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ADS 발견 
키사이트 EEsof EDA ADS 동영상 데모 및 자습서 모음

기본 데모 2014-10-28

 
The Impact of Electro-Thermal Coupling on HBT Power Amplifiers 
This paper describes the use of electrothermal simulation to understand, predict, and account for cross-circuit thermal coupling in a commercial HBT power amplifier.

어플리케이션 노트 2014-10-19

 
RF 및 마이크로웨이브 앰프 – 선택 가이드 (영어) 
RF 및 마이크로웨이브 83006/017/018/020/050/051A와 N4985A 테스트 시스템 앰프, N4985A-S30/S50 프리앰프를 위한 선택 가이드. 선택 기준 및 어플리케이션 예제가 포함되어 있습니다.

선택 가이드 2014-09-30

Power Analysis using the S-Series oscilloscope 
See how to make power measurements with an oscilloscope, current probe and measurement application software using a USB target board as an example.

사용방법 동영상 2014-09-04

MOV MOV 20.02 KB
Keysight Technologies Introduces Design and Test Solutions at European Microwave Week 
Keysight announces that it will demonstrate a wide range of new, high-performance flexible test solutions at the European Microwave Week 2014, Oct. 7–9, Rome, Fiera di Roma, Booth F100. The test solutions are used by engineers for designing and testing components for radar systems, antennas and next-generation wireless devices.

보도자료 2014-09-03

 
GoldenGate RFIC Solutions 
This brochure highlights the benefits of the GoldenGate RFIC Simulator.GoldenGate is the most trusted simulation, analysis and verification solution available for integrated RF circuit design within Cadence Virtuoso.

브로셔 2014-09-03

PDF PDF 954 KB
키사이트 B2980A 시리즈 펨토/피코 전류계와 전위계/고저항 미터 
키사이트 B2980A 시리즈 펨토/피코 전류계와 전위계/고저항 미터는 동급 최고의 측정 성능을 구현할 뿐만 아니라, 측정 신뢰도를 극대화할 수 있는 최고의 기능 또한 제공합니다.

데이터시트 2014-09-01

Radar Measurements - Application Note 
This application note focuses on the fundamentals of measuring basic pulsed radars and measurements for more complex or modulated pulsed radar systems.

어플리케이션 노트 2014-08-22

PDF PDF 6.84 MB
Design and Test Solutions for Advanced Automotive - Brochure 
This brochure showcases Keysight in fast paced Automotive Industry and provides descriptions on its broad and powerful automotive design and test solutions as well as details on the market.

브로셔 2014-08-21

PDF PDF 14.87 MB
Wafer-level Measurement Solutions – Cascade Microtech 
Accurate and Repeatable Wafer-level Measurements from Cascade Microtech and Keysight.

솔루션 개요 2014-08-04

 
Achieving Accurate E-band Power Measurement with Keysight E8486A Waveguide Power Sensors 
E-band spectrum application has been gaining more application interests in the recent years. E8486A addresses the requirement for accurate RF power measurement in the mm-wave applications.

어플리케이션 노트 2014-08-04

EDA Support Services - Flyer 
Keysight Support Services for EDA Products offers customers several benefits otherwise not available. This service is designed to help you get the most out of your software purchases.

브로셔 2014-08-03

PDF PDF 454 KB
RF and Microwave Industry-Ready Student Certification Program - Brochure 
This program confirms a student’s technical knowledge, design expertise, and hands-on measurement proficiency in the use of Keysight EEsof software design tools and Keysight instruments.

브로셔 2014-08-03

PDF PDF 562 KB
Keysight EEsof EDA Software and Modular Solutions for Universities 
Keysight works in collaboration with universities to provide tools that enable education and research for the engineers of tomorrow. The brochure outlines available programs, software and hardware.

브로셔 2014-08-03

PDF PDF 1.44 MB
Releasing the “Test Sequence” and “Test” to Production on the Keysight x1149 Boundary Scan Analyzer 
This application note describes how to release test sequences and tests to production when using the Keysight x1149 Boundary Scan Analyzer.

어플리케이션 노트 2014-08-03

PDF PDF 5.52 MB
Advanced Design System - Brochure 
This Brochure highlights the features of Keysight EEsof EDA's Advanced Design System (ADS); the industry's premier RF, Microwave and High-Speed Design platform.

브로셔 2014-08-03

PDF PDF 2.61 MB
Modifying DDR Libraries for Silicon Nail Test Generation on the Keysight x1149 Boundary Scan Analyzer 
This application note describes how to modify DDR libraries to generate silicon nails tests on the Keysight x1149 Boundary Scan Analyzer.

어플리케이션 노트 2014-08-03

PDF PDF 1.57 MB
Keysight EEsof EDA Customer Support - Brochure 
Whether you are a novice or an experienced user, Keysight EEsof EDA’s customer support offerings are designed to help you every step of the way.

브로셔 2014-08-03

PDF PDF 175 KB
Simulating Envelope Tracking with Advanced Design System Software - Application Note 
This example applies envelope tracking to an example amplifier to show techniques of using Advanced Design System (ADS) for this type of design.

어플리케이션 노트 2014-08-02

PDF PDF 2.38 MB
IC-CAP Device Modeling Software - Technical Overview 
This Technical Overview presents Keysight Technologies IC-CAP Device Modeling Software Release 2006. The IC-CAP software automates the process of accurate device characterization for today's RFIC designer.

기술 개요 2014-08-02

Paving the Way for Research and Innovations - Brochure 
This is a selection guide for engineering researchers. It highlights the key research areas that Keysight is involved in, and solutions that can help to meet the research & development objectives.

브로셔 2014-08-02

PDF PDF 1.01 MB
Helping you focus where it counts in aerospace and defense - Brochure 
This brochure covers the latest A/D test resources focused on Radar, EW, Satellite, MicComm and SDR.

브로셔 2014-08-01

PDF PDF 8.68 MB
Overview on Phase Noise and Jitter 
This Paper by Rick Poore (Keysight Technologies) focuses on the relationship between phase noise and jitter in free-running oscillators.

기술 개요 2014-07-31

PDF PDF 1.29 MB
Solutions For Wireless Handset Battery Drain Characterization 
This brochure describes the use of wireless handset battery drain characterization to maximize battery operating time without jeopardizing your schedule.

브로셔 2014-07-31

PDF PDF 4.74 MB
Comparing Boundary Scan Methods White Paper 
The need for reusable tests is driving standalone boundary scan-ICT integration. This article first appeared in the September 2009 issue of Circuits Assembly and is reprinted with kind permission.

기사 2014-07-31

PDF PDF 2.75 MB

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