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프리미어 Si/III-V 디바이스 모델링 및 특성 분석 솔루션

키사이트는 첨단 CMOS 및 화합물 반도체 디바이스의 특성 분석과 모델링에 필요한 프리미어 솔루션을 제공합니다. 애질런트는 자동 측정에서부터 정확한 디바이스 모델 추출, 포괄적인 검증과 최종 프로세스 설계 키트(PDK) 검증에 이르기까지, 완전한 종합 모델링 솔루션을 제공합니다. 키사이트의 전문 엔지니어와 첨단 기술 랩(Lab)의 지원을 받는 종합 모델링 서비스가 제공됩니다. 주요 디바이스 모델링 및 특성 분석 EDA 소프트웨어 솔루션의 예는 다음과 같습니다.

  • IC-CAP: 사용자가 프로그래밍할 수 있는 다용도 반도체 디바이스 모델링 업계 표준
  • IC-CAP WaferPro: 빠르고 정확한 자동 측정 소프트웨어
  • MBP(Model Builder Program): 완전한 실리콘 턴키 디바이스 모델링 소프트웨어
  • MQA(Model Quality Assurance): 산업 표준 SPICE 모델 사인오프 및 수락 플랫폼

디바이스 모델링 및 특성 분석의 과제

  • 디바이스 크기가 갈수록 작아지면서 정확한 모델을 사용하여 디바이스 처리 성능의 통계적 편차를 통제해야 할 필요성이 더욱 커짐 
  • 회로 설계자는 DC 동작과 더불어 RF 및 노이즈 동작도 정확하게 예측할 수 있는 모델을 필요로 함 
  • 다양한 처리 기술은 고유한 프로세스에 빠르게 적응할 수 있는 다양한 모델을 필요로 함 
  • 모델링 측정을 위해서는 몇 시간 또는 며칠이 필요하므로 측정 제어 소프트웨어는 다양한 온도 범위에서 프로버, 계측기와도 원활하게 작동해야 함 

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Keysight EEsof EDA Newsletter - Product and Application News 
Keep tabs on the latest product and application news and review the archives of the Keysight EEsof EDA Newsletter.

뉴스레터 2017-04-04

 
Global Device Modeling Services - Brochure 
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브로셔 2017-03-16

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Python Programming integration with IC-CAP 
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기사 2017-03-16

 
WaferPro Express Software 
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브로셔 2017-02-22

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Why Device Modeling Services? 
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기사 2017-02-03

 
N5393F/G PCI Express® 4.0 (Gen4) Software for Infiniium Oscilloscopes - Data Sheet 
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데이터시트 2017-01-25

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Keysight EEsof EDA Premier Communications Design Software 
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브로셔 2017-01-24

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Transconductance Modeling for Low-Power Design 
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저널 2017-01-18

 
Device Modeling 101 - What are Ft and Fmax? 
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저널 2016-12-18

 
Device Modeling 101 - How to Extract Threshold Voltage of MOSFETs 
Threshold voltage (Vth) is one of the most important electrical parameters in MOSFET modeling. Learn how to extract Vth using MBP.

저널 2016-11-17

 
The High-Frequency, High Speed Design Revolution: Why Your Design & Test Flow Will Soon Be Obsolete 
In this keynote from EDI CON USA 2016, Todd Cutler, vice president and general manager of Keysight Design & Test Software, discusses these trends and explains how, when coupled with market pressures, they are driving a revolution in the design and measurement industry.

기본 데모 2016-10-11

 
Unlocking Millimeter Wave Insights 
It is easy to underestimate the challenges at millimeter-wave frequencies, and this amplifies the importance of integrated tools for design, simulation, measurement, and analysis. Learn more about how Keysight is taking the mystique out of millimeter waves and unlocking new insights.

기본 데모 2016-09-30

 
Advanced Low-Frequency Noise Analyzer Overview 
This video will provide a brief overview of Keysight E4727A Advanced Low-Frequency Noise Analyzer (ALFNA), the next-generation system for measurement of 1/f noise and random telegraph noise. It will describe ALFNA’s innovative modular design and its technical advantages. It will also touch on wide-range applications and how they are enabled by ALFNA’s industry-leading technical specifications and rich feature set.

제품 둘러보기 2016-08-29

 
Cascade Microtech Releases 1/f Measurement Solution With Keysight Technologies 
Cascade Microtech announces the release of a comprehensive low-frequency noise measurement solution for device modeling, characterization and reliability testing with MeasureOne solution partner Keysight Technologies.

보도자료 2016-08-04

 
Low Frequency Noise Analyzer Technical Demo 
A more technical dive on the new Advanced Low-Frequency Noise Analyzer with WaferPro Express, which offers the unique ability to measure and model device noise across wafers. This release features a new user interface and tight integration with Keysight's WaferPro Express software, a platform that performs automated wafer-level measurements of semiconductor devices.

기본 데모 2016-07-20

 
Keysight Seamlessly Integrates Low-Frequency Noise Measurements in Wafer Level Solution Platform 
New Advanced Low-Frequency Noise Analyzer Offers Unique Ability to Measure and Model Device Noise Across Wafers.

보도자료 2016-07-19

 
Introducing the 2016 Advanced Low-Frequency Noise Analyzer 
The new Advanced Low-Frequency Noise Analyzer Offers Unique Ability to Measure and Model Device Noise Across Wafers. This release features a new user interface and tight integration with Keysight's WaferPro Express software, a platform that performs automated wafer-level measurements of semiconductor devices.

기본 데모 2016-07-18

 
Follow Keysight EEsof EDA on Twitter! 
Twitter enables you to keep current on news and updates with Keysight EEsof through the exchange of quick, frequent answers to one simple question: What are you doing?

뉴스레터 2016-07-14

 
Low-Frequency Noise Measurements with the E4727A and Their Applications 
This application note covers noise basics (1/f and white), applications of noise measurements and analysis, and how noise measurement challenges are addressed by the E4727A A-LFNA.

어플리케이션 노트 2016-04-28

PDF PDF 2.39 MB
Keysight Announces Strategic Collaboration with San'an-IC to Release PDKs for HBT, pHEMT Processes 
Keysight announces that it has signed a memorandum of understanding (MoU) with Xiamen San'an Integrated Circuit Co. Ltd. (San'an-IC) to collaborate on an advanced process design kits (PDKs) for its HBT and pHEMT processes based on Advanced Design System (ADS) software.

보도자료 2016-04-22

 
How to Accurately Measure and Validate S-Parameters for Transistor Modeling 
This video explains and demonstrates a method to develop accurate Spice models based on verified S-parameter measurements. The video walks you through the entire modeling flow for two RF spiral inductors using IC-CAP.

사용방법 동영상 2016-04-04

 
Enabling Noise Measurements on Magnetic Sensors 
This document describes how to use the Keysight E4727A Advanced Low-Frequency Noise Analyzer to simplify noise measurements on magnetic sensors.

어플리케이션 노트 2016-03-24

Keysight Unveils Latest Release of its Device Modeling and Characterization Software Tool Suite 
Keysight announces the newest release of its industry-leading device modeling and characterization software suite: IC-CAP 2016, MBP 2016, and MQA 2016.

보도자료 2016-02-22

 
How to Model RF Passive Devices: Spiral Inductors 
This video explains and demonstrates a method to develop accurate Spice models based on verified S-parameter measurements. The video walks you through the entire modeling flow for two RF spiral inductors using IC-CAP.

사용방법 동영상 2016-02-11

 
Model Builder Program (MBP) 
MBP is a one-stop solution that provides both automation and flexibility for silicon device modeling.

브로셔 2016-01-25

PDF PDF 930 KB

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