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Premier Si/III-V Device Modeling and Characterization Solutions

Keysight provides premier solutions for characterization and modeling of cutting-edge CMOS and compound semiconductor devices. Keysight is the only vendor that provides complete end-to-end modeling solutions, from automated measurements, accurate device model extraction, comprehensive qualification to final process design kit (PDK) validation. Comprehensive modeling services are offered, supported by Keysight’s expert engineers and advanced labs. Some of our key device modeling and characterization EDA software solutions include:

  • IC-CAP: A versatile and user programmable industry standard for semiconductor device modeling
  • IC-CAP WaferPro: Fast and accurate automated measurement software
  • WaferPro Express: Efficient, flexible and powerful wafer-level measurement software
  • Model Builder Program (MBP): Complete Silicon turnkey device modeling software
  • Model Quality Assurance (MQA): Industry standard SPICE model signoff and acceptance software

Device modeling and characterization challenges

  • As device geometries get smaller, the need to use accurate models and to control statistical variations in device processing performance becomes ever more important
  • Circuit designers need models that can accurately predict DC behaviors, as well as RF and noise behaviors
  • Different process technologies require a variety of models that can be quickly adapted to the unique processes
  • With modeling measurements taking hours or even days, measurement control software must also work with probers and instruments to allow automated measurements across temperature

Explorer les vidéos YouTube 

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Tri:
The Battery Show North America 2016 
Novi, MI; Sept 13 - Sept 15, 2016

Salon professionnel

 
IEEE Energy Conversion Congress & Exposition (ECCE) 2016 
Milwaukee, WI; Sept 19 - Sept 20, 2016

Salon professionnel

 
Accuracy matters: Calibration Options for Lab Standards Webcast 
Original broadcast May 19, 2016

Webcast

 
Automating On-Wafer Measurements with the new Agilent IC-CAP WaferPro 
Originally broadcast Jan 27, 2011

Webcast - enregistré

 
Setting Up IC-CAP WaferPro For On-Wafer Measurements 
Original broadcast June 22, 2011

Webcast - enregistré

 
Fundamentals of Fast Pulsed IV Measurement Webcast 
Original broadcast January 9, 2014

Webcast - enregistré