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RF & Microwave

For most of your RF & Microwave measurement needs, you can find application & solution information here.

Be sure to check the library of application notes for detailed information on using your equipment and successfully completing the measurements you need.

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A Guide to Better Vector Network Analyzer Calibrations for Probe Tip Measurements 
by Cascade Microtech

Application Note 2002-01-17

PDF PDF 163 KB
A New Approach for Multi-Emitter Test Signal Generation 
A new capture and playback approach generates multi-emitter test signals using a combination of COTS test equipment and simulation software.

Article 2013-11-14

 
A New Technique for Pulsed RF Measurements (AN 120) 
This Application Note is for information only. Keysight no longer sells or supports these products.

Application Note 1968-09-01

PDF PDF 815 KB
A Packaged 60 GHz Low-Power Transceiver with Integrated Antennas for Short-Range Communications 
This paper describes a 60-GHz transceiver with integrated antennas for short range and low power wireless communications fabricated in a CMOS 65nm SOI technology.

Article 2013-03-25

PDF PDF 429 KB
A Simplified Extension of X-parameters to Describe Memory Effects for Wideband Modulated Signals 
Model memory effects of microwave amplifiers in the case of wideband modulated signals.

Application Note 2010-05-05

PDF PDF 616 Bytes
AC Simulation in Advanced Design System 
This video tutorial describes how to set up and run AC simulations in ADS including controller setup, sources, budget analysis, frequency conversion and other miscellaneous information.

Demo 2009-02-20

 
Accelerate Your MEMS Device Development & Manufacturing Efficiency Using Impedance Test Instruments 
This brochure describes a general overview of Keysight’s capabilities in MEMS device testing and generates awareness of Keysight impedance MEMS test solution to customer.

Brochure 2015-08-25

PDF PDF 1.70 MB
Accelerating Advanced Node CMOS RFIC Design 
Microwave Journal article by David Vye

Journal 2009-12-07

 
Accessories For Impedance Measurements 
This document introduces all the impedance test fixtures that can be used with LCR meters, Resistance Meters, Capacitance Meters, Impedance Analyzers, and Combination analyzers.

Selection Guide 2016-04-13

ACCO Semiconductor chooses Agilent RFIC Solutions Software for Next-Generation CMOS Power Amplifier 
GoldenGate is the most trusted simulation, verification and analysis solution available for integrated RF circuit design within the Cadence Virtuoso design flow.

Press Materials 2010-01-11

 
Accounting for Antenna and MIMO Channel Effects Using SystemVue 
This application note helps MIMO architects and system verifiers predict the effects of propagation and physical imperfections of 8x8 MIMO antennas on 4G system performance, before hardware prototypes are av.

Application Note 2010-09-24

Accurate Impedance Measurement with Cascade Microtech Probe System(AN1369-3) 
This 12 page application note explains how to make on-wafer or on-substrate 1-port impedance measurements using a probe station.The E4991A (1 M-3 GHz) and 4294A (40-110 MHz) solutions are discussed.

Application Note 2001-07-31

Accurate Simulation Models Yield High Efficiency Power Amplifier Design 
In this Paper, an accurate nonlinear transistor model is shown to form the basis for a systematic simulation-based design procedure for a microwave power amplifier.

Technical Overview 2005-12-01

PDF PDF 238 KB
Accurate Simulation Models Yield High-Efficiency Power Amplifier Design 
This Article by Sonoko Akamatsu, Charles Baylis, and Larry Dunleavy details the design goals and simulation- based processes for Power Amplifier Design.

Article 2014-07-31

PDF PDF 592 KB
Accurate testing of the dielectric properties of powders, liquids and pliable materials – MWI Labora 
Accurate testing of the dielectric properties of powders, liquids and pliable materials – MWI Laboratories and Keysight

Solution Brief 2014-12-01

 
Achive First-Pass LTCC Design Success With DFM 
Understanding the effects of process and component variations can help in constructing LTCC circuit designs that deliver desired performance levels in spite of those variations.

Article 2007-05-01

PDF PDF 2.43 MB
Active Analog Filter Synthesis 
Learn how to quickly design active analog filters with op-amps from a complete selection of response shapes such as Chebyshev, Butterworth, Bessel Cauer or user-defined G-value tables. Select from all popular topologies such as biquad, elliptic, single or multiple feedback for fast realization with active filter synthesis. Includes singly terminated topologies for diplexer and multiplexer designs.

Demo 2015-08-15

 
Active Device Characterization in Pulse Operation Using the PNA/PNA-X - Application Note 
This AN discusses pulsed S-parameter measurements using the PNA-X series and measurement techniques that enable power-dependent active device characterization including compression and distortion.

Application Note 2013-06-19

Addressing the Challenges of Radar and EW System Design and Test using a Model-Based Platform 
Article reprint, High Frequency Electronics, October 2013. Due to the challenges of Electronic Warfare (EW) environments, today’s designers require a solution for designing, verifying and testing their Radar and EW systems in an effective way.

Article 2013-10-10

PDF PDF 1.45 MB
Addressing the Design and Verification Challenges of LTE 
Wireless Design magazine article on testing LTE.

Article 2009-02-25

PDF PDF 4.59 MB
ADS 2011 Videos Debut on YouTube 
A collection of Advanced Design System 2011 video demonstrations and tutorials

Demo 2011-02-25

 
ADS 2014 Dramatically Improves Design Productivity and Efficiency 
Agilent announces a powerful new version of Advanced Design System software, ADS 2014. Designed to dramatically improve design productivity and efficiency with new technologies and capabilities, ADS 2014 is the software's most significant ADS release to date.

Press Materials 2014-02-20

 
ADS 30-Second Demos 
Watch these videos to learn about popular usability improvements we’ve made in Advanced Design System (ADS) to increase your productivity.

Demo 2014-03-06

 
ADS Controlled Impedance Line Designer Solves Key Challenges in Designing Chip-to-Chip Links 
Agilent introduces Agilent EEsof EDA’s Controlled Impedance Line Designer. The software product quickly and accurately optimizes stack up and line geometry for multigigabit-per-second chip-to-chip links, using the most relevant metric.

Press Materials 2014-01-27

 
ADS Desktop Design Rule Checker (DRC) 
ADS Desktop DRC is part of the Advanced Design System Layout and is available on your Desktop. It can be run easily in ADS and at any time during the MMIC design phase. With ADS Desktop DRC, you can run DRC early in your design cycle, at any time, and as often as you want - so there will be no surprises at the end.

Demo 2009-06-19

 

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