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81602A Extra High Power Tunable Laser - video 
The Keysight 81602A is an extra high power tunable laser operating from 1250 nm to 1370 nm. With over +17 dBm peak power and +16 dBm in the 100GBASE-LR4 range, it improves tolerance for optical power budgets in test setups.

基本展示 2016-04-20

 
Keysight Trade-In - Flyer 
Keysight Premium Used instruments undergo a comprehensive final inspection as this flyer explains.

型錄 2016-04-18

PDF PDF 330 KB
Keysight Premium Used - Flyer 
Keysight Premium Used offers you a vast selection of high-quality test equipment, re-manufactured to like-new specifications and appearance.

型錄 2016-04-18

PDF PDF 283 KB
Technology Refresh Services for V-Series, Z-Series Oscilloscopes - Flyer 
2-page flyer that explains and links to V-Series,Z-Series Oscilloscopes Technology Refresh Services including, trade-in, upgrades, extended service, premium used and consulting.

促銷資料 2016-04-12

PDF PDF 1.25 MB
Technology Refresh Services for X-Series Signal Analyzers - Flyer 
2-page flyer that explains and links to X-Series signal analyzer Technology Refresh Services including, trade-in, upgrades, extended service, premium used and consulting.

促銷資料 2016-04-12

PDF PDF 931 KB
Technology Refresh Services for FieldFox Handheld Analyzers - Flyer 
2-page flyer that explains and links to FieldFox handheld analyzers Technology Refresh Services including, trade-in, upgrades, extended service, premium used and consulting

促銷資料 2016-04-12

PDF PDF 1.43 MB
Introduces Tunable Laser Sources for Testing Data Center Devices, Integrated Components 
+17dBm Enables Verification of Silicon Photonics Designs, New O-Band Option Accelerates High-Volume Testing

新聞資料 2016-03-23

 
8160xx Family of Tunable Laser Sources - Data Sheet 
The Keysight 8160xx Family of Tunable Laser Sources offers the full wavelength range from 1260 nm to 1650 nm with the highest tuning and sweeping accuracy and power stability

產品型錄 2016-03-17

81602A Extra High Power Tunable Laser - Data Sheet 
The 81602A Tunable Laser Source has been designed to explore new application areas in photonic device testing: it sports output power levels beyond 50 mW (+17 dBm) and covers the O-band.

產品型錄 2016-03-17

Using a Wide-Band Tunable Laser for Optical Filter Measurements – Article 
This article was published in NASA Tech Briefs hard copy and online, highlighting how to use a wide-band tunable laser for optical filter measurements.

專文 2016-01-18

PDF PDF 1.82 MB
Moving the World’s Technology Forward. Faster. - Brochure 
Believe you can change the world. Bill Hewlett, one of the original co-founders of what is now Keysight Technologies, first said these words. The same passion to make the world a better and safer place still drives us more than 75 years later.

型錄 2015-11-01

PDF PDF 7.64 MB
Forward Clocking - Receiver (RX) Jitter Tolerance Test with J-BERT N4903B High-P - Application Note 
This document describes the requirements for forward clocking topology RX Jitter tolerance testing.

應用手冊 2015-04-24

PDF PDF 2.22 MB
Lightwave Catalog: 2015 Bit Error Ratio and Waveform Analysis Volume 3 - Catalog 
Volume III covers “Bit Error Ratio & Waveform Analysis” for data center and cloud environment.

目錄 2015-01-31

PDF PDF 2.41 MB
Lightwave Catalog: 2015 Optical-Electrical, Signal Generation, Complex Modulation Analysis Volume 2 
Volume II covers “Optical –Electrical/Polarization/Complex Modulation Analysis“ for the transmission networks.

目錄 2015-01-31

PDF PDF 3.69 MB
Lightwave Catalog: 2015 Optical Component Test Volume 1 - Catalog 
Volume I covers “General Photonic Instruments” to characterize single-mode and multimode fiber-optic components, especially at the physical layer.

目錄 2015-01-31

PDF PDF 1.88 MB
On-Wafer Testing of Opto-Electronic Components Using LCA's 
This document describes the principles of on-wafer measurements on opto-electronic components

應用手冊 2014-07-31

Digital Communication Analyzer (DCA), Measure Relative Intensity Noise (RIN) - Application Note 
Digital Communication Analyzer (DCA), Measure Relative Intensity Noise (RIN).

應用手冊 2014-07-31

Jitter Analysis: The Dual-Dirac Model, RJ/DJ, and Q-Scale - Application Note 
This paper provides a complete description of the dual-Dirac model, how it is used in technology standards and a summary of how it is applied on different types of test equipment.

專文 2014-06-14

PDF PDF 515 KB
Lightwave Tutorial Series on Complex Optical Modulation - Article 
Keysight offers a tutorial series on complex optical modulation featured in Lightwave magazine, featuring for example the challenges of coherent signal detection.

專文 2014-05-22

 
Spectrum Management for Efficient Bandwidth Allocation - X-COM 
Spectrum Management Solutions for Efficient Bandwidth Allocation from X-COM and Keysight

解決方案簡介 2014-05-14

 
Polarization Tutorial CD - Ordering Form 
Polarization Tutorial CD - Ordering and Information Request Form.

基本展示 2014-03-31

 
High Speed Lightwave Component Analysis - Application Note 
The principles and methods are described for measuring the frequency dependence of fiberoptic transponders that convert electrical signals to optical signals and optical to electrical.

應用手冊 2014-02-26

What is the difference between an equivalent time and a real-time oscilloscope? - Application Note  
This document will discuss how each type of oscilloscope samples the incoming waveform and explain the trigger requirements.

應用手冊 2013-11-18

Measuring Jitter in Digital Systems (AN 1448-1) - Application Brief 
This application note is for R&D designers and engineers working on high-speed digital designs. It addresses jitter measurements in digital circuits, how the different measurement techniques are best applied, and how these decisions may change as the data rates increase.

應用手冊 2013-09-16

PDF PDF 1.78 MB
Probing High-Speed Signals with the 86100 Series of Wide-Bandwidth Sampling Oscilloscopes 
Product Note 86100-6 discusses three important measurement accessories that help make probe-based measurements both simple and accurate for the Keysight 86100 Wide-Bandwidth Oscilloscope.

技術總覽 2011-07-28

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