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Surviving State Disruptions Caused by Test: the "Lobotomy Problem” 
Boundary scan test may affect the logic states of a device as it switches between core logic operation to test mode operation. This webcast puts forth proposals to restore the logic state to a defined state after testing.

Training Materials 2010-12-21

 
Innovations in EDA: A Practical Approach to Verifying RFICs with Fast Mismatch Analysis 
A new fast mismatch analysis that delivers the same level of accuracy with the benefit of significantly reducing overall cost, verification time and increased computed resource availability.

Seminar Materials 2010-10-29

PDF PDF 626 KB
Discrete Oscillator Design Tools and Techniques 
This webcast presentation is important to RF and microwave component designers who may not have time or budget to attend continuing education classes on the latest oscillator design tools.

Seminar Materials 2010-10-14

PDF PDF 2.01 MB
IC-CAP User Training 
This 3-day course will show device modelers how to use Keysight EEsof EDA's IC-CAP software. Click on link to view full course description and class dates and locations.

Classroom Training

 
Keysight EEsof EDA Customer Education and Services 
Brief overview of Keysight EEsof EDA Customer Education and Services.

Training Materials 2010-08-11

 
Printed Circuit Board (PCB) Test and Inspection - Archived Event and Seminar Material 

Webcast - recorded

 
Assembled PCB Inspection: SJ Family - Archived Event and Seminar Material 

Webcast - recorded

 
Medalist i5000 - Archived Event and Seminar Material 

Webcast - recorded

 
RF and Microwave Fundamentals 
This course provides an introductory training to refresh the RF & Microwave basic concepts and to discuss the measurement fundamentals at high frequencies.

Classroom Training

 
Cable and Connector Care 
Accelerated Education Curriculum: Training for fundamentals of connector care

Classroom Training

 
Boundary Scan Online Training 
Get up to speed on boundary scan! Access online training materials for boundary scan from the comfort of your desk!

Training Materials 2010-01-28

 
DfT rules for boundary scan during ICT 
Learn about the design for test rules for boundary scan used at in-circuit test, that can help you create a good test, minimizing the time and effort needed for debugging while maximizing the efficiency of your test.

Training Materials 2009-12-01

PDF PDF 276 KB
Automated Stimulus & Current Drain Analysis for Validating/Optimizing Mobile Device Run Time 
customer viewable presentation

Training Materials 2008-04-15

PDF PDF 773 KB
In-circuit Test - Archived Event and Seminar Material 

Webcast - recorded

 
Medalist 3070 - Archived Event and Seminar Material 

Webcast - recorded

 
Cheetah PNA RCS and Antenna Measurement System Presentation 
View the presentation on Cheetah PNA RCS and Antenna Measurement Systems. Reprinted with the permission of SPC Corp.

Training Materials 2004-03-25

PDF PDF 2.29 MB
Near-field vs. Far-field 
Review the tradeoffs and advantages of either a near field or far field antenna test solution. Reprinted with the permission of NearField Systems Inc.

Training Materials 2004-03-03

PDF PDF 582 KB
Antenna Measurement Basics 
Review the terminology, measurement types, errors sources and test considerations. Reprinted with the permission of Orbit/FR Inc.

Training Materials 2004-03-03

PDF PDF 1.11 MB
New Tools For Optimizing Operating Time of Mobile Wireless Devices 
Explore challenges of measuring battery current consumption in design validation of next generation digital communications devices including 2.5/3G handsets, Wireless LAN, and Bluetooth technology.

Training Materials 2002-06-25

 
Presentation on Digital Predistortion of Power Amplifiers 
This Presentation by Shawn P. Stapleton is a basic overview of the key features, technologies, and performance requirements of digital predistortion of power amplifiers.

Seminar Materials 2001-06-01

PDF PDF 865 KB
Presentation on FET Modeling for Power Amplifier Design 
This Presentation by David Root (Agilent Technologies) higlights that the measurement based modeling is a practical and versatile approach for simulating Power Amplifiers and other larger-signal circuits FETs.

Seminar Materials 2000-11-01

PDF PDF 875 KB
Presentation on Active 3G Gilbert Cell Mixer 
This Presentation shows why the noise figure of 3G Gilbert Cell and other monolithic active mixers vary so much from simulated results, depending upon their measurement setup and usage parameters.

Seminar Materials 2000-11-01

PDF PDF 2.28 MB
Presentation on Power Amplifier Design with Custom Templates 
This Presentation focuses on designing power amplifiers with ADS using custom templates. Templates simplify the use of ADS and are a powerful productivity tool for designing power amplifiers.

Seminar Materials 2000-11-01

PDF PDF 515 KB
Presentation on RF Predistortion of Power Amplifiers - Part 1 
This Presentation by Shawn P. Stapleton on RF Predistortion of Power Amplifiers focuses on adaptive RF predistrotion techniques - concepts and RF predistortion design examples.

Seminar Materials 2000-11-01

PDF PDF 360 KB

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