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聯絡是德專家

元件建模與特性分析

是德提供完整的硬體和軟體解決方案,可用於半導體元件特性分析與建模。 現在大多數半導體大廠和整合式元件製造商 (IDM) 都採用是德工具來建構元件建模解決方案,以便針對晶片 CMOS、Bipolar、混合砷化鎵 (GaAs)、氮化鎵 (GaN) 和許多其他元件技術進行測試。 準確的元件特性分析、精確先進的模型、有效的擷取及詳盡的驗證,是建立準確及強大模型庫的關鍵,也是設計成功的重要因素。

元件建模與特性分析挑戰

  • 隨著元件尺寸越來越小,使用準確的模型並控制元件處理效能之統計變數,已變得越來越重要。
  • 電路設計工程師需要能夠直流以及射頻和微波頻率範圍內,準確預測元件行為的模型。
  • 不同的處理技術需要可因應不同處理程序,迅速進行調適的各種模型。
  • 建模量測通常耗時數小時甚至幾天的時間,量測控制軟體也必須與探測器和儀器協同運作,以便在不同溫度條件下執行自動量測。

觀看YouTube影片 

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How to Model RF Passive Devices: Spiral Inductors 
This video explains and demonstrates a method to develop accurate Spice models based on verified S-parameter measurements. The video walks you through the entire modeling flow for two RF spiral inductors using IC-CAP.

使用說明影片 2016-02-11

 
Keysight EEsof EDA Newsletter - Product and Application News 
Keep tabs on the latest product and application news and review the archives of the Keysight EEsof EDA Newsletter.

新聞簡訊 2016-02-01

 
Low-Frequency Noise Measurement System Adopted by China CEPREI Laboratory for Reliability Studies 
Keysight announces that CEPREI Laboratory has successfully adopted the Keysight EEsof EDA E4727A Advanced Low-Frequency Noise Analyzer (A-LFNA) for measurement and analysis of flicker noise (1/f noise) and random telegraph noise (RTN) during its reliability studies of semiconductor devices including MOSFETs, HEMTs and TFTs.

新聞資料 2016-01-25

 
Model Builder Program (MBP) 
MBP is a one-stop solution that provides both automation and flexibility for silicon device modeling.

型錄 2016-01-25

PDF PDF 930 KB
Model Quality Assurance (MQA) 
MQA provides the complete solution and framework to fabless design companies, IDMs, and foundries for SPICE model library validation, comparison, and documentation.

型錄 2016-01-25

PDF PDF 3.13 MB
TS-8989 Automotive Body and Safety Test Reference Solution – Configuration Guide 
This configuration guide contains information to help you configure your body and safety test reference solution with the TS-8989 functional tester, and tailor the system to meet your requirements.

配置設定指南 2016-01-20

PDF PDF 2.55 MB
Leti to collaborate with Keysight Technologies to enable expansion of FD-SOI technology 
CEA-Leti announces it has signed an agreement with Keysight Technologies, a device-modeling software supplier, to adapt Leti’s UTSOI extraction flow methodology within Keysight’s device modeling solutions for high-volume SPICE model generation.

新聞資料 2015-12-08

 
Keysight Selects Fraunhofer EMFT as its First Low-Frequency Noise Reference Center for EMEAI 
Keysight announces that Fraunhofer Research Institution for Microsystems and Solid State Technologies EMFT (Fraunhofer EMFT) is the first low-frequency noise measurements reference center able to demonstrate the Keysight EEsof EDAs E4727A Advanced Low-Frequency Noise Analyzer in Europe, the Middle East, Africa and India (EMEAI).

新聞資料 2015-11-04

 
How to Model RF Passive Devices: Capacitors and Resistors 
This video explains and demonstrates a method to develop accurate Spice models from verified S-parameter measurements. The video walks you through the entire modeling flow for an on-wafer capacitor using IC-CAP.

使用說明影片 2015-10-27

 
Keysight Technologies to Demonstrate Latest Simulation Software Solutions at CSICS 
Keysight announces it will demonstrate its latest RF circuit, system and 3-D electromagnetic design and electro-thermal simulation software solutions at the Compound Semiconductor IC Symposium (CSICS 2015), Sheraton New Orleans, Booth 601, New Orleans, Oct. 11-14.

新聞資料 2015-10-08

 
How to Model a BJT Bipolar Junction Transistor 
This video covers the basics of bipolar junction transistor (BJT) modeling and illustrates an easy step-by-step procedure to extract the model parameters of the popular Gummel-Poon (GP) model. While the GP model was introduced in the early 1970’s, it still enjoys a wide popularity in electronic device modeling and many modeling engineers consider it a classic and an excellent starting point for getting familiar with modeling in general.

使用說明影片 2015-08-28

 
Keysight Technologies' University Educational Support Programs Now in More Than 200 Universities 
Keysight announces that more than 200 universities in North America are now participating in the Keysight EEsof EDA University Educational Support Programs, which provide several thousand students with EDA software licenses.

新聞資料 2015-08-20

 
Keysight EEsof EDA Premier Communications Design Software 
Keysight EEsof EDA premier communications design software product overview brochure.

型錄 2015-08-19

PDF PDF 1.61 MB
Keysight Technologies to Demonstrate Latest EDA Software Solutions at 52nd Annual DAC 
Keysight announces it will demonstrate its latest electronic design automation software for microwave, RF, high-frequency, high-speed digital, RF system, electronic system level, circuit, 3-D electromagnetic, physical design and device-modeling applications at the Design Automation Conference (DAC) 2015, Booth 2020, San Francisco, June 8-10.

新聞資料 2015-06-08

 
Dialog Semiconductor adopts IC-CAP, MBP, MQA, and WaferPro Express software 
Keysight announces that Dialog Semiconductor has adopted the Keysight EEsof EDA IC-CAP, MBP, MQA, and WaferPro Express software to perform foundry technology characterization, model validation, model customization and enhancement.

新聞資料 2015-05-11

 
Drive Down the Cost of Test Using the ENA Series of Network Analyzers - Application Note 
In this application note, we discuss the contributions of Keysight Technologies, Inc.’s ENA Series of Vector Network Analyzers (ENA, hereafter) to drive down the cost of test in production lines.

應用手冊 2015-05-01

PDF PDF 2.46 MB
Keysight Technologies Unveils WaferPro Express 2015 Platform for Wafer-Level Device Characterization 
Keysight announces WaferPro Express 2015, a measurement software platform for the automated characterization of wafer-level devices and circuit components.

新聞資料 2015-04-28

 
Advanced Low-Frequency Noise Analyzer Overview 
This video will provide a brief overview of Keysight E4727A Advanced Low-Frequency Noise Analyzer (ALFNA), the next-generation system for measurement of 1/f noise and random telegraph noise. It will describe ALFNA’s innovative modular design and its technical advantages. It will also touch on wide-range applications and how they are enabled by ALFNA’s industry-leading technical specifications and rich feature set.

產品導覽 2015-04-21

 
Keysight Technologies to Showcase Semiconductor Parametric, Modeling Solutions at IRPS 2015 
Keysight announces it will demonstrate some of its many semiconductor parametric and modeling solutions at the 53rd International Reliability Physics Symposium (IRPS), Hyatt Regency Monterey Resort, Booth 203/205, Monterey, Calif., April 19-23.

新聞資料 2015-04-16

 
Keysight WaferPro Express 
The Keysight WaferPro Express software performs automated wafer-level measurements of semiconductor devices such as transistors and circuit components. It provides turnkey drivers and test routines for a variety of instruments and wafer probers. Its user interface makes it easy to setup and run complex wafer-level test plans, while powerful customization capabilities are enabled by the new Python programming environment.

產品導覽 2015-03-24

 
WaferPro Express Software 
WaferPro Express software is an efficient and powerful automated measurement test platform for wafer-level characterization.

型錄 2015-03-15

PDF PDF 1.49 MB
How to Make Accurate, Automated RF Wafer-level Measurements 
The video introduces automation as a way to increase productivity and efficiency. Keysight WaferPro Express measurement software is used to illustrate the various steps in combination with Cascade Microtech Velox software for prober control and Cascade WinCalXE software for automated calibration.

使用說明影片 2015-01-27

 
How to Extract SRAM Models  
This video shows how to extract SRAM device models efficiently on Keysight's device modeling platform.

使用說明影片 2015-01-14

 
Keysight Donates $120 Mil. Gift of Software, Support and Training to Georgia Institute of Technology 
Keysight announces the largest in-kind software donation in its longstanding relationship with the Georgia Institute of Technology.

新聞資料 2014-12-10

 
Keysight Receives Global Frost & Sullivan Award for Market Leadership in Instrumentation Software 
Keysight Technologies announces that Frost & Sullivan has recognized Keysight with the 2014 Global Frost & Sullivan Award for Market Leadership in Instrumentation Software for excellence in capturing the highest market revenue within its industry. The award is based on Frost & Sullivan's recent analysis of the instrumentation software market.

新聞資料 2014-12-08

 

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