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Fundamentals of Electronic Test & Measurement

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Exploring the Architectures of Network Analyzers (1287-2) – Application Note 
This Application Note explains that Network analyzers have become one of the most important tools for characterizing the performance of high-frequency components and devices.

Application Note 2000-12-06

The Why, Where, What, How, and When of X-ray Test 
How do the different AXI technologies work? What are the appropriate uses of 2D vs 3D X-ray? Where in the mfg process should AXI be placed? How can AXI be used to improve the mfg process?

Application Note 2000-11-01

PDF PDF 1.30 MB
Maximizing Accuracy in Noise Figure Measurements (PN 85719A-1) 
This Product Note discusses factors that affect accuracy with the 85719A Noise Figure Measurement System. Statistically generated curves of noise figure measurements uncertainly are also included.

Application Note 2000-10-01

PDF PDF 661 KB
Techniques for Programming the 892X Family of Instruments (PN 892X) 
This Product Note describes some key programming techniques for the Keysight 892X family of products. This Note can be used as a training tool for users that are new to programming test equipment, or it can be used by experienced programmers that need to know about unique programming required for...

Application Note 2000-09-01

PDF PDF 186 KB
Optical Spectrum Analysis Basics (AN 1550-4) 
This Application Note is intended to provide the reader with a basic understanding of optical spectrum analyzers, their technologies, specifications, and applications. Chapter 1 describes interferometer-based and diffraction- grating-based optical spectrum analyzers. Chapter 2 defines many of the...

Application Note 2000-09-01

Network Analysis - Filter And Amplifier Measurement Examples (AN 1287-4) 
The network analyzer is used for a variety of device and component characterization tasks in both laboratory and production environments.

Application Note 2000-08-01

Simplified Filter Tuning Using Time Domain (AN 1287-8) 
This Application Note describes a method of tuning a filter using the time-domain response of its return loss, which makes filter tuning vastly easier.

Application Note 2000-07-01

8 Hints For Successful Impedance Measurement (AN 346-4) 
Selection criteria, device characteristics, fixturing and error correction etc.

Application Note 2000-06-01

Fundamentals of Signal Analysis (AN 243) 
This Application Note is a primer for those who are unfamiliar with the advantages of analysis in the frequency and modal domains and with the class of analyzers we call dynamic signal analyzers. It explains the time, frequency and modal domains and provides an overview of the major functions and...

Application Note 2000-06-01

Fundamentals of Modal Testing (AN 243-3) 
This modal test 56 page Application Note provides an verview of structural dynamics theory, the measurement process for acquiring frequency response data, parameter estimation (curve fitting), and the analytical techniques of structural analysis and their relation to experimental testing (such...

Application Note 2000-05-01

Comparing the Accuracy and Repeatability of On-Wafer CalibrationTechniques to 110 GHz 
by Cascade Microtech

Application Note 2000-03-16

PDF PDF 177 KB
Improving Network Analyzer Measurements of Frequency-translating Devices (1287-7) – Application Note 
This Application Note explores current test equipment solutions and techniques that can be used to accurately characterize and test frequency-translating devices.

Application Note 2000-03-01

Keysight TestJet Technology White Paper 
This paper describes the Keysight TestJet technique, which makes use of a property of most digital ICs in use in the mid-1990s: the lead frame.

Application Note 2000-01-01

 
8 More Hints for Making Better Scopes Measurements 
This Application Note contains a variety of hints to help you understand and improve your use of oscilloscopes. It includes the following 8 hints: 1. Don't forget to check that probe 2. A quick, easy way to troubleshoot mixed hardware/software prototypes 3. Using scopes to measure noisy signals 4...

Application Note 1999-12-01

PDF PDF 840 KB
Test Strategy for Complex Printed Circuit Board Assemblies 
This paper proposes a new test strategy for complex boards since the trend in Printed Circuit Board Assembly (PCBA) technology is towards higher complexity.

Application Note 1999-02-22

PDF PDF 195 KB
8 Hints for Debugging Siemens MCU-based Designs 
A new type of instrument, the mixed signal oscilloscope (MSO), closes the gap in MCU debugging tools. The Keysight 54645D from Hewlett-Packard combines two analog scope channels with 16 digital logic channels, so you can monitor analog and digital lines at the same time. This MSO offers more...

Application Note 1998-11-01

PDF PDF 736 KB
4 Hints for Making Better Microwave Counter Measurements 
This Product Note provides four pertinent hints for making better microwave counter measurements, describes the advantages of using a microwave counter, and deals with the unique measurement problems created by the advancement in counter technology.

Application Note 1998-09-01

Fundamentals of RF and Microwave Power Measurements (AN 64-1A) 
This Application Note is for information only. Keysight no longer sells or supports these products.

Application Note 1998-06-01

PDF PDF 720 KB
Boundary-Scan Technology, Justification, and Test Implementation for Designers 
This paper provides practical insight for designers on the merits, design, and test implementation of Boundary-Scan Technology.

Application Note 1998-05-27

PDF PDF 29 KB
Effects of Lead Free Solders on Imaging Characteristics of the Keysight 5DX Laminographic X-ray Test  
The electronics industry is under pressure to migrate solder processes away from the usage of eutectic tin-lead solder and towards utilization of lead-free compounds.

Application Note 1998-05-01

PDF PDF 83 KB
Boundary Scan Ground Bounce Suppression 
Boundary-Scan circuitry, while in the process of testing interconnections, can set up and excite current surges on a board. This in turn can cause "ground bounce".

Application Note 1998-04-24

PDF PDF 14 KB
Fundamentals of Microwave Frequency Counters (AN 200-1) 
This somewhat lengthy, classic Application Note addresses the microwave counter designer's need for down-conversion techniques. It describes and compares techniques and outlines additional considerations in choosing a microwave counter. Includes some applications of the Keysight 5342A.

Application Note 1997-05-01

PDF PDF 219 KB
Fundamentals of Quartz Oscillators (AN 200-2) 
The purpose of this classic Application Note is to provide a background on the crystal reference element and its impact in an oscillator circuit. It then explains the effects of the oscillator on the accuracy of a frequency measurement and frequency generation.

Application Note 1997-05-01

Spectrum Analysis Basics: From 1997 Back to Basics Seminar 
This paper covers everything from a definition of spectrum to the types of instruments used to make the measurements. Topics include resolution, amplitude measurements sensitivity, dynamic range, LO stability, and the use of spectrum analyzers....

Application Note 1997-04-01

PDF PDF 3.16 MB
Cellular Call Processing: Programming Techniques for the 8920A 
This Application Note specifically describes the programming format for AMPS cellular, however the techniques are similar for systems like NAMPS and TACS. The programming techniques used for the 8920A firmware have built-in cellular call processing functions.

Application Note 1995-10-01

PDF PDF 582 KB

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