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电子测试测量基础

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Migrating from the 34401A RS-232 Serial Interface to the Truevolt DMM 34461A USB/LAN Interface 
This guide explains how to migrate existing 34401A programs developed for the RS-232 interface for use with the 34461A USB and LAN interfaces.

技术总览 2016-03-18

PDF PDF 166 KB
使用 Medalist VTEP v2.0-VTEP、iVTEP 和 NPM 使测试范围最大化 
使用 Medalist VTEP v2.0-VTEP、iVTEP 和 NPM 使测试范围最大化

应用说明 2015-12-22

“Shotgunning”, a Bad Fit for Lead-Free Test 
Shotgunning, a common repair technique in functional test, will be negatively affected by lead-free processes. This article explores the technique and draws broad conclusions regarding the impact of lead-free on electronics manufacturing test

应用说明 2015-07-14

PDF PDF 99 KB
Peak Power Solutions Brochure for Radar and Wireless Applications - Brochure  
This peak power solutions brochure cover various radar & wireless applications. Get a summary of applications in this brochure and learn where to download the application note and videos accordingly.

手册 2015-04-30

PDF PDF 3.78 MB
《了解矢量网络分析的基本原理》应用指南 1287-1 
本应用指南说明了矢量网络分析的基本原理。文中还讨论了常用的参数(S 参数),并回顾了传输线路和史密斯圆图等射频基础知识。

应用说明 2014-02-14

射频和微波功率测量的基本原理(AN 1449) 
是德射频和微波功率测量的基本原理,应用指南(AN 1449-1/2/3/4)。

应用说明 2012-07-03

 
8 Hints for Making Better Measurements Using RF Signal Generators Application Note 
This application provides 8 hints for improving the accuracy of your measurements using RF signal generators.

应用说明 2012-06-27

PDF PDF 1.35 MB
Making Accurate Intermodulation Distortion Measurements with the PNA-X (1408-17) – Application Note 
This application note describes accuracy considerations when using the Keysight PNA-X microwave network analyzer for two-tone intermodulation distortion measurements.

应用说明 2012-03-05

是德成功测量阻抗的 8 点提示 应用指南 346-4 
是德成功测量阻抗的 8 点提示 应用指南 346-4。测量阻抗有几种不同的技术和方法,应该根据测量的频率范围、要测量的阻抗参数以及想要显示的测量结果来选择一个具体的测试技术。

应用说明 2011-12-31

射频和微波功率测量的基本原理(第 3 部分)(AN 1449-3) 
Power Measurement Uncertainty per International Guides AN 1449-3, literature number 5988-9215EN

应用说明 2011-04-05

Specifying Calibration Standards and Kits for Keysight Vector Network Analyzers (AN 1287-11) 
This paper discusses calibration standard definitions, calibration kit content, and its structure requirements for Keysight's vector network analyzers. Also provided are set up examples and how to modify an existing calibration kit definition file.

应用说明 2011-03-28

Fundamentals of RF and Microwave Noise Figure Measurements - Application Note 
This 32-page, black-and-white application note providesinformation on RF and Microwave noise figure measurementts. Topics include noise figure and temperature, noise characteristics of two-port networks, and the measurement of noise figure.

应用说明 2010-08-05

Improved Throughput in Network Analyzer Applications (AN 1287-5) 
This Application Note explores a variety of throughput issues and how they might affect different applications. It suggests ways to improve network analyzer performance for better throughput in specific situations, and how to get an accurate picture of how an analyzer's performance might impact...

应用说明 2010-03-15

PNA - Banded Millimeter-Wave Measurements (AN 1408-15) 
Contains banded millimeter-wave system configurations, system operation, system calibration, and typical measurement examples.

应用说明 2009-11-24

Diagnostic Testing and the Medalist 5DX Automated X-ray Inspection System 
Users of the Medalist 5DX automated x-ray inspection system can benefit from running diagnostic tests on a regular basis. This application note provides some guidelines.

应用说明 2009-01-14

PDF PDF 188 KB
IEEE 1149.6 Standard Boundary Scan Testing on Keysight Medalist i3070 ICT Systems 
This paper introduces the latest advancements in Boundary Scan test capabilities on the Keysight Medalist i3070 In-Circuit Test platform that supports the testing of IEEE 1149.6-compliant devices.

应用说明 2008-11-24

PDF PDF 297 KB
提高 PLL 设计效率--从自动运行的 VCO 表征到闭环 PLL 测量 
This application note describes introduces practical solutions for VCO/PLL performance evaluation and gives actual examples of parameter measurements using the E5052B.

应用说明 2008-11-24

Keysight Medalist i3070测试程序最优化 

应用说明 2008-11-01

Exposed Pad Algorithm for the Medalist x6000 AXI System 
This application note describes how to use the exposed pad algorithm in the Medalist x6000 AXI software to test all varieties of QFN and FET package types for defects such as Open and Voiding.

应用说明 2008-10-21

PDF PDF 1.83 MB
构建混合测试系统,确保在两个公共开发情景中取得成功 

应用说明 2008-10-15

Setting Up HotKeys for AXI products on the Keysight Medalist Repair Tool 
Users of the Keysight Medalist Repair Tool, also known as the Keysight Repair Tool (ART), can setup hot keys to increase the efficiency of image viewing in RT4.0 for their X-ray inspection products.

应用说明 2008-09-26

PDF PDF 629 KB
First pass Yield (FPY) and Alarm Triggers on the Keysight Medalist i3070 In-circuit Test System 
This application note will explain some customizations and how to create alarm triggers.

应用说明 2008-09-26

PDF PDF 131 KB
Build Operator Menu: Multiple Menu Configuration Control for 5DX Auto User Interface 
The "Build Operator Menu" software replaces and extends the functionality found in the BLDOPMNU DOS command. This application note provides useful user information about this menu.

应用说明 2008-09-04

PDF PDF 849 KB
射频和微波功率测量的基本原理(第 4 部分)(AN 1449-4) 
An Overview of Keysight Instrumentation for RF/Microwave Power Measurements AN 1449-4, literature number 5988-9216EN

应用说明 2008-09-01

Adjusting the X-ray Surface Map parameters on the Medalist 5DX Automated X-ray System 
Tips on obtaining the best images using the 5DX surface map parameters.

应用说明 2008-08-27

 

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