

Brochure 2015-11-30

PDF PDF 1005 KB
E5063A ENA Series PCB Analyzer - Technical Overview 
The technical overview of E5063A ENA Series PCB analyzer.

Technical Overview 2015-11-30

Quickly Validate Designs for DOCSIS 3.1 Compliance - Application Brief 
This “DOCSIS 3.1 Test Solution" app brief gives insight into Keysight solutions that can be used for testing DOCSIS 3.1 transmitters, receivers and components.

Application Note 2015-11-14

TS-8989 System Integration Guide - Application Note 
In today’s manufacturing environment, floor space is an increasingly invaluable variable in the cost of test equation.

Application Note 2015-11-11

PDF PDF 2.87 MB
Alliance for Wireless Power (A4WP) Measurements Using an Oscilloscope (Part 1) - Application Note 
This application note is Part 1 of a 3-part series on A4WP wireless charging measurements. This part focuses on performing ITX_COIL measurements during the power transfer state (non-beacons).

Application Note 2015-11-06

Alliance for Wireless Power (A4WP) Measurements Using an Oscilloscope (Part 2) - Application Note 
This application note is Part 2 of a 3-part series on A4WP wireless charging measurements. This part focuses on performing ITX_COIL measurements during the power save state (beacons), including beacon.

Application Note 2015-11-06

Alliance for Wireless Power (A4WP) Measurements Using an Oscilloscope (Part 3) - Application Note 
Power and Efficiency Measurements. This application note is Part 3 of a 3-part series on A4WP wireless charging measurements. This part focuses on performing power and efficiency measurements.

Application Note 2015-11-06

Automotive Body and Safety Electronics Test - Solution Brochure 
These Keysight PXI-based reference solutions for automotive electronics body and safety functional tests help halve the time to design, integrate and implement systems for electronics functional test.

Brochure 2015-11-05

PDF PDF 1.87 MB
Keysight Selects Fraunhofer EMFT as its First Low-Frequency Noise Reference Center for EMEAI 
Keysight announces that Fraunhofer Research Institution for Microsystems and Solid State Technologies EMFT (Fraunhofer EMFT) is the first low-frequency noise measurements reference center able to demonstrate the Keysight EEsof EDAs E4727A Advanced Low-Frequency Noise Analyzer in Europe, the Middle East, Africa and India (EMEAI).

Press Materials 2015-11-04

 
Using Automatic Synthesis of RF, Microwave & Analog Circuits to Increase Design Productivity by 10x 
Microwave Product Digest's October 2015 Featured Article written by How-Siang Yap of Keysight Technologies.

Feature Story 2015-10-28

 
How to Model RF Passive Devices: Capacitors and Resistors 
This video explains and demonstrates a method to develop accurate Spice models from verified S-parameter measurements. The video walks you through the entire modeling flow for an on-wafer capacitor using IC-CAP.

How-To Video 2015-10-27

 
Ensure your mobile and smart devices comply with the CTIA Battery Life Test Plan – W2BI 
Ensure your mobile and smart devices comply with the CTIA Battery Life Test Plan – W2BI and Keysight

Solution Brief 2015-10-09

 
Keysight Technologies to Demonstrate Latest Simulation Software Solutions at CSICS 
Keysight announces it will demonstrate its latest RF circuit, system and 3-D electromagnetic design and electro-thermal simulation software solutions at the Compound Semiconductor IC Symposium (CSICS 2015), Sheraton New Orleans, Booth 601, New Orleans, Oct. 11-14.

Press Materials 2015-10-08

 
Characterizing MEMS Magneto-Impedance Sensor using the Keysight Impedance Analyzer 
This application note describes the benefits of using Agilent impedance analyzers for device characterization of MEMS Magneto-Impedance (MI) sensors and how they improve design and test efficiency while offering a wide variety of design-automation tools and functions.

Application Note 2015-10-05

Keysight EEsof EDA makes it easy to get back to school—at least virtually 
Rick Nelson, executive editor of Evaluation Engineering, visited Keysight Technologies and had this to say about Keysight EEsof EDA.

Article 2015-09-11

 
U8903B High Performance Audio Analyzer – Data Sheet 
This data sheet details the key features, specifications and ordering information for the U8903B audio analyzer.

Data Sheet 2015-09-04

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