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5DX Windows 7 Controller Upgrade - Brochure 
Upgrade your 5DX AXI PC controller to enjoy better inspection performance.

브로셔 2015-06-09

PDF PDF 159 KB
Principal Component Analysis-Based Compensation for Measurement Errors 
This paper examines some issues and trends that justify adding features to IEEE 1149.1 that will facilitate safe, fast and effective initialization of a board or system, to get it ready for testing. Published with kind permission of the IEEE

기사 2015-06-08

PDF PDF 1.86 MB
Keysight Technologies to Demonstrate Latest EDA Software Solutions at 52nd Annual DAC 
Keysight announces it will demonstrate its latest electronic design automation software for microwave, RF, high-frequency, high-speed digital, RF system, electronic system level, circuit, 3-D electromagnetic, physical design and device-modeling applications at the Design Automation Conference (DAC) 2015, Booth 2020, San Francisco, June 8-10.

보도자료 2015-06-08

 
Determining the Best RF Simulation Tools as an RF Consulting Engineer 
Independent consulting in RF and microwave engineering is a growing trend and many engineers are delivering their highly sought after RF expertise back to the industry.

기사 2015-06-08

PDF PDF 2.64 MB
E8782A Pin Matrix and E8783A Pin Matrix Card 
This data sheet provides an overview of and specifications for the Keysight E8782A pin matrix with instrumentation and E8783A pin matrix card.

데이터시트 2015-06-04

PDF PDF 164 KB
M9155/6/7C and M9155/6/7CH40 DC to 26.5/40 GHz PXI Hybrid Switch Modules - Flyer 
This 2-page flyer provides a brief overview for the Keysight M9155/6/7C PXI and M9155/6/7CH40 DC to 26.5/40 GHz PXI Hybrid Switch Modules.

브로셔 2015-05-19

PDF PDF 660 KB
Dialog Semiconductor adopts IC-CAP, MBP, MQA, and WaferPro Express software 
Keysight announces that Dialog Semiconductor has adopted the Keysight EEsof EDA IC-CAP, MBP, MQA, and WaferPro Express software to perform foundry technology characterization, model validation, model customization and enhancement.

보도자료 2015-05-11

 
Testing Automotive Electronic Parking Brake Controls with the TS-8989 - Application Note 
This application note discusses the configuration of a typical Keysight TS-8989 PXI Functional Test System for testing automotive electronic parking brake controls.

어플리케이션 노트 2015-05-11

How to Design an RF Power Amplifier: Class J 
This short video will provide an introduction to Class J Power Amplifiers and demonstrate a superior, time saving methodology to design and practically realize a Class J RF power amplifier. First,a theoretical approach will be used to design an ideal circuit from first principles and then circuit design tools will be utilized to synthesize a more realistic circuit topology from the ideal case. The design process will be illustrated using a commercially available GaN MMIC device from Qorvo.

사용방법 동영상 2015-05-07

 
Drive Down the Cost of Test Using the ENA Series of Network Analyzers - Application Note 
In this application note, we discuss the contributions of Keysight Technologies, Inc.’s ENA Series of Vector Network Analyzers (ENA, hereafter) to drive down the cost of test in production lines.

어플리케이션 노트 2015-05-01

PDF PDF 2.46 MB
Keysight Technologies Unveils WaferPro Express 2015 Platform for Wafer-Level Device Characterization 
Keysight announces WaferPro Express 2015, a measurement software platform for the automated characterization of wafer-level devices and circuit components.

보도자료 2015-04-28

 
Measuring Dielectric Properties using Keysight's Materials Measurement Solutions - Brochure 
Quick guide for Keysight materials measurement solutions that can characterize the material under test by measuring dielectric properties such as permittivity and permeability.

브로셔 2015-04-27

PDF PDF 1.66 MB
Keysight EEsof EDA "How To Design Power Amplifier" Videos 
A collection of "How to Design Power Amplifier" Videos from Keysight EEsof EDA.

사용방법 동영상 2015-04-22

 
Advanced Low-Frequency Noise Analyzer Overview 
This video will provide a brief overview of Keysight E4727A Advanced Low-Frequency Noise Analyzer (ALFNA), the next-generation system for measurement of 1/f noise and random telegraph noise. It will describe ALFNA’s innovative modular design and its technical advantages. It will also touch on wide-range applications and how they are enabled by ALFNA’s industry-leading technical specifications and rich feature set.

제품 둘러보기 2015-04-21

 
Keysight Technologies to Showcase Semiconductor Parametric, Modeling Solutions at IRPS 2015 
Keysight announces it will demonstrate some of its many semiconductor parametric and modeling solutions at the 53rd International Reliability Physics Symposium (IRPS), Hyatt Regency Monterey Resort, Booth 203/205, Monterey, Calif., April 19-23.

보도자료 2015-04-16

 
Nanomeasurement Instruments for Industry R&D - Brochure 
This brochure discusses nanomeasurement instruments for industry R&D.

브로셔 2015-04-08

PDF PDF 1.53 MB
Characterization of PCB Insertion Loss with a New Calibration Method - Application Note 
In this application note a new method for characterizing PCB loss by using AFR with 1X Open fixtures is proposed.

어플리케이션 노트 2015-03-26

PDF PDF 700 KB
Automated X-Ray Inspection System Keysight Technologies - Technical Overview 
This is a technical datasheet. Keysight has developed a sealed ultra-high vacumn X-ray tube that provides stable output throughout a significantly long life.

어플리케이션 노트 2015-03-24

PDF PDF 644 KB
Keysight WaferPro Express 
The Keysight WaferPro Express software performs automated wafer-level measurements of semiconductor devices such as transistors and circuit components. It provides turnkey drivers and test routines for a variety of instruments and wafer probers. Its user interface makes it easy to setup and run complex wafer-level test plans, while powerful customization capabilities are enabled by the new Python programming environment.

제품 둘러보기 2015-03-24

 
WaferPro Express Software 
WaferPro Express software is an efficient and powerful automated measurement test platform for wafer-level characterization.

브로셔 2015-03-15

PDF PDF 1.49 MB
The Role of a Compact Low Voltage FE-SEM in MEMS Analysis - Application Note 
Overview of the 8500 high resolution imaging for MEMS devices without the need for metal coating to dissipate charge buildup.

어플리케이션 노트 2015-03-11

PDF PDF 5.66 MB
How to Design an RF Power Amplifier: Class E 
This video provides an introduction to Class E Power Amplifiers and demonstrates a superior, time saving methodology to design and practically realize a Class E RF power amplifier using first principles to build an ideal circuit and then utilizing circuit design tools to synthesize a more realistic circuit topology from the ideal case.

사용방법 동영상 2015-03-11

 
Oscilloscopes to Test and Characterize Today’s Power Supplies - Application Brief 
InfiniiVision 3000 and 4000 X-Series oscilloscopes with the Power Measurements option provide automatic power supply characterization measurements that help you optimize your power supply designs.

어플리케이션 노트 2015-02-20

Introducing Keysight E5080A ENA Vector Network Analyzer - Demo 
This video introduces the Keysight E5080A ENA vector network analyzer, which has the new touch-based GUI and offers the industry’s best combination of RF measurement performance and speed.

기본 데모 2015-02-12

MP4 MP4 49.80 MB
The World’s Highest Pin Count In-Circuit Test Solutions - Brochure 
Keysight's new i3070 and 3070 in-circuit test (ICT) high node count test solution is the world’s highest pin count ICT system, bringing an unprecedented level of performance and portability to users.

브로셔 2015-02-12

PDF PDF 212 KB

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