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Fundamentals of Electronic Test & Measurement

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Spectrum Analysis Basics - Application Note 
This application note (also known as AN 150) explains the fundamentals of swept-tuned, superheterodyne spectrum analyzers and discusses the latest advances in spectrum analyzer capabilities.

Notes d’application 2014-02-25

Understanding the Fundamental Principles of Vector Network Analysis - Application Note 1287-1 
This application note explores the fundamental principles of vector network analysis. The discussion includes the common parameters (S-parameters). RF fundamentals such as transmission lines and the Smith chart will also be reviewed.

Notes d’application 2012-12-07

8 Hints for Making Better Measurements Using RF Signal Generators Application Note 
This application provides 8 hints for improving the accuracy of your measurements using RF signal generators.

Notes d’application 2012-06-27

PDF PDF 1.35 MB
Making Accurate Intermodulation Distortion Measurements with the PNA-X (1408-17) – Application Note 
This application note describes accuracy considerations when using the Keysight PNA-X microwave network analyzer for two-tone intermodulation distortion measurements.

Notes d’application 2012-03-05

Fundamentals of RF and Microwave Power Measurements (Part 3) (AN 1449-3) 
Power Measurement Uncertainty per International Guides AN 1449-3, literature number 5988-9215EN

Notes d’application 2011-04-05

Specifying Calibration Standards and Kits for Keysight Vector Network Analyzers (AN 1287-11) 
This paper discusses calibration standard definitions, calibration kit content, and its structure requirements for Keysight's vector network analyzers. Also provided are set up examples and how to modify an existing calibration kit definition file.

Notes d’application 2011-03-28

Fundamentals of RF and Microwave Noise Figure (AN 57-1) 
This 32-page, black-and-white application note providesinformation on RF and Microwave noise figure measurementts. Topics include noise figure and temperature, noise characteristics of two-port networks, and the measurement of noise figure.

Notes d’application 2010-08-05

Improved Throughput in Network Analyzer Applications (AN 1287-5) 
This Application Note explores a variety of throughput issues and how they might affect different applications. It suggests ways to improve network analyzer performance for better throughput in specific situations, and how to get an accurate picture of how an analyzer's performance might impact...

Notes d’application 2010-03-15

PNA - Banded Millimeter-Wave Measurements (AN 1408-15) 
Contains banded millimeter-wave system configurations, system operation, system calibration, and typical measurement examples.

Notes d’application 2009-11-24

8 Hints for Making Better Spectrum Analyzer Measurements (AN 1286-1) 
This application note provides eight pertinent hints for making better spectrum analyzer measurements such as measuring low level signals and indentifying internal distortion products.

Notes d’application 2009-09-07

Fundamentals of RF and Microwave Power Measurements (AN 1449) - Application Note 
Keysight's Fundamentals of RF and Microwave Power Measurements, application note (AN 1449-1/2/3/4).

Notes d’application 2009-06-05

 
Diagnostic Testing and the Medalist 5DX Automated X-ray Inspection System 
Users of the Medalist 5DX automated x-ray inspection system can benefit from running diagnostic tests on a regular basis. This application note provides some guidelines.

Notes d’application 2009-01-14

PDF PDF 188 KB
IEEE 1149.6 Standard Boundary Scan Testing on Keysight Medalist i3070 ICT Systems 
This paper introduces the latest advancements in Boundary Scan test capabilities on the Keysight Medalist i3070 In-Circuit Test platform that supports the testing of IEEE 1149.6-compliant devices.

Notes d’application 2008-11-24

PDF PDF 297 KB
Medalist i3070 Test Throughput Optimization 
This application note explores some factors which cause test time to increase on the Medalist i3070 In-Circuit Test system, and methods which users can employ to reduce the test time and increase throughput on the Medalist i3070 ICT system.

Notes d’application 2008-11-24

Boosting PLL Design Efficiency From free-running VCO characterizations to closed-loop PLL evaluation 
This application note describes introduces practical solutions for VCO/PLL performance evaluation and gives actual examples of parameter measurements using the E5052B.

Notes d’application 2008-11-21

Achieving Fast Design Cycle Time 
This application note describes how fast cycle time is achieved using the impedance analyzer such as the E4991A and 4294A with the Electronic Design Automation (EDA) tools.

Notes d’application 2008-11-13

Exposed Pad Algorithm for the Medalist x6000 AXI System 
This application note describes how to use the exposed pad algorithm in the Medalist x6000 AXI software to test all varieties of QFN and FET package types for defects such as Open and Voiding.

Notes d’application 2008-10-21

PDF PDF 1.83 MB
Building Hybrid Test Systems. Ensuring success in two common development scenarios - Application Not 
Application Note 1465-33. When you migrate to a hybrid system that includes LXI along with GPIB, VXI, PXI, or any other architecture, two scenarios are most typical, minimum development time and maximum overall performance

Notes d’application 2008-10-15

Setting Up HotKeys for AXI products on the Keysight Medalist Repair Tool 
Users of the Keysight Medalist Repair Tool, also known as the Keysight Repair Tool (ART), can setup hot keys to increase the efficiency of image viewing in RT4.0 for their X-ray inspection products.

Notes d’application 2008-09-26

PDF PDF 629 KB
First pass Yield (FPY) and Alarm Triggers on the Keysight Medalist i3070 In-circuit Test System 
This application note will explain some customizations and how to create alarm triggers.

Notes d’application 2008-09-26

PDF PDF 131 KB
Build Operator Menu: Multiple Menu Configuration Control for 5DX Auto User Interface 
The "Build Operator Menu" software replaces and extends the functionality found in the BLDOPMNU DOS command. This application note provides useful user information about this menu.

Notes d’application 2008-09-04

PDF PDF 849 KB
Fundamentals of RF and Microwave Power Measurements (Part 4) (AN 1449-4) 
An Overview of Keysight Instrumentation for RF/Microwave Power Measurements AN 1449-4, literature number 5988-9216EN

Notes d’application 2008-09-01

Adjusting the X-ray Surface Map parameters on the Medalist 5DX Automated X-ray System 
Tips on obtaining the best images using the 5DX surface map parameters.

Notes d’application 2008-08-27

 
Quad Flat No Lead (QFN) Best Practices 
The purpose of this application note and best practices guide is to describer the QFN-type component and provide testing methods to ensure robust testing on the Medalist 5DX Automated X-ray Inspection (AXI) System.

Notes d’application 2008-08-26

PDF PDF 492 KB
Merging Windowed Deposits in CamCad on Keysight’s Automated Optical Inspection (AOI) Systems 
In many stencil designs, windowed deposits are used to apply paste to a large pad. This document provides some tips for dealing with this.

Notes d’application 2008-07-23

PDF PDF 352 KB

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