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RF & Microwave

For most of your RF & Microwave measurement needs, you can find application & solution information here.

Be sure to check the library of application notes for detailed information on using your equipment and successfully completing the measurements you need.

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One Size Does NOT Fit All - Application Note 
This application note discusses the topic of “One Size Does NOT Fit All” and how test system configurations benefit from a choice of hardware form factors and software products.

Notes d’application 2015-06-08

Wideband Digital Pre-Distortion with Keysight SystemVue & PXI Modular Instrument - Application Note 
Digital Pre-Distortion (DPD) is essential for wideband communications systems based on LTE-Advanced and 802.11ac. Overcome DPD challenges with trusted commercial measurement and modeling tools.

Notes d’application 2014-08-01

Multichannel Measurements in MIMO 802.11ac Baseband IQ Simulation, Design & Test - Application Note 
This solution brief will show Keysight Technologies' complete, end-to-end solution for multichannel measurements of 802.11ac BBIQ simulation, design and test.

Notes d’application 2013-04-05

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Boosting PLL Design Efficiency From free-running VCO characterizations to closed-loop PLL evaluation 
This application note describes introduces practical solutions for VCO/PLL performance evaluation and gives actual examples of parameter measurements using the E5052B.

Notes d’application 2008-11-21

81100 Family of Pulse Pattern/Generators Radar Distance Test to Airborne Planes (PN 1) - App Note 
This Product Note describes how a trigger pulse train of double pulses is sent from the control tower's radar system to an airplane.

Notes d’application 2004-10-12

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TS-5550 Cellular Phone Functional Test Platform (PN TS-5550) 
This 12-page color print on demand Product Note discusses the TS-5550 platform features and benefits, including the ability to test up to four celluar phones at once. It is a flexible system for rapid development of cellular phone functional test. Configuration and ordering structure is also given.

Notes d’application 2000-08-01