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Premier Si/III-V Device Modeling and Characterization Solutions

Keysight provides premier solutions for characterization and modeling of cutting-edge CMOS and compound semiconductor devices. Keysight is the only vendor that provides complete end-to-end modeling solutions, from automated measurements, accurate device model extraction, comprehensive qualification to final process design kit (PDK) validation. Comprehensive modeling services are offered, supported by Keysight’s expert engineers and advanced labs. Some of our key device modeling and characterization EDA software solutions include:

  • IC-CAP: A versatile and user programmable industry standard for semiconductor device modeling
  • IC-CAP WaferPro: Fast and accurate automated measurement software
  • WaferPro Express: Efficient, flexible and powerful wafer-level measurement software
  • Model Builder Program (MBP): Complete Silicon turnkey device modeling software
  • Model Quality Assurance (MQA): Industry standard SPICE model signoff and acceptance software

Device modeling and characterization challenges

  • As device geometries get smaller, the need to use accurate models and to control statistical variations in device processing performance becomes ever more important
  • Circuit designers need models that can accurately predict DC behaviors, as well as RF and noise behaviors
  • Different process technologies require a variety of models that can be quickly adapted to the unique processes
  • With modeling measurements taking hours or even days, measurement control software must also work with probers and instruments to allow automated measurements across temperature

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Keysight EEsof EDA Newsletter - Product and Application News 
Keep tabs on the latest product and application news and review the archives of the Keysight EEsof EDA Newsletter.

Newsletter 2014-08-11

 
Wafer-level Measurement Solutions – Cascade Microtech 
Accurate and Repeatable Wafer-level Measurements from Cascade Microtech and Keysight.

Solution Brief 2014-08-04

 
RF and Microwave Industry-Ready Student Certification Program 
This program confirms a student’s technical knowledge, design expertise, and hands-on measurement proficiency in the use of Keysight EEsof EDA software design tools and Keysight instruments.

Brochure 2014-08-03

PDF PDF 576 KB
Model Quality Assurance (MQA) 
MQA provides the complete solution and framework to fabless design companies, IDMs, and foundries for SPICE model library validation, comparison, and documentation.

Brochure 2014-06-18

PDF PDF 1.08 MB
Model Builder Program (MBP) 
MBP is a one-stop solution that provides both automation and flexibility for silicon device modeling.

Brochure 2014-06-18

PDF PDF 1.47 MB
Advanced Modeling Solutions for Nanoscale 3D FinFETs and High-Frequency/High-Power GaN HEMTs 
Agilent announces several innovations for the 2014 release of its industry-leading suite of device modeling and characterization software tools. The suite is comprised of IC-CAP, MBP, and MQA.

Press Materials 2014-06-18

 
Agilent Technologies and Cascade Microtech Announce Alliance to Streamline Wafer-Level Measurements 
Agilent Technologies and Cascade Microtech announce a strategic alliance to provide fully configured and validated RF measurement solutions that streamline wafer-level semiconductor measurements while delivering guaranteed configuration, installation and support.

Press Materials 2014-06-03

 
WaferPro Express 
WaferPro Express software is an efficient and powerful automated measurement test platform for wafer-level characterization.

Brochure 2014-05-20

PDF PDF 2.44 MB
X-Parameter Design Simulation Models - Modelithics 
X-Parameter Design Simulation Models from Modelithics and Keysight.

Solution Brief 2014-04-30

 
Pulsed Measurement of Active Device IV Characteristics and S-Parameters - Maury Microwave 
Pulsed Measurement of Active Device IV Characteristics and S-Parameters from Maury Microwave and Keysight

Solution Brief 2014-04-02

 
Pulsed Measurement of IV Characteristics and RF Parameters – Auriga Microwave 
Pulsed Measurement of IV Characteristics and RF Parameters from Auriga Microwave and Keysight

Solution Brief 2014-04-01

 
Agilent Technologies Announces Next-Generation System for Measuring Flicker Noise 
Agilent introduces the Agilent EEsof EDA E4727A Advanced Low-Frequency Noise Analyzer—a next-generation hardware and software system for measurement and analysis of flicker noise and random telegraph noise (RTN).

Press Materials 2014-03-13

 
Agilent Technologies Simulation and Modeling Software Selected by Nitronex for High-Power GaN Design 
Agilent announces that Nitronex, a GaAs labs company and leading producer of GaN-on-silicon RF power devices, has selected Agilent to provide a complete GaN design flow that spans both device modeling and circuit simulation.

Press Materials 2014-02-11

 
MBP and MQA Adopted by Microchip Technology for PDK Creation, Modification, Validation 
Agilent Technologies announces that Microchip Technology Inc., a leading provider of microcontroller, mixed-signal, analog and Flash-IP solutions, has adopted Agilent EEsof EDA's Model Builder Program and Model Quality Assurance software. Microchip Technology will use the software to create internal fabrication device model libraries or process design kits, modify external foundry libraries, and validate supported devices from internal and external sources.

Press Materials 2013-12-09

 
EDA Support Services 
Keysight Support Services for EDA Products offers customers several benefits otherwise not available. This service is designed to help you get the most out of your software purchases.

Brochure 2013-11-09

PDF PDF 128 KB
Keysight EEsof EDA Premier Communications Design Software 
The Keysight EEsof EDA catalog provides an excellent overview of all of Keysight's Electronic Design Automation (EDA) tools.

Catalog 2013-10-07

PDF PDF 8.61 MB
Keysight EEsof EDA Product Overview 
Keysight EEsof EDA premier communications design software product overview brochure.

Brochure 2013-09-30

PDF PDF 1.68 MB
Keysight EEsof EDA Software and Modular Solutions for Universities 
Keysight works in collaboration with universities to provide tools that enable education and research for the engineers of tomorrow. The brochure outlines available programs, software and hardware.

Brochure 2013-08-16

PDF PDF 3.80 MB
Agilent's MBP and MQA Software Adopted by Shanghai Consortia for Advanced Device Modeling 
Agilent announces that the Shanghai Integrated Circuit Research and Development Center, a nonprofit research consortia dedicated to advancing the microelectronics industry in China, is using Agilent's Model Builder Program and Model Quality Assurance software for model extraction and verification at 45-nm process nodes.

Press Materials 2013-07-09

 
Agilent Technologies Introduces Industry’s First Solution for Modeling Power Devices 
Agilent announces that IC-CAP has been enhanced to provide full support for the B1505A Power Device Analyzer/Curve Tracer, including the instrument’s new high-power, high-current source monitor unit modules.

Press Materials 2013-06-24

 
Keysight EEsof EDA Customer Support Brochure 
Whether you are a novice or an experienced user, Keysight EEsof EDA’s customer support offerings are designed to help you every step of the way.

Brochure 2013-05-28

PDF PDF 681 KB
Agilent Ships Newest SPICE Model Extraction and Qualification Software 
Agilent announces shipment of the latest release of its industry-leading SPICE model extraction tool, Model Builder Program, and SPICE qualification tool, Model Quality Assurance.

Press Materials 2013-03-13

 
Agilent Technologies Launches Recognition Program for EDA Experts 
Agilent launches its Agilent Certified Expert recognition program for EDA experts. Eligible participants include individuals demonstrating a high level of expertise-both theoretical and practical-in applying Agilent EEsof EDA tools for product design and modeling.

Press Materials 2013-03-12

 
Agilent embraces GaN modeling in IC-CAP upgrade 
EETimes Design Article highlights new capabilities in IC-CAP 2013.01.

Article 2013-01-09

 
IC-CAP Device Modeling Software 
Technical overview of Keysight's Integrated Circuit Characterization and Analysis Program (IC-CAP), complete and accurate parameter extraction for semiconductor device modeling

Technical Overview 2012-12-20

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