Here’s the page we think you wanted. See search results instead:

 

Contact an Expert

RF & Microwave

For most of your RF & Microwave measurement needs, you can find application & solution information here.

Be sure to check the library of application notes for detailed information on using your equipment and successfully completing the measurements you need.

Keysight RF and Digital Learning Center - A commitment to learning with industry experts

1-8 of 8

Sort:
ESL Design Notebook Blog 
The blog home of Electronic System-Level Design at Keysight Technologies highlighting applications, news, and opinions from a cross-discipline, system-level approach to design and verification in communications and defense.

Journal 2016-07-14

 
Enabling Fast Characterization of PA Performance with Modulated Signals 
Microwave Product Digest (MPD) featured article written by Agilent Technologies' Andy Howard.

Journal 2012-10-15

 
Defining the 4G PHY Architecture Design Challenges 
EE Times design article (Part 1) on defining the 4G PHY architecture design challenges.

Journal 2011-12-05

 
Using SystemVue to Overcome 4G Challenges 
EE Times design article (Part 2) on using SystemVue to overcome 4G challenges.

Journal 2011-12-04

 
X-parameters Aid MMIC Design 
Microwaves & RF article on how models based X-parameters can provide insights into the linear and nonlinear behavior of key components in wireless systems, including power amplifiers and mixers.

Journal 2010-07-15

 
Solving the RFIC Design for Yield and Verification Dilemma 
Microave Journal article on the role and evolution of simulation-based performance verification and yield for today’s highly integrated RFICs for digital wireless communications.

Journal 2010-07-15

 
Electromagnetic Interference Meets Its Match 
NVIDIA Summer 2010 article on how gaming-inspired 3D glasses and a GPU-accelerated simulation using Agilent's EMPro impact products we use every day.

Journal 2010-06-24

 
Accelerating Advanced Node CMOS RFIC Design 
Microwave Journal article by David Vye

Journal 2009-12-07