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RF & Microwave

For most of your RF & Microwave measurement needs, you can find application & solution information here.

Be sure to check the library of application notes for detailed information on using your equipment and successfully completing the measurements you need.

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Keysight EEsof EDA Newsletter - Product and Application News 
Keep tabs on the latest product and application news and review the archives of the Keysight EEsof EDA Newsletter.

Newsletter 2017-10-01

 
New 89600 VSA Software Release Helps Component, Module, System Designers Achieve 5G First-to-Market  
Software lets designers jumpstart development with 5G analysis capabilities for signal-quality measurements of Verizon 5G signals today, planned support for 5G new radio standard signals.

Press Materials 2017-09-29

 
5G: How Do You Test for a Standard that Doesn’t Even Exist? 
5G NR is ascending rapidly as the 5G technology of choice, but it turns out lots can be done to get ready as it goes through the formal 3GPP channels.

Article 2017-09-19

 
Keysight to Showcase Latest Measurement, Test, Design Innovations at European Microwave Week 2017 
Keysight announces it will showcase a wide range of design, test and characterization solutions at European Microwave Week 2017, Booth 107, Nuremberg Convention Center Nuremberg, Oct. 10–12.

Press Materials 2017-09-19

 
EPM and EPM-P Series Power Meters E-Series Power Sensors - Configuration Guide 
This configuration guide describes the standard configurations, options, and compatible accessories of EPM Series and EPM-P Series power meters.

Configuration Guide 2017-09-11

Average Power Sensor Measurement Uncertainty Calculator - Application Note 
Measurement Uncertainty Calculator for the Average Power Sensors (N8481A, N8482A, N8485A, N8481A-CFT, N8482A-CFT, N8485A-CFT, 8481D, 8485D, 8487D, R8486D, Q8486D, E4412A, E4413A, E9300A, E9301A, E9304A, E9300B, E9301B, E9300H, E9301H)

Application Note 2017-09-08

XLS XLS 78 KB
Network Analysis - De-embedding and Embedding S-Parameter Networks (1364-1) 
At RF and microwave frequencies, it becomes difficult to directly measure devices with nonstandard connectors (for example, devices using surface-mount packaging).

Application Note 2017-09-07

Fundamentals of RF and Microwave Noise Figure Measurements - Application Note 
This 32-page, black-and-white application note providesinformation on RF and Microwave noise figure measurementts. Topics include noise figure and temperature, noise characteristics of two-port networks, and the measurement of noise figure.

Application Note 2017-09-06

Accessories Catalog for Impedance Measurements - Catalog 
This catalog introduces all the impedance test fixtures that can be used with LCR meters, Resistance Meters, Capacitance Meters, Impedance Analyzers, and Combination analyzers. ADDITIONAL MODELS: 16196A 16196B 16196C 16197A 16064B 16190B 16380A 16380C 42030A 42090A 42091A

Selection Guide 2017-08-24

LCR Meters, Impedance Analyzers and Test Fixtures - Selection Guide 
This 13-page, selection guide matchesapplications to LCR meters, Impedance analyzer, and fixtures cotains brief information on products and applicationliteratures. ADDITIONAL PRODUCTS: 4294A 42941A 4396B 4395A 4287A 4288A 4285A 4263B 4268A 4338B 4339B 4349B 4278A 4279A BIAS ADAPTER File size: 1900 KB4339B 4349B 4278A 4279A BIAS ADAPTER

Selection Guide 2017-08-14

Power Meters and Power Sensors - Brochure 
This brochure covers features, applications, specifications and selection guide for Keysight's power measurement solutions.

Brochure 2017-08-11

PDF PDF 10.73 MB
Environment Aware Virtual Vehicle-To-Vehicle System Design  
ECN article by Wilfredo Rivas-Torres, PhD, Sr. EDA Application Engineer and Wenyan Ding, Sr. EDA EM Application Engineer at Keysight Technologies.

Article 2017-08-08

 
P-Series Measurement Uncertainty Calculator 
Measurement Uncertainty Calculator for the N1911A and N1912A Power Meters and the N1921A and N1922A Power Sensors.

Application Note 2017-08-01

XLS XLS 92 KB
How to Estimate Voltage Spikes from Layout Parasitic Inductance in Switched-Mode Power Supplies 
We showed you how to deal with layout parasitic inductance in our previous video entitled “How to design DC-to-DC power converters”, but a frequently asked question was “When should I start to worry about layout parasitics inductance? Is there a quick rule of thumb that says kind of ‘Caution: Further investigation’s needed?’” The answer is yes and this follow up video is about how to make these estimates.

How-To Video 2017-07-17

 
SystemVue 2017 Simulation Platform Effectively Lowers ASTRI’s NB-IoT XCVR Cost, Power Requirements 
Keysight announces that its premier simulation platform for system design and verification, SystemVue 2017, significantly contributed to an improvement to the narrowband internet of things (NB-IoT) standard. SystemVue enables users to combine existing baseband, RF, and channel models together for evaluation of the entire system. The improvement realized using SystemVue, optimizes the NB-IoT user equipment (UE) standard to facilitate the implementation of low-power NB-IoT terminal chips and will be incorporated in Release 13 (revised version) and 14 of the 3GPP standard.

Press Materials 2017-07-13

 
Noise Figure Measurement Accuracy - The Y-Factor Method - Application Note 
Specific to instruments that use the Y-factor method for noise figure measurements, this app note discusses measurement basics, avoidable errors, loss and temperature corrections, and uncertainties.

Application Note 2017-07-13

Making Better Models with User Data 
This paper details the process of combining MATLAB and the RF System analysis to improve the accuracy of simulations via personalized models.

Application Note 2017-06-24

PDF PDF 1.44 MB
EDAcafé - DAC 2017 Interview: Michel Azarian, Silicon RFIC EDA Program Manager 
Sanjay Gangal from EDAcafé interviews Michel Azarian (Keysight Technologies' Silicon RFIC EDA Program Manager) at Design Automation Conference (DAC) 2017.

Demo 2017-06-22

 
IMS 2017: What's new with Keysight's SystemVue 2017 
Keysight's How-Siang Yap demonstrates the new features of SystemVue 2017 for Microwave Journal at IMS 2017 in Hawaii.

Demo 2017-06-21

 
Keysight EEsof EDA SystemVue 
SystemVue is an EDA environment for electronic system-level (ESL) design that allows system architects and algorithm developers to innovate the physical layer (PHY) of communications systems.

Technical Overview 2017-06-21

SystemVue Electronic System-Level (ESL) Design Software 
SystemVue ESL design software is a multi-domain modeling implementation and verification cockpit for electronic system-level (ESL) design.

Brochure 2017-06-20

PDF PDF 1.67 MB
IMS 2017: Top 5 Must-See 5G Products 
Sponsored by Qorvo, Wireless Design and Development (WDD) counts down the best 5G products out of this year's International Microwave Symposium.

Demo 2017-06-19

 
Keysight Demonstrates Latest Design, Simulation, Verification Solutions at DAC 
Keysight Technologies will showcase the newest releases of its EDA software for RF-microwave circuit and system, high-speed digital, electronic system level, 3-D electromagnetic, and device-modeling applications at the 54th annual Design Automation Conference (www.dac.com), the premier conference for design and automation of electronic systems.

Press Materials 2017-06-14

 
Video Clips from the "Four Ways to Boost Simulation Data Processing using Python" Webcast 
Watch these powerful video clips from the Keysight webcast, "Four Ways to Boost Simulation Data Processing using Python".

Demo 2017-06-12

 
Electrothermal Simulation using the Wolfspeed ADS PDK  
This is a short demonstration of how the Wolfspeed ADS PDK is configured to work with the ADS electrothermal simulator to co-simulate electrical and thermal performance. This allows designers to quickly understand the impact of thermal effects on their circuit designs, and account for those effects during the design process.

Demo 2017-06-02

 

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