Here’s the page we think you wanted. See search results instead:

 

Contact an Expert

RF & Microwave

For most of your RF & Microwave measurement needs, you can find application & solution information here.

Be sure to check the library of application notes for detailed information on using your equipment and successfully completing the measurements you need.

51-75 of 76

Sort:
Tackling the Mixed-signal Testing Challenges of SDR 
Software-defined radios (SDR) utilize a combination of FPGAs, DSPs and analog/RF designs to achieve the radio’s system performance.

Article 2011-03-09

 
An Innovative and Integrated Approach to III-V Circuit Design 
This article explains how to drive III-V circuit design improvement by unified modeling, Design of Experiments (DOE) simulation, and Pareto Analysis

Article 2011-01-10

PDF PDF 360 KB
Defining a New Methodology for Radar System Design 
Article from Microwave Product Digest, October 2010, discussing the use of analysis suites for the design of advanced digital signal processing techniques.

Feature Story 2010-10-01

 
Solving the RFIC Design for Yield and Verification Dilemma 
Microave Journal article on the role and evolution of simulation-based performance verification and yield for today’s highly integrated RFICs for digital wireless communications.

Journal 2010-07-15

 
X-parameters Aid MMIC Design 
Microwaves & RF article on how models based X-parameters can provide insights into the linear and nonlinear behavior of key components in wireless systems, including power amplifiers and mixers.

Journal 2010-07-15

 
Electromagnetic Interference Meets Its Match 
NVIDIA Summer 2010 article on how gaming-inspired 3D glasses and a GPU-accelerated simulation using Agilent's EMPro impact products we use every day.

Journal 2010-06-24

 
Microwave Journal Cover Article: X-parameters Fundamentally Changing Nonlinear Microwave Design 
Provides an overview of the invention and need for x-parameters to model the behavior of non-linear devices. This is an article reprint from Microwave Journal, Issue March 2010, Vol.53. No.3

Article 2010-03-25

PDF PDF 771 KB
Follow Agilent EEsof EDA on Twitter! 
Twitter enables you to keep current on news and updates with Agilent EEsof through the exchange of quick, frequent answers to one simple question: What are you doing?

Newsletter 2010-03-04

 
Accelerating Advanced Node CMOS RFIC Design 
Microwave Journal article by David Vye

Journal 2009-12-07

 
WIN Semiconductors Announces New MMIC Tool Bar Personality for ADS Process Design Kits 

Newsletter 2009-10-23

 
X-Parameters: Commerical Implementations of the Latest Technology Enable Mainstream Applictions - Ar 
This article reprint from Microwave Journal introduces advances in commercially available solutions for characterization, modeling, and design of nonlinear components and systems based on X-parameters.

Article 2009-10-09

PDF PDF 1.12 MB
Using a design-to-test capability for LTE MIMO  
Article written for RF DesignLine by Keysight experts explains how system-level simulation helps engineers gain valuable insight into design sensitivities of LTE MIMO systems.

Case Study 2009-07-10

 
Keysight's ADS helps SiGe Semiconductor - a Customer Success Story 
A Customer Success Story by Marquis Julien (SiGe Semiconductor, Inc) on getting Silicon Germanium Bluetooth power amplifier to the market fast by using Keysight’s ADS.

Case Study 2009-04-01

PDF PDF 123 KB
Fast Multitone Analysis of RF Transceivers 
This Article written by George Estep, Pete Johnson and Vladimir Veremey describes Fast Multitone analysis of RF Transceivers in detail.

Article 2009-03-24

PDF PDF 1.74 MB
Inphi Delivers Memory Interface Chip for DDR3-1600 Using Advanced Design System 
This Success Story details how Inphi delivered memory interface chip for DDR3-1600 using Keysight’s Advance Design System (ADS).

Case Study 2009-03-12

PDF PDF 196 KB
Addressing the Design and Verification Challenges of LTE 
Wireless Design magazine article on testing LTE.

Article 2009-02-25

PDF PDF 4.59 MB
Electronic Products - 2008 Product of the Year Award 
Analyzer changes fundamental way communications networks are designed

Article 2009-01-01

 
Creating High-Performance SDR Architectures 
How to co-design RF architectures together with baseband signal processing to create high performance and flexible SDR architectures that can achieve the critical performance specifications necessary in the operational environment.

Article 2008-11-25

PDF PDF 806 KB
MMIC Design: Speed to Market with the Lowest Cost and Highest Yield 
This Article by Jack Sifri (Agilent Tech.) brings out the five important steps that are key elements of a successful MMIC Design process, in order to satisfy the speed to market at the lowest cost.

Article 2008-05-15

PDF PDF 1.58 MB
Achive First-Pass LTCC Design Success With DFM 
Understanding the effects of process and component variations can help in constructing LTCC circuit designs that deliver desired performance levels in spite of those variations.

Article 2007-05-01

PDF PDF 2.43 MB
Flexible Software-Defined Test Instruments 
This Article by Greg Jue presents the next generation of software defined test instruments; a key element in cost control, time to market, design flexibility and standards evolution.

Article 2006-11-01

PDF PDF 1.95 MB
Power Amplifier Design Speed-Up Techniques 
This Article presents how to speed up Power Amplifier Design by fast source-pull, real-time load-pull and accurate measurement-based behavioural models.

Article 2005-11-01

PDF PDF 1.71 MB
Linearizing PAs using Digital Predistortion, EDA Tools and Test Hardware 
This Article describes the process for developing and implementing an effective power amplifier linearization scheme using baseband adaptive digital pre-distortion.

Article 2004-04-01

PDF PDF 490 KB
An Integrated EDA-tools Flow Improves Designers' Productivity 
This Article written by Andy Howard (Agilent Technologies) explains application of an integrated front-to-back design flow to improve the quality and efficiency in the design of a prescaler.

Article 2002-05-30

PDF PDF 225 KB
How to Build EM-Accurate Parameterized Passive Models? 
An Article by Mounir Adada (Agilent Technology) highlights how modern EM parametric modeling tools can contribute in getting the products out the door right the first time.

Article 2002-05-30

PDF PDF 165 KB

Previous 1 2 3 4 Next