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Emulating Analog Input Sensors in Automotive Electronics Functional Test - Article Reprint 
This article discusses guidelines for evaluating the digital-analog converters for your automotive electronics functional test needs.

기사 2016-02-09

PDF PDF 318 KB
Manufacturing Test Solutions for SSDS - Article Reprint 
A new system performs both ICT and boundary scan in high-volume settings.

기사 2016-02-09

PDF PDF 222 KB
Finding Fault - Article Reprint 
testing mission-critical functions in automotive electronics.

기사 2016-02-05

PDF PDF 452 KB
Testing of Small Form-Factor Products - Article Reprint 
Boundary scan and embedded test will need to make up for ICT gaps.

기사 2016-02-03

PDF PDF 546 KB
Making Boundary Scan Easy - Article Reprint 
Testing boundary scan devices no longer need be a laborious task.

기사 2016-02-03

PDF PDF 217 KB
Automating In-Circuit Test - Article Reprint 
Inline ICT is not as cumbersome as it used to be, and in the longer run, will help manufacturers save costs.

기사 2016-02-02

PDF PDF 87 KB
Testing New Grounds in Automotive Electronics - Article Reprint 
Manufacturers are increasingly designing products for ease of test.

기사 2016-02-02

PDF PDF 279 KB
TS-8989 PXI Functional Test System - Brochure 
The TS-8989 PXI functional tester helps you achieve a lower cost of test for automotive electronic control units and industrial electronics.

브로셔 2016-01-28

PDF PDF 671 KB
유튜브의 ADS 동영상  
유튜브 키사이트 EEsof EDA 채널의 ADS(Advanced Design System) 동영상 라이브러리 재생 목록

기본 데모 2016-01-28

 
Genesys 2015 Software Enables Industry’s Fastest Realization of RF Systems and Circuits 
Keysight announces the latest release of its industry leading, affordable RF simulation and synthesis software, Genesys 2015. Designed for circuit and system designers, the software features breakthrough Keysight Sys-Parameters that enables RF system simulation with off-the-shelf component datasheets; and comprehensive RF circuit synthesis to enable the industry’s fastest realization of RF systems and circuits.

보도자료 2016-01-26

 
Low-Frequency Noise Measurement System Adopted by China CEPREI Laboratory for Reliability Studies 
Keysight announces that CEPREI Laboratory has successfully adopted the Keysight EEsof EDA E4727A Advanced Low-Frequency Noise Analyzer (A-LFNA) for measurement and analysis of flicker noise (1/f noise) and random telegraph noise (RTN) during its reliability studies of semiconductor devices including MOSFETs, HEMTs and TFTs.

보도자료 2016-01-25

 
Boundary Scan DFT Guidelines for Good Chain Integrity and Test Coverage - Application Note 
This application note provides some key guidelines to enable good design for testability using boundary scan.

어플리케이션 노트 2016-01-21

PDF PDF 1.99 MB
TS-8989 Automotive Body and Safety Test Reference Solution – Configuration Guide 
This configuration guide contains information to help you configure your body and safety test reference solution with the TS-8989 functional tester, and tailor the system to meet your requirements.

구성 가이드 2016-01-20

PDF PDF 2.55 MB
Increasing Reliability and Efficiency in Power Converter Designs Part 1 - Application Note 
This application note will provide insight into increasing reliability and efficiency in next-generation power converter designs.

어플리케이션 노트 2016-01-12

PDF PDF 2.20 MB
Increasing Reliability and Efficiency in Power Converter Designs Part 3 - Application Note 
This application note part 3 will provide insight into increasing reliability and efficiency in next-generation power converter designs.

어플리케이션 노트 2016-01-11

PDF PDF 1.29 MB
Increasing Reliability and Efficiency in Power Converter Designs Part 2 - Application Note 
This application note part 2 will provide insight into increasing reliability and efficiency in next-generation power converter designs.

어플리케이션 노트 2016-01-11

PDF PDF 977 KB
Increasing Reliability and Efficiency in Power Converter Designs Part 4 - Application Note 
This application note part 4 is the final in the series, and will provide insight into increasing reliability and efficiency in next-generation power converter designs.

어플리케이션 노트 2016-01-11

PDF PDF 1.55 MB
The Modelithics COMPLETE Library v12.3 for Keysight Technologies' Genesys RF Simulation Tool 
Modelithics announces the release of a new version of The Modelithics® COMPLETE Library, version 12.3, for use with Genesys RF simulation and synthesis software.

보도자료 2016-01-08

 
IV Characterizations of Solar Cells Using the B2900A Series of SMUs - Application Note 
The Keysight B2900A Series Precision SMU allows you to accurately and quickly make characterization of photovoltaic cells with its intuitive GUI and free PC-based application software.

어플리케이션 노트 2015-12-14

Leti to collaborate with Keysight Technologies to enable expansion of FD-SOI technology 
CEA-Leti announces it has signed an agreement with Keysight Technologies, a device-modeling software supplier, to adapt Leti’s UTSOI extraction flow methodology within Keysight’s device modeling solutions for high-volume SPICE model generation.

보도자료 2015-12-08

 
E5080A ENA Series Network Analyzer - Configuration Guide 
This configuration guide describes standard configurations, options, accessories and peripherals for the E5080A network analyzers.

구성 가이드 2015-12-01

Quickly Validate Designs for DOCSIS 3.1 Compliance - Application Brief 
This “DOCSIS 3.1 Test Solution" app brief gives insight into Keysight solutions that can be used for testing DOCSIS 3.1 transmitters, receivers and components.

어플리케이션 노트 2015-11-14

TS-8989 System Integration Guide - Application Note 
In today’s manufacturing environment, floor space is an increasingly invaluable variable in the cost of test equation.

어플리케이션 노트 2015-11-11

PDF PDF 2.87 MB
Alliance for Wireless Power (A4WP) Measurements Using an Oscilloscope (Part 3) - Application Note 
Power and Efficiency Measurements. This application note is Part 3 of a 3-part series on A4WP wireless charging measurements. This part focuses on performing power and efficiency measurements.

어플리케이션 노트 2015-11-06

Alliance for Wireless Power (A4WP) Measurements Using an Oscilloscope (Part 1) - Application Note 
This application note is Part 1 of a 3-part series on A4WP wireless charging measurements. This part focuses on performing ITX_COIL measurements during the power transfer state (non-beacons).

어플리케이션 노트 2015-11-06

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