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Keysight offers simulation and test capability for all of your filter design and test needs.

You can design, synthesize, and optimize filters for use from baseband to microwave frequencies with a full lineup of filter synthesis, simulation and optimization tools. These tools have been integrated into Keysight's leading EDA software including Advanced Design System (ADS) and Genesys Filter Synthesis tools.

After designing your filter and building a prototype, you can utilize Keysight test equipment to verify your designs. Keysight products include Network Analyzers, Spectrum Analyzers, Signal Sources, Oscilloscopes and more, all for your filter test requirements.

  • Advanced Design System (ADS) 

    Advanced Design System (ADS)

    The industry’s leading RF, microwave & high speed digital electronic design automation software for wireless communications & networking, aerospace & defense, and signal integrity applications.

  • no image available RF & Microwave Test Accessories 
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    RF & Microwave Test Accessories

    Keysight provides a wide range of test accessories to meet your specific application. Learn about the latest new products and support information for switches, attenuators, amplifiers, detectors and many more.

  • ENA Series Network Analyzers, 5 Hz to 20 GHz 

    ENA Series Network Analyzers, 5 Hz to 20 GHz

    The standard ENA expands network analysis with advanced features for multiport and balanced measurements, while the lower cost ENA-L analyzers provide basic S-parameters with an integrated 50 or 75-ohm test set.

  • no image available Network Analyzers 
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    Network Analyzers

    Keysight's network analyzer family includes performance & economy RF & microwave network analyzers, vector network analyzers and network analyzer systems.

  • PNA Network Analyzers, 300 kHz to 1.1 THz 

    PNA Network Analyzers, 300 kHz to 1.1 THz

    PNA-L is a general-purpose network analyzer, PNA is the highest performing suitable for passive and active device test, and PNA-X is Keysight's most advanced and flexible enabling linear and nonlinear device characterization in a single instrument.