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프리미어 Si/III-V 디바이스 모델링 및 특성 분석 솔루션

키사이트는 첨단 CMOS 및 화합물 반도체 디바이스의 특성 분석과 모델링에 필요한 프리미어 솔루션을 제공합니다. 애질런트는 자동 측정에서부터 정확한 디바이스 모델 추출, 포괄적인 검증과 최종 프로세스 설계 키트(PDK) 검증에 이르기까지, 완전한 종합 모델링 솔루션을 제공합니다. 키사이트의 전문 엔지니어와 첨단 기술 랩(Lab)의 지원을 받는 종합 모델링 서비스가 제공됩니다. 주요 디바이스 모델링 및 특성 분석 EDA 소프트웨어 솔루션의 예는 다음과 같습니다.

  • IC-CAP: 사용자가 프로그래밍할 수 있는 다용도 반도체 디바이스 모델링 업계 표준
  • IC-CAP WaferPro: 빠르고 정확한 자동 측정 소프트웨어
  • MBP(Model Builder Program): 완전한 실리콘 턴키 디바이스 모델링 소프트웨어
  • MQA(Model Quality Assurance): 산업 표준 SPICE 모델 사인오프 및 수락 플랫폼

디바이스 모델링 및 특성 분석의 과제

  • 디바이스 크기가 갈수록 작아지면서 정확한 모델을 사용하여 디바이스 처리 성능의 통계적 편차를 통제해야 할 필요성이 더욱 커짐 
  • 회로 설계자는 DC 동작과 더불어 RF 및 노이즈 동작도 정확하게 예측할 수 있는 모델을 필요로 함 
  • 다양한 처리 기술은 고유한 프로세스에 빠르게 적응할 수 있는 다양한 모델을 필요로 함 
  • 모델링 측정을 위해서는 몇 시간 또는 며칠이 필요하므로 측정 제어 소프트웨어는 다양한 온도 범위에서 프로버, 계측기와도 원활하게 작동해야 함 

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Low Frequency Noise Analyzer Technical Demo 
A more technical dive on the new Advanced Low-Frequency Noise Analyzer with WaferPro Express, which offers the unique ability to measure and model device noise across wafers. This release features a new user interface and tight integration with Keysight's WaferPro Express software, a platform that performs automated wafer-level measurements of semiconductor devices.

기본 데모 2016-07-20

 
Keysight Seamlessly Integrates Low-Frequency Noise Measurements in Wafer Level Solution Platform 
New Advanced Low-Frequency Noise Analyzer Offers Unique Ability to Measure and Model Device Noise Across Wafers.

보도자료 2016-07-19

 
Introducing the 2016 Advanced Low-Frequency Noise Analyzer 
The new Advanced Low-Frequency Noise Analyzer Offers Unique Ability to Measure and Model Device Noise Across Wafers. This release features a new user interface and tight integration with Keysight's WaferPro Express software, a platform that performs automated wafer-level measurements of semiconductor devices.

기본 데모 2016-07-18

 
Follow Keysight EEsof EDA on Twitter! 
Twitter enables you to keep current on news and updates with Keysight EEsof through the exchange of quick, frequent answers to one simple question: What are you doing?

뉴스레터 2016-07-14

 
Keysight EEsof EDA Newsletter - Product and Application News 
Keep tabs on the latest product and application news and review the archives of the Keysight EEsof EDA Newsletter.

뉴스레터 2016-07-01

 
Low-Frequency Noise Measurements with the E4727A and Their Applications 
This application note covers noise basics (1/f and white), applications of noise measurements and analysis, and how noise measurement challenges are addressed by the E4727A A-LFNA.

어플리케이션 노트 2016-04-28

PDF PDF 2.39 MB
Keysight Announces Strategic Collaboration with San'an-IC to Release PDKs for HBT, pHEMT Processes 
Keysight announces that it has signed a memorandum of understanding (MoU) with Xiamen San'an Integrated Circuit Co. Ltd. (San'an-IC) to collaborate on an advanced process design kits (PDKs) for its HBT and pHEMT processes based on Advanced Design System (ADS) software.

보도자료 2016-04-22

 
How to Accurately Measure and Validate S-Parameters for Transistor Modeling 
This video explains and demonstrates a method to develop accurate Spice models based on verified S-parameter measurements. The video walks you through the entire modeling flow for two RF spiral inductors using IC-CAP.

사용방법 동영상 2016-04-04

 
Enabling Noise Measurements on Magnetic Sensors 
This document describes how to use the Keysight E4727A Advanced Low-Frequency Noise Analyzer to simplify noise measurements on magnetic sensors.

어플리케이션 노트 2016-03-24

Keysight Unveils Latest Release of its Device Modeling and Characterization Software Tool Suite 
Keysight announces the newest release of its industry-leading device modeling and characterization software suite: IC-CAP 2016, MBP 2016, and MQA 2016.

보도자료 2016-02-22

 
How to Model RF Passive Devices: Spiral Inductors 
This video explains and demonstrates a method to develop accurate Spice models based on verified S-parameter measurements. The video walks you through the entire modeling flow for two RF spiral inductors using IC-CAP.

사용방법 동영상 2016-02-11

 
Low-Frequency Noise Measurement System Adopted by China CEPREI Laboratory for Reliability Studies 
Keysight announces that CEPREI Laboratory has successfully adopted the Keysight EEsof EDA E4727A Advanced Low-Frequency Noise Analyzer (A-LFNA) for measurement and analysis of flicker noise (1/f noise) and random telegraph noise (RTN) during its reliability studies of semiconductor devices including MOSFETs, HEMTs and TFTs.

보도자료 2016-01-25

 
Model Builder Program (MBP) 
MBP is a one-stop solution that provides both automation and flexibility for silicon device modeling.

브로셔 2016-01-25

PDF PDF 930 KB
Model Quality Assurance (MQA) 
MQA provides the complete solution and framework to fabless design companies, IDMs, and foundries for SPICE model library validation, comparison, and documentation.

브로셔 2016-01-25

PDF PDF 3.13 MB
TS-8989 Automotive Body and Safety Test Reference Solution – Configuration Guide 
This configuration guide contains information to help you configure your body and safety test reference solution with the TS-8989 functional tester, and tailor the system to meet your requirements.

구성 가이드 2016-01-20

PDF PDF 2.55 MB
Leti to collaborate with Keysight Technologies to enable expansion of FD-SOI technology 
CEA-Leti announces it has signed an agreement with Keysight Technologies, a device-modeling software supplier, to adapt Leti’s UTSOI extraction flow methodology within Keysight’s device modeling solutions for high-volume SPICE model generation.

보도자료 2015-12-08

 
Keysight Selects Fraunhofer EMFT as its First Low-Frequency Noise Reference Center for EMEAI 
Keysight announces that Fraunhofer Research Institution for Microsystems and Solid State Technologies EMFT (Fraunhofer EMFT) is the first low-frequency noise measurements reference center able to demonstrate the Keysight EEsof EDAs E4727A Advanced Low-Frequency Noise Analyzer in Europe, the Middle East, Africa and India (EMEAI).

보도자료 2015-11-04

 
How to Model RF Passive Devices: Capacitors and Resistors 
This video explains and demonstrates a method to develop accurate Spice models from verified S-parameter measurements. The video walks you through the entire modeling flow for an on-wafer capacitor using IC-CAP.

사용방법 동영상 2015-10-27

 
Keysight Technologies to Demonstrate Latest Simulation Software Solutions at CSICS 
Keysight announces it will demonstrate its latest RF circuit, system and 3-D electromagnetic design and electro-thermal simulation software solutions at the Compound Semiconductor IC Symposium (CSICS 2015), Sheraton New Orleans, Booth 601, New Orleans, Oct. 11-14.

보도자료 2015-10-08

 
How to Model a BJT Bipolar Junction Transistor 
This video covers the basics of bipolar junction transistor (BJT) modeling and illustrates an easy step-by-step procedure to extract the model parameters of the popular Gummel-Poon (GP) model. While the GP model was introduced in the early 1970’s, it still enjoys a wide popularity in electronic device modeling and many modeling engineers consider it a classic and an excellent starting point for getting familiar with modeling in general.

사용방법 동영상 2015-08-28

 
Keysight Technologies' University Educational Support Programs Now in More Than 200 Universities 
Keysight announces that more than 200 universities in North America are now participating in the Keysight EEsof EDA University Educational Support Programs, which provide several thousand students with EDA software licenses.

보도자료 2015-08-20

 
Keysight EEsof EDA Premier Communications Design Software 
Keysight EEsof EDA premier communications design software product overview brochure.

브로셔 2015-08-19

PDF PDF 1.61 MB
Keysight Technologies to Demonstrate Latest EDA Software Solutions at 52nd Annual DAC 
Keysight announces it will demonstrate its latest electronic design automation software for microwave, RF, high-frequency, high-speed digital, RF system, electronic system level, circuit, 3-D electromagnetic, physical design and device-modeling applications at the Design Automation Conference (DAC) 2015, Booth 2020, San Francisco, June 8-10.

보도자료 2015-06-08

 
Dialog Semiconductor adopts IC-CAP, MBP, MQA, and WaferPro Express software 
Keysight announces that Dialog Semiconductor has adopted the Keysight EEsof EDA IC-CAP, MBP, MQA, and WaferPro Express software to perform foundry technology characterization, model validation, model customization and enhancement.

보도자료 2015-05-11

 
Drive Down the Cost of Test Using the ENA Series of Network Analyzers - Application Note 
In this application note, we discuss the contributions of Keysight Technologies, Inc.’s ENA Series of Vector Network Analyzers (ENA, hereafter) to drive down the cost of test in production lines.

어플리케이션 노트 2015-05-01

PDF PDF 2.46 MB

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