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RF & Microwave

For most of your RF & Microwave measurement needs, you can find application & solution information here.

Be sure to check the library of application notes for detailed information on using your equipment and successfully completing the measurements you need.

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Techniques for Advanced Cable Testing - Application Note 
Covers advanced measurement techniques and examples for measuring and troubleshooting transmission lines installed in a system.

Application Note 2015-04-15

Radar Development Using Model-Based Engineering 
This application note describes how SystemVue is well suited for use in model-based engineering. It is for system engineers, directors of engineering and people involved in the development of Radar.

Application Note 2015-04-14

PDF PDF 1.59 MB
Recommendations for Port Setup When Using ADS Momentum and Modelithics Models 
This application note is intended to help Advanced Design System (ADS) users using Modelithics models, simulate RF & Microwave circuits. The focus is on finding the optimum port setup for EM simulation of circuit layouts that include surface-mount technology (SMT) devices.

Application Note 2015-02-05

PDF PDF 1.43 MB
Power of Impedance Analyzer - Application Note 
This application note describes the necessity of real-characteristics evaluation, and shows that the impedance analyzers only have capabilities to achieve real-characteristics.

Application Note 2015-01-07

Innovative Passive Intermodulation (PIM) and S-parameter Measurement Solution with the ENA 
This application note introduces the solution that combines PIM and S-parameter measurements by using the vector network analyzer.

Application Note 2014-12-05

PDF PDF 690 KB
Generating Multi-Dimensional Signals to Test Radar/EW Systems 
This application note describes how to use SystemVue to generate multi-dimensional signals for testing Radar and modern Electronic Warfare (EW) systems.

Application Note 2014-11-09

The Impact of Electro-Thermal Coupling on HBT Power Amplifiers 
This paper describes the use of electrothermal simulation to understand, predict, and account for cross-circuit thermal coupling in a commercial HBT power amplifier.

Application Note 2014-10-19

 
Understanding the SystemVue To ADS Simulation Bridge - Application Note 
This application note shows how RF designers using Advanced Design System (ADS), as well as system architects and DSP developers using SystemVue, can co-simulate for greater functionality and cross-platform debug and verification.

Application Note 2014-08-31

PDF PDF 1.95 MB
Using ADS to Investigate Optimal Performance of a Cree FET 
This application note documents a workspace that shows how to apply ADS load pull simulations to attain optimal performance of a Cree FET.

Application Note 2014-08-04

Using SystemVue for Integrating Wireless PHY Design, Validation, and Test 
Keysight SystemVue integrates system-level design tasks such as DSP modeling and Algorithm development with Validation and Test to create a unique new design flow for communications physical layer.

Application Note 2014-08-03

PDF PDF 5.89 MB
Solutions for Emerging 4G and WLAN Communications Systems - Application Note 
This “Solutions for Emerging 4G and WLAN Communication Systems” application note explains how making Digital Pre-Distortion fast and practical for all engineers.

Application Note 2014-08-03

Simulating Envelope Tracking with Advanced Design System Software - Application Note 
This example applies envelope tracking to an example amplifier to show techniques of using Advanced Design System (ADS) for this type of design.

Application Note 2014-08-02

PDF PDF 2.38 MB
Simulation and Verification of Pulse Doppler Radar Systems - Application Note 
Keysight SystemVue illustrates key algorithms in modern Pulsed Doppler radar system design, and also connects to Keysight sources and signal analyzers to verify hardware performance.

Application Note 2014-08-02

PDF PDF 10.44 MB
Streamline EMC Compliance Testing with Prescan Analysis Tools - Application Note 
Application note

Application Note 2014-08-01

PDF PDF 899 KB
FPGA Prototyping Using Keysight SystemVue 
This application note describes a top-down FPGA design flow using SystemVue for rapid prototyping of physical layer communications signal processing.

Application Note 2014-08-01

Wideband Digital Pre-Distortion with Keysight SystemVue & PXI Modular Instrument - Application Note 
Digital Pre-Distortion (DPD) is essential for wideband communications systems based on LTE-Advanced and 802.11ac. Overcome DPD challenges with trusted commercial measurement and modeling tools.

Application Note 2014-08-01

Cognitive Radio Algorithm Development and Testing White Paper 
This paper describes some of these challenges and introduces the cognitive radio algorithm R&D testbed, which uses SystemVue software.

Application Note 2014-07-31

PDF PDF 1.53 MB
State of the Art in EM Software for Microwave Engineers - White Paper 
This article discusses the three most established EM simulation technologies: MoM, FEM, and FDTD, linking the simulation technology to solving specific applications.

Application Note 2014-07-31

Average Power Sensor Measurement Uncertainty Calculator - Application Note 
Measurement Uncertainty Calculator for the Average Power Sensors (N8481A, N8482A, N8485A, N8481A-CFT, N8482A-CFT, N8485A-CFT, 8481D, 8485D, 8487D, R8486D, Q8486D, E4412A, E4413A, E9300A, E9301A, E9304A, E9300B, E9301B, E9300H, E9301H)

Application Note 2014-03-25

XLS XLS 82 KB
Pulsed Carrier Phase Noise Measurements - Application Note 
This application note discusses basic fundamentals for making pulsed carrier phase noise measurements.

Application Note 2014-03-13

Overcoming the Challenges of Simulating Phased-Array Radar Systems 
This application note discusses a solution that reduces design cycles, significantly reduces cost and allows you to simulate a scenario before taking it to land, skies and seas.

Application Note 2014-02-26

Noise Figure Measurement Accuracy - The Y-Factor Method - Application Note 
Specific to instruments that use the Y-factor method for noise figure measurements, this app note discusses measurement basics, avoidable errors, loss and temperature corrections, and uncertainties.

Application Note 2014-02-26

PDF PDF 1.48 MB
On-Wafer SOLT Calibration Using 4-port PNA-L Network Analyzers - Application Note 
This documentation is intended for on-wafer applications using the 4-port, 20 GHz, PNA-L network analyzer with two dual probes to achieve full 4-port on-wafer calibrations manually. This application note provides the step-by-step instructions needed to set up a calibration kit in order to perform a 4-port SOLT (Short-Open-Load-Thru) calibration using only three thrus.

Application Note 2014-02-06

Essential Capabilities of EMI Receivers - Application Note 
What makes an EMI receiver fully compliant? This application note provides an overview of some of the most useful internal diagnostic tools for quickly & efficiently measuring unwanted emissions.

Application Note 2013-10-14

Active Device Characterization in Pulse Operation Using the PNA/PNA-X - Application Note 
This AN discusses pulsed S-parameter measurements using the PNA-X series and measurement techniques that enable power-dependent active device characterization including compression and distortion.

Application Note 2013-06-19

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