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Spectrum Analysis Basics - Application Note 
This application note (also known as AN 150) explains the fundamentals of swept-tuned, superheterodyne spectrum analyzers and discusses the latest advances in spectrum analyzer capabilities.

應用手冊 2016-04-15

Migrating from the 34401A RS-232 Serial Interface to the Truevolt DMM 34461A USB/LAN Interface 
This guide explains how to migrate existing 34401A programs developed for the RS-232 interface for use with the 34461A USB and LAN interfaces.

技術總覽 2016-03-18

PDF PDF 166 KB
“Shotgunning”, a Bad Fit for Lead-Free Test 
Shotgunning, a common repair technique in functional test, will be negatively affected by lead-free processes. This article explores the technique and draws broad conclusions regarding the impact of lead-free on electronics manufacturing test

應用手冊 2015-07-14

PDF PDF 99 KB
認識向量網路分析的基本原理 - 應用說明 
本應用說明將回顧向量網路分析的基本原理,討論的內容包括可量測的通用參數,並解釋散射參數(S 參數)的概念。本文並探討一些射頻基本知識,如傳輸線和史密斯圖(Smith Chart)。

應用手冊 2015-06-09

Peak Power Solutions Brochure for Radar and Wireless Applications - Brochure  
This peak power solutions brochure cover various radar & wireless applications. Get a summary of applications in this brochure and learn where to download the application note and videos accordingly.

型錄 2015-04-30

PDF PDF 3.78 MB
Fundamentals of RF and Microwave Power Measurements (Part 3) (AN 1449-3) 
Power Measurement Uncertainty per International Guides AN 1449-3, literature number 5988-9215EN

應用手冊 2014-08-01

8 Hints for Making Better Measurements Using Analog RF Signal Generators - Application Note 
This guide helps you improve the accuracy of your measurements that involve using RF analog signal sources.

應用手冊 2014-07-31

8 Hints for Making Better Measurements Using RF Signal Generators Application Note 
This application provides 8 hints for improving the accuracy of your measurements using RF signal generators.

應用手冊 2012-06-27

PDF PDF 1.35 MB
Making Accurate Intermodulation Distortion Measurements with the PNA-X (1408-17) – Application Note 
This application note describes accuracy considerations when using the Keysight PNA-X microwave network analyzer for two-tone intermodulation distortion measurements.

應用手冊 2012-03-05

Specifying Calibration Standards and Kits for Keysight Vector Network Analyzers (AN 1287-11) 
This paper discusses calibration standard definitions, calibration kit content, and its structure requirements for Keysight's vector network analyzers. Also provided are set up examples and how to modify an existing calibration kit definition file.

應用手冊 2011-03-28

Fundamentals of RF and Microwave Noise Figure Measurements - Application Note 
This 32-page, black-and-white application note providesinformation on RF and Microwave noise figure measurementts. Topics include noise figure and temperature, noise characteristics of two-port networks, and the measurement of noise figure.

應用手冊 2010-08-05

Improved Throughput in Network Analyzer Applications (AN 1287-5) 
This Application Note explores a variety of throughput issues and how they might affect different applications. It suggests ways to improve network analyzer performance for better throughput in specific situations, and how to get an accurate picture of how an analyzer's performance might impact...

應用手冊 2010-03-15

PNA - Banded Millimeter-Wave Measurements (AN 1408-15) 
Contains banded millimeter-wave system configurations, system operation, system calibration, and typical measurement examples.

應用手冊 2009-11-24

8 Hints for Making Better Spectrum Analyzer Measurements (AN 1286-1) - Application Note 
This application note provides eight pertinent hints for making better spectrum analyzer measurements such as measuring low level signals and indentifying internal distortion products.

應用手冊 2009-09-07

Fundamentals of RF and Microwave Power Measurements (AN 1449) - Application Note 
Keysight's Fundamentals of RF and Microwave Power Measurements, application note (AN 1449-1/2/3/4).

應用手冊 2009-06-05

 
Diagnostic Testing and the Medalist 5DX Automated X-ray Inspection System 
Users of the Medalist 5DX automated x-ray inspection system can benefit from running diagnostic tests on a regular basis. This application note provides some guidelines.

應用手冊 2009-01-14

PDF PDF 188 KB
IEEE 1149.6 Standard Boundary Scan Testing on Keysight Medalist i3070 ICT Systems 
This paper introduces the latest advancements in Boundary Scan test capabilities on the Keysight Medalist i3070 In-Circuit Test platform that supports the testing of IEEE 1149.6-compliant devices.

應用手冊 2008-11-24

PDF PDF 297 KB
Medalist i3070 Test Throughput Optimization 
This application note explores some factors which cause test time to increase on the Medalist i3070 In-Circuit Test system, and methods which users can employ to reduce the test time and increase throughput on the Medalist i3070 ICT system.

應用手冊 2008-11-24

Boosting PLL Design Efficiency From free-running VCO characterizations to closed-loop PLL evaluation 
This application note describes introduces practical solutions for VCO/PLL performance evaluation and gives actual examples of parameter measurements using the E5052B.

應用手冊 2008-11-21

Exposed Pad Algorithm for the Medalist x6000 AXI System 
This application note describes how to use the exposed pad algorithm in the Medalist x6000 AXI software to test all varieties of QFN and FET package types for defects such as Open and Voiding.

應用手冊 2008-10-21

PDF PDF 1.83 MB
Building Hybrid Test Systems. Ensuring success in two common development scenarios - Application Not 
Application Note 1465-33. When you migrate to a hybrid system that includes LXI along with GPIB, VXI, PXI, or any other architecture, two scenarios are most typical, minimum development time and maximum overall performance

應用手冊 2008-10-15

Setting Up HotKeys for AXI products on the Keysight Medalist Repair Tool 
Users of the Keysight Medalist Repair Tool, also known as the Keysight Repair Tool (ART), can setup hot keys to increase the efficiency of image viewing in RT4.0 for their X-ray inspection products.

應用手冊 2008-09-26

PDF PDF 629 KB
First pass Yield (FPY) and Alarm Triggers on the Keysight Medalist i3070 In-circuit Test System 
This application note will explain some customizations and how to create alarm triggers.

應用手冊 2008-09-26

PDF PDF 131 KB
Build Operator Menu: Multiple Menu Configuration Control for 5DX Auto User Interface 
The "Build Operator Menu" software replaces and extends the functionality found in the BLDOPMNU DOS command. This application note provides useful user information about this menu.

應用手冊 2008-09-04

PDF PDF 849 KB
Fundamentals of RF and Microwave Power Measurements (Part 4) (AN 1449-4) 
An Overview of Keysight Instrumentation for RF/Microwave Power Measurements AN 1449-4, literature number 5988-9216EN

應用手冊 2008-09-01

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