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RF & Microwave

For most of your RF & Microwave measurement needs, you can find application & solution information here.

Be sure to check the library of application notes for detailed information on using your equipment and successfully completing the measurements you need.

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Bluetooth Audio Measurement with the U8903B Performance Audio Analyzer - Application Note 
This article focuses on the Bluetooth audio measurement applications of the U8903B performance audio analyzer. Bluetooth audio is also part of the whole audio measurement and analysis ecosystem.

Application Note 2016-01-28

Impedance Measurement Handbook - 5th Edition - Application Note 
This 140 page handbook is Keysight Technologies's most detailed information on the basics of impedance measurements using Keysight's LCR meters and impedance analysers. It provides the theory, test set-upinformation, error discussion, etc.

Application Note 2015-10-07

Optimizing RF and Microwave Spectrum Analyzer Dynamic Range -- Application Note 
The dynamic range of a spectrum analyzer is traditionally defined as the ratio, in dB, of the largest to the smallest signals simultaneously present at the input of the spectrum analyzer that allows measurement of the smaller to a given degree of uncertainty. The signals of interest can either be...

Application Note 2015-07-24

Optimizing RF and Microwave Spectrum Analyzer Dynamic Range - Application Note 
This application note defines the elements of spectrum analyzer measurement speed and shows how to choose solution bandwidth and data output format for fast measurements.

Application Note 2015-07-22

Noise Figure Uncertainty Calculator 
The noise figure uncertainty calculator has been created to aid your design work, from components through to systems, helping you meet the continued demand for higher system performance.

Analysis Tool 2015-05-29

 
Noise Figure Measurement Accuracy - The Y-Factor Method - Application Note 
Specific to instruments that use the Y-factor method for noise figure measurements, this app note discusses measurement basics, avoidable errors, loss and temperature corrections, and uncertainties.

Application Note 2014-02-26

PDF PDF 1.48 MB
Active Device Characterization in Pulse Operation Using the PNA/PNA-X - Application Note 
This AN discusses pulsed S-parameter measurements using the PNA-X series and measurement techniques that enable power-dependent active device characterization including compression and distortion.

Application Note 2013-06-19

High-Accuracy Noise Figure Measurements Using the PNA-X Series Network Analyzer – App Note 1408-20 
This application note discusses the unique challenges involved in minimizing noise figure.

Application Note 2013-01-31

Spectrum and Signal Analysis Pulsed RF Application Note 150-2 
This application note is intended as an aid for the operation of spectrum and signal analyzers and the interpretation of the displayed pulse spectra.

Application Note 2012-07-05

Fundamentals of RF and Microwave Noise Figure Measurements - Application Note 
This 32-page, black-and-white application note providesinformation on RF and Microwave noise figure measurementts. Topics include noise figure and temperature, noise characteristics of two-port networks, and the measurement of noise figure.

Application Note 2010-08-05

8 Hints for Making Better Spectrum Analyzer Measurements (AN 1286-1) - Application Note 
This application note provides eight pertinent hints for making better spectrum analyzer measurements such as measuring low level signals and indentifying internal distortion products.

Application Note 2009-09-07

Fundamentals of RF and Microwave Power Measurements (AN 1449) - Application Note 
Keysight's Fundamentals of RF and Microwave Power Measurements, application note (AN 1449-1/2/3/4).

Application Note 2009-06-05

 
Multifrequency C-V Measurements of Semiconductors (AN 369-5) 
The Keysight 4284A has a DC bias capability of +/- 40V and a wide frequency cover age of 20 Hz - 1 MHz, which enable us to make semiconductor C-V measurements.

Application Note 2008-12-10

Characterizing Clock Jitter through Phase Noise Measurements Speeds up Design Verification Process 
This white paper discusses a new measurement method for obtaining highly accurate low random jitter (RJ) measurements and performing real-time analysis of RJ and periodic jitter (PJ) of components.

Application Note 2008-11-20

PNA - Pulsed-RF S-Parameter Measurements Using Wideband and Narrowband Detection (AN 1408-12) 

Application Note 2007-11-28

4 Steps for Making Better Power Measurements (AN 64-4D) - Application Note 
Before selecting a power meter and associated sensors, make sure that you have taken the 4 steps detailed in this note, which influence the accuracy, economy and technical match to your application.

Application Note 2006-04-26

Performance Spectrum Analyzer Series: Swept and FFT Analysis Application Note 
This Product Note covers the measurement speed and other benefits of advanced signal processing in the new PSA Performance Spectrum Analyzer Series.

Application Note 2004-10-19

PSA Performance Spectrum Analyzer Series: Measurement Innovations and Benefits 
Performance Spectrum Analyzer Series. This Note is a general overview of all of the major new technologies used in the PSA series, with a focus on the measurement benefits they provide...

Application Note 2004-02-27

Evaluation of MOS Capacitor Gate Oxide C-V Characteristics Using the Keysight 4294A(PN4294-3) 
As a result of extremely high integration of logic LSIs, MOS FETs with gate lengths of 0.1 mm or less have been produced recently. A consequence of this miniaturization has been the need for very thin gate oxide layers.

Application Note 2003-06-26

Obtain Flat-Port Power with Keysight's PSG User Flatness Correction or External Leveling Functions 
The PSG series is ideally suited for design and test systems with high frequencies, wide bandwidths and complex modulation formats. This Product Note explains how to obtain flat...

Application Note 2003-02-04

Spectrum Analysis: Amplitude and Frequency Modulation (AN 150-1) - Application Note 
Modulation is the act of translating some low-frequency or base-band signal (voice, music, data) to a higher frequency. Why do we modulate signals? There are at least two reasons: to allow the simultaneous transmission of two or more baseband signals by translating them to different frequencies...

Application Note 2001-10-01

PDF PDF 1.08 MB
Investigating Bluetooth Modules: The First Step in Enabling Your Device with a Wireless Link 
This Application Note is designed for vendors or manufacturers who plan to add a wireless link to their products by installing commercially-available, pre-built Bluetooth® modules into them.

Application Note 2001-09-30

Combining Network and Spectrum Analyses and IBASIC (AN 1288-1) 
Active components (and now even some passive components like crystal filters require analysis to characterize linear parameters (gain/loss, phase and group delay or S-parameters) as well as non-linear performance. Non-linear analysis is typically related to measuring signal distortion generated...

Application Note 2001-08-30

Fundamentals of RF and Microwave Power Measurements (AN 64-1C) 
This Application Note is for information only. Keysight no longer sells or supports these products.

Application Note 2001-04-16

PDF PDF 2.21 MB
346A/B/C Noise Sources: 10 MHz to 26.5 GHz 
The attached document provides technical data for the Keysight 346A, 346B, and 346C Noise Sources ranging from 10 MHz to 26.5 GHz.

Application Note 2000-12-01

PDF PDF 500 KB

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