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Keysight Technologies Introduces Design and Test Solutions at European Microwave Week 
Keysight announces that it will demonstrate a wide range of new, high-performance flexible test solutions at the European Microwave Week 2014, Oct. 7–9, Rome, Fiera di Roma, Booth F100. The test solutions are used by engineers for designing and testing components for radar systems, antennas and next-generation wireless devices.

보도자료 2014-09-03

 
GoldenGate RFIC Solutions 
This brochure highlights the benefits of the GoldenGate RFIC Simulator.GoldenGate is the most trusted simulation, analysis and verification solution available for integrated RF circuit design within Cadence Virtuoso.

브로셔 2014-09-03

PDF PDF 954 KB
키사이트 B2980A 시리즈 펨토/피코 전류계와 전위계/고저항 미터 
키사이트 B2980A 시리즈 펨토/피코 전류계와 전위계/고저항 미터는 동급 최고의 측정 성능을 구현할 뿐만 아니라, 측정 신뢰도를 극대화할 수 있는 최고의 기능 또한 제공합니다.

데이터시트 2014-09-01

Wafer-level Measurement Solutions – Cascade Microtech 
Accurate and Repeatable Wafer-level Measurements from Cascade Microtech and Keysight.

솔루션 개요 2014-08-04

 
EDA Support Services - Flyer 
Keysight Support Services for EDA Products offers customers several benefits otherwise not available. This service is designed to help you get the most out of your software purchases.

브로셔 2014-08-03

PDF PDF 454 KB
RF and Microwave Industry-Ready Student Certification Program - Brochure 
This program confirms a student’s technical knowledge, design expertise, and hands-on measurement proficiency in the use of Keysight EEsof software design tools and Keysight instruments.

브로셔 2014-08-03

PDF PDF 562 KB
Keysight EEsof EDA Customer Support - Brochure 
Whether you are a novice or an experienced user, Keysight EEsof EDA’s customer support offerings are designed to help you every step of the way.

브로셔 2014-08-03

PDF PDF 175 KB
Advanced Design System - Brochure 
This Brochure highlights the features of Keysight EEsof EDA's Advanced Design System (ADS); the industry's premier RF, Microwave and High-Speed Design platform.

브로셔 2014-08-03

PDF PDF 2.61 MB
Releasing the “Test Sequence” and “Test” to Production on the Keysight x1149 Boundary Scan Analyzer 
This application note describes how to release test sequences and tests to production when using the Keysight x1149 Boundary Scan Analyzer.

어플리케이션 노트 2014-08-03

PDF PDF 5.52 MB
Keysight EEsof EDA Software and Modular Solutions for Universities 
Keysight works in collaboration with universities to provide tools that enable education and research for the engineers of tomorrow. The brochure outlines available programs, software and hardware.

브로셔 2014-08-03

PDF PDF 1.44 MB
Modifying DDR Libraries for Silicon Nail Test Generation on the Keysight x1149 Boundary Scan Analyzer 
This application note describes how to modify DDR libraries to generate silicon nails tests on the Keysight x1149 Boundary Scan Analyzer.

어플리케이션 노트 2014-08-03

PDF PDF 1.57 MB
CAN, LIN and FlexRay Protocol Triggering and Decode for Infiniium 90000 Series - Data Sheet 
Keysight Technologies oscilloscope automotive options help electronic system designers test and debug the physical layer of automotive serial buses faster.

데이터시트 2014-08-03

Simulating Envelope Tracking with Advanced Design System Software - Application Note 
This example applies envelope tracking to an example amplifier to show techniques of using Advanced Design System (ADS) for this type of design.

어플리케이션 노트 2014-08-02

PDF PDF 2.38 MB
IC-CAP Device Modeling Software - Technical Overview 
This Technical Overview presents Keysight Technologies IC-CAP Device Modeling Software Release 2006. The IC-CAP software automates the process of accurate device characterization for today's RFIC designer.

기술 개요 2014-08-02

Paving the Way for Research and Innovations - Brochure 
This is a selection guide for engineering researchers. It highlights the key research areas that Keysight is involved in, and solutions that can help to meet the research & development objectives.

브로셔 2014-08-02

PDF PDF 1.01 MB
Helping you focus where it counts in aerospace and defense - Brochure 
This brochure covers the latest A/D test resources focused on Radar, EW, Satellite, MicComm and SDR.

브로셔 2014-08-01

PDF PDF 8.68 MB
Comparing Boundary Scan Methods White Paper 
The need for reusable tests is driving standalone boundary scan-ICT integration. This article first appeared in the September 2009 issue of Circuits Assembly and is reprinted with kind permission.

기사 2014-07-31

PDF PDF 2.75 MB
Solutions For Wireless Handset Battery Drain Characterization 
This brochure describes the use of wireless handset battery drain characterization to maximize battery operating time without jeopardizing your schedule.

브로셔 2014-07-31

PDF PDF 4.74 MB
Digital Predistortion Linearizes Wireless Power Amplifiers 
This Article by Wan-Jong Kim, Shawn P. Stapleton, Jong Heon Kim, and Cory Edelman focuses on how digital predistortion linearizes wireless power amplifiers.

기사 2014-07-31

PDF PDF 1.81 MB
Keysight Technologies: Powering the Solar Revolution - Brochure 
This brochures presents Keysight's solutions for testing solar cells, panels, modules and inverters.

브로셔 2014-07-31

PDF PDF 584 KB
Overview on Noise in Ring Topology Mixers 
This Paper explores the formal definition of noise figure and shows the ADS noise figure definition, and also shows that the noise figure for a mixer does not have to exceed its conversion loss.

기술 개요 2014-07-31

PDF PDF 217 KB
Overview on Phase Noise and Jitter 
This Paper by Rick Poore (Keysight Technologies) focuses on the relationship between phase noise and jitter in free-running oscillators.

기술 개요 2014-07-31

PDF PDF 1.29 MB
Characterizing the I-V Curve of Solar Cells and Modules 
This measurement brief explores the various test and measurement tools you can use for I-V curve characterization and provides tips to help you choose the instrument or instruments that best fit your solar cell or module measurement needs.

어플리케이션 노트 2014-07-31

Advanced Modeling Solutions for Nanoscale 3D FinFETs and High-Frequency/High-Power GaN HEMTs 
Agilent announces several innovations for the 2014 release of its industry-leading suite of device modeling and characterization software tools. The suite is comprised of IC-CAP, MBP, and MQA.

보도자료 2014-06-18

 
Agilent Technologies and Cascade Microtech Announce Alliance to Streamline Wafer-Level Measurements 
Agilent Technologies and Cascade Microtech announce a strategic alliance to provide fully configured and validated RF measurement solutions that streamline wafer-level semiconductor measurements while delivering guaranteed configuration, installation and support.

보도자료 2014-06-03

 

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