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Premier Si/III-V Device Modeling and Characterization Solutions

Keysight provides premier solutions for characterization and modeling of cutting-edge CMOS and compound semiconductor devices. Keysight is the only vendor that provides complete end-to-end modeling solutions, from automated measurements, accurate device model extraction, comprehensive qualification to final process design kit (PDK) validation. Comprehensive modeling services are offered, supported by Keysight’s expert engineers and advanced labs. Some of our key device modeling and characterization EDA software solutions include:

  • IC-CAP: A versatile and user programmable industry standard for semiconductor device modeling
  • IC-CAP WaferPro: Fast and accurate automated measurement software
  • WaferPro Express: Efficient, flexible and powerful wafer-level measurement software
  • Model Builder Program (MBP): Complete Silicon turnkey device modeling software
  • Model Quality Assurance (MQA): Industry standard SPICE model signoff and acceptance software

Device modeling and characterization challenges

  • As device geometries get smaller, the need to use accurate models and to control statistical variations in device processing performance becomes ever more important
  • Circuit designers need models that can accurately predict DC behaviors, as well as RF and noise behaviors
  • Different process technologies require a variety of models that can be quickly adapted to the unique processes
  • With modeling measurements taking hours or even days, measurement control software must also work with probers and instruments to allow automated measurements across temperature

Explore YouTube Videos 

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Evénements Keysight en France 
Bienvenue sur la page des événements auxquels participe Keysight en France


Automating On-Wafer Measurements with the new Agilent IC-CAP WaferPro 
Originally broadcast Jan 27, 2011

Webcast - recorded

Automating SPICE Library Validation 
Recorded webcast and slide set for a Model Quality Assurance (MQA) webcast held on October 22, 2013.

Seminar Materials 2013-10-22

DesignCon 2014 
Jan 28-31, 2014; Santa Clara Convention Center Download papers presented, order the AEF DVD


DesignCon 2015 
Download Keysight's papers from Technical Conference; Jan 27-29, 2015; Santa Clara Convention Center


DynaFET: Advanced model for GaN/GaAs HEMTs from NVNA measurements and ANNs Webcast 
Original broadcast September 4, 2014

Webcast - recorded

Electronic Measurement Events in Europe, Middle East & Africa 
Electronic Measurement events in Europe, the Middle East, and Africa - seminars, trade shows, user group meetings, webcasts, tutorials and conferences.


Genesys Webcasts - "How-To-Design" series  
Originally broadcast in 2009. Access the 6 WebEX recordings

Webcast - recorded

IC-CAP User Training 
This 3-day course will show device modelers how to use Keysight EEsof EDA's IC-CAP software. Click on link to view full course description and class dates and locations.

Classroom Training

Innovations in EDA: Accurate Modeling of GaAs & GaN HEMT’s for Nonlinear Applications Webcast 
Original broadcast May 7, 2013

Webcast - recorded

International Microwave Symposium (IMS) 2015 
May 17-22, 2015; Phoenix, AZ


Keysight EEsof EDA Customer Education and Services 
Brief overview of Keysight EEsof EDA Customer Education and Services.

Training Materials 2010-08-11

Keysight's events in Benelux 
Welcome to Keysight's Upcoming Events Page for Benelux


Measurement Based FET Modeling using Artifical Neural Networks (ANN) 
This presentation was given by Jianjun Xu with introduction by David Root as part of the Innovations in EDA Webcast Series.

Seminar Materials 2012-02-07

MQA: Automating Library Validation 
MQA is the industry standard qualification platform that assists modeling experts and model users to perform comprehensive model qualification with an knowledge-based, rules-driven approach.

Seminar Materials 2013-10-22

Power Conversion Efficiency Measurement Methods Webcast 
Live broadcast November 4, 2015; 10am PT / 1pm ET


Setting up IC-CAP WaferPro for On-Wafer Measurements 
IC-CAP WaferProIs is an extremely powerful test plan suite, for on-Wafer DC/CV and RF device modeling measurements.

Seminar Materials 2011-06-22

Setting Up IC-CAP WaferPro For On-Wafer Measurements 
Original broadcast June 22, 2011

Webcast - recorded