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Optical & Photonic

Keysight offers a wide-range of innovative test and measurement solutions to accelerate the progress of next-generation intelligent optical networks.

Keysight's mission in the optical market is to shorten time-to-market and reduce cost-of-test for customers in R&D and manufacturing, as well as enable new technologies which include innovative optical components, network elements & systems, and all-optical fiber networks.

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81602A Extra High Power Tunable Laser - Data Sheet 
The 81602A Tunable Laser Source has been designed to explore new application areas in photonic device testing: it sports output power levels beyond 50 mW (+17 dBm) and covers the O-band.

Data Sheet 2016-06-28

8160xx Family of Tunable Laser Sources - Data Sheet 
The Keysight 8160xx Family of Tunable Laser Sources offers the full wavelength range from 1260 nm to 1650 nm with the highest tuning and sweeping accuracy and power stability

Data Sheet 2016-06-15

81602A Extra High Power Tunable Laser - video 
The Keysight 81602A is an extra high power tunable laser operating from 1250 nm to 1370 nm. With over +17 dBm peak power and +16 dBm in the 100GBASE-LR4 range, it improves tolerance for optical power budgets in test setups.

Demo 2016-04-20

 
Keysight Premium Used - Flyer 
Keysight Premium Used offers you a vast selection of high-quality test equipment, re-manufactured to like-new specifications and appearance.

Brochure 2016-04-18

PDF PDF 283 KB
Keysight Trade-In - Flyer 
Keysight Premium Used instruments undergo a comprehensive final inspection as this flyer explains.

Brochure 2016-04-18

PDF PDF 330 KB
Technology Refresh Services for FieldFox Handheld Analyzers - Flyer 
2-page flyer that explains and links to FieldFox handheld analyzers Technology Refresh Services including, trade-in, upgrades, extended service, premium used and consulting

Promotional Materials 2016-04-12

PDF PDF 1.43 MB
Technology Refresh Services for V-Series, Z-Series Oscilloscopes - Flyer 
2-page flyer that explains and links to V-Series,Z-Series Oscilloscopes Technology Refresh Services including, trade-in, upgrades, extended service, premium used and consulting.

Promotional Materials 2016-04-12

PDF PDF 1.25 MB
Technology Refresh Services for X-Series Signal Analyzers - Flyer 
2-page flyer that explains and links to X-Series signal analyzer Technology Refresh Services including, trade-in, upgrades, extended service, premium used and consulting.

Promotional Materials 2016-04-12

PDF PDF 931 KB
Introduces Tunable Laser Sources for Testing Data Center Devices, Integrated Components 
+17dBm Enables Verification of Silicon Photonics Designs, New O-Band Option Accelerates High-Volume Testing

Press Materials 2016-03-23

 
Using a Wide-Band Tunable Laser for Optical Filter Measurements – Article 
This article was published in NASA Tech Briefs hard copy and online, highlighting how to use a wide-band tunable laser for optical filter measurements.

Article 2016-01-18

PDF PDF 1.82 MB
Moving the World’s Technology Forward. Faster. - Brochure 
Believe you can change the world. Bill Hewlett, one of the original co-founders of what is now Keysight Technologies, first said these words. The same passion to make the world a better and safer place still drives us more than 75 years later.

Brochure 2015-11-01

PDF PDF 7.64 MB
Forward Clocking - Receiver (RX) Jitter Tolerance Test with J-BERT N4903B High-P - Application Note 
This document describes the requirements for forward clocking topology RX Jitter tolerance testing.

Application Note 2015-04-24

PDF PDF 2.22 MB
Lightwave Catalog: 2015 Optical Component Test Volume 1 - Catalog 
Volume I covers “General Photonic Instruments” to characterize single-mode and multimode fiber-optic components, especially at the physical layer.

Catalog 2015-01-31

PDF PDF 1.88 MB
Lightwave Catalog: 2015 Optical-Electrical, Signal Generation, Complex Modulation Analysis Volume 2 
Volume II covers “Optical –Electrical/Polarization/Complex Modulation Analysis“ for the transmission networks.

Catalog 2015-01-31

PDF PDF 3.69 MB
Lightwave Catalog: 2015 Bit Error Ratio and Waveform Analysis Volume 3 - Catalog 
Volume III covers “Bit Error Ratio & Waveform Analysis” for data center and cloud environment.

Catalog 2015-01-31

PDF PDF 2.41 MB
On-Wafer Testing of Opto-Electronic Components Using LCA's 
This document describes the principles of on-wafer measurements on opto-electronic components

Application Note 2014-07-31

Digital Communication Analyzer (DCA), Measure Relative Intensity Noise (RIN) - Application Note 
Digital Communication Analyzer (DCA), Measure Relative Intensity Noise (RIN).

Application Note 2014-07-31

Jitter Analysis: The Dual-Dirac Model, RJ/DJ, and Q-Scale - Application Note 
This paper provides a complete description of the dual-Dirac model, how it is used in technology standards and a summary of how it is applied on different types of test equipment.

Article 2014-06-14

PDF PDF 515 KB
Lightwave Tutorial Series on Complex Optical Modulation - Article 
Keysight offers a tutorial series on complex optical modulation featured in Lightwave magazine, featuring for example the challenges of coherent signal detection.

Article 2014-05-22

 
Spectrum Management for Efficient Bandwidth Allocation - X-COM 
Spectrum Management Solutions for Efficient Bandwidth Allocation from X-COM and Keysight

Solution Brief 2014-05-14

 
Polarization Tutorial CD - Ordering Form 
Polarization Tutorial CD - Ordering and Information Request Form.

Demo 2014-03-31

 
High Speed Lightwave Component Analysis - Application Note 
The principles and methods are described for measuring the frequency dependence of fiberoptic transponders that convert electrical signals to optical signals and optical to electrical.

Application Note 2014-02-26

What is the difference between an equivalent time and a real-time oscilloscope? - Application Note  
This document will discuss how each type of oscilloscope samples the incoming waveform and explain the trigger requirements.

Application Note 2013-11-18

Measuring Jitter in Digital Systems (AN 1448-1) - Application Brief 
This application note is for R&D designers and engineers working on high-speed digital designs. It addresses jitter measurements in digital circuits, how the different measurement techniques are best applied, and how these decisions may change as the data rates increase.

Application Note 2013-09-16

PDF PDF 1.78 MB
Probing High-Speed Signals with the 86100 Series of Wide-Bandwidth Sampling Oscilloscopes 
Product Note 86100-6 discusses three important measurement accessories that help make probe-based measurements both simple and accurate for the Keysight 86100 Wide-Bandwidth Oscilloscope.

Technical Overview 2011-07-28

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