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프리미어 Si/III-V 디바이스 모델링 및 특성 분석 솔루션

키사이트는 첨단 CMOS 및 화합물 반도체 디바이스의 특성 분석과 모델링에 필요한 프리미어 솔루션을 제공합니다. 애질런트는 자동 측정에서부터 정확한 디바이스 모델 추출, 포괄적인 검증과 최종 프로세스 설계 키트(PDK) 검증에 이르기까지, 완전한 종합 모델링 솔루션을 제공합니다. 키사이트의 전문 엔지니어와 첨단 기술 랩(Lab)의 지원을 받는 종합 모델링 서비스가 제공됩니다. 주요 디바이스 모델링 및 특성 분석 EDA 소프트웨어 솔루션의 예는 다음과 같습니다.

  • IC-CAP: 사용자가 프로그래밍할 수 있는 다용도 반도체 디바이스 모델링 업계 표준
  • IC-CAP WaferPro: 빠르고 정확한 자동 측정 소프트웨어
  • MBP(Model Builder Program): 완전한 실리콘 턴키 디바이스 모델링 소프트웨어
  • MQA(Model Quality Assurance): 산업 표준 SPICE 모델 사인오프 및 수락 플랫폼

디바이스 모델링 및 특성 분석의 과제

  • 디바이스 크기가 갈수록 작아지면서 정확한 모델을 사용하여 디바이스 처리 성능의 통계적 편차를 통제해야 할 필요성이 더욱 커짐 
  • 회로 설계자는 DC 동작과 더불어 RF 및 노이즈 동작도 정확하게 예측할 수 있는 모델을 필요로 함 
  • 다양한 처리 기술은 고유한 프로세스에 빠르게 적응할 수 있는 다양한 모델을 필요로 함 
  • 모델링 측정을 위해서는 몇 시간 또는 며칠이 필요하므로 측정 제어 소프트웨어는 다양한 온도 범위에서 프로버, 계측기와도 원활하게 작동해야 함 

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정렬방식:
Keysight Technologies to Demonstrate Latest EDA Software Solutions at 52nd Annual DAC 
Keysight announces it will demonstrate its latest electronic design automation software for microwave, RF, high-frequency, high-speed digital, RF system, electronic system level, circuit, 3-D electromagnetic, physical design and device-modeling applications at the Design Automation Conference (DAC) 2015, Booth 2020, San Francisco, June 8-10.

보도자료 2015-06-08

 
Keysight EEsof EDA Newsletter - Product and Application News 
Keep tabs on the latest product and application news and review the archives of the Keysight EEsof EDA Newsletter.

뉴스레터 2015-06-01

 
Dialog Semiconductor adopts IC-CAP, MBP, MQA, and WaferPro Express software 
Keysight announces that Dialog Semiconductor has adopted the Keysight EEsof EDA IC-CAP, MBP, MQA, and WaferPro Express software to perform foundry technology characterization, model validation, model customization and enhancement.

보도자료 2015-05-11

 
Drive Down the Cost of Test Using the ENA Series of Network Analyzers - Application Note 
In this application note, we discuss the contributions of Keysight Technologies, Inc.’s ENA Series of Vector Network Analyzers (ENA, hereafter) to drive down the cost of test in production lines.

어플리케이션 노트 2015-05-01

PDF PDF 2.46 MB
Keysight Technologies Unveils WaferPro Express 2015 Platform for Wafer-Level Device Characterization 
Keysight announces WaferPro Express 2015, a measurement software platform for the automated characterization of wafer-level devices and circuit components.

보도자료 2015-04-28

 
Advanced Low-Frequency Noise Analyzer Overview 
This video will provide a brief overview of Keysight E4727A Advanced Low-Frequency Noise Analyzer (ALFNA), the next-generation system for measurement of 1/f noise and random telegraph noise. It will describe ALFNA’s innovative modular design and its technical advantages. It will also touch on wide-range applications and how they are enabled by ALFNA’s industry-leading technical specifications and rich feature set.

제품 둘러보기 2015-04-21

 
Keysight Technologies to Showcase Semiconductor Parametric, Modeling Solutions at IRPS 2015 
Keysight announces it will demonstrate some of its many semiconductor parametric and modeling solutions at the 53rd International Reliability Physics Symposium (IRPS), Hyatt Regency Monterey Resort, Booth 203/205, Monterey, Calif., April 19-23.

보도자료 2015-04-16

 
Keysight WaferPro Express 
The Keysight WaferPro Express software performs automated wafer-level measurements of semiconductor devices such as transistors and circuit components. It provides turnkey drivers and test routines for a variety of instruments and wafer probers. Its user interface makes it easy to setup and run complex wafer-level test plans, while powerful customization capabilities are enabled by the new Python programming environment.

제품 둘러보기 2015-03-24

 
WaferPro Express Software 
WaferPro Express software is an efficient and powerful automated measurement test platform for wafer-level characterization.

브로셔 2015-03-15

PDF PDF 1.49 MB
How to Make Accurate, Automated RF Wafer-level Measurements 
The video introduces automation as a way to increase productivity and efficiency. Keysight WaferPro Express measurement software is used to illustrate the various steps in combination with Cascade Microtech Velox software for prober control and Cascade WinCalXE software for automated calibration.

사용방법 동영상 2015-01-27

 
How to Extract SRAM Models  
This video shows how to extract SRAM device models efficiently on Keysight's device modeling platform.

사용방법 동영상 2015-01-14

 
Keysight Donates $120 Mil. Gift of Software, Support and Training to Georgia Institute of Technology 
Keysight announces the largest in-kind software donation in its longstanding relationship with the Georgia Institute of Technology.

보도자료 2014-12-10

 
Keysight Receives Global Frost & Sullivan Award for Market Leadership in Instrumentation Software 
Keysight Technologies announces that Frost & Sullivan has recognized Keysight with the 2014 Global Frost & Sullivan Award for Market Leadership in Instrumentation Software for excellence in capturing the highest market revenue within its industry. The award is based on Frost & Sullivan's recent analysis of the instrumentation software market.

보도자료 2014-12-08

 
Wafer-level Measurement Solutions – Cascade Microtech 
Accurate and Repeatable Wafer-level Measurements from Cascade Microtech and Keysight.

솔루션 개요 2014-08-04

 
Keysight EEsof EDA Customer Support - Brochure 
Whether you are a novice or an experienced user, Keysight EEsof EDA’s customer support offerings are designed to help you every step of the way.

브로셔 2014-08-03

PDF PDF 175 KB
EDA Support Services - Flyer 
Keysight Support Services for EDA Products offers customers several benefits otherwise not available. This service is designed to help you get the most out of your software purchases.

브로셔 2014-08-03

PDF PDF 454 KB
Keysight EEsof EDA Software and Modular Solutions for Universities 
Keysight works in collaboration with universities to provide tools that enable education and research for the engineers of tomorrow. The brochure outlines available programs, software and hardware.

브로셔 2014-08-03

PDF PDF 1.44 MB
RF and Microwave Industry-Ready Student Certification Program - Brochure 
This program confirms a student’s technical knowledge, design expertise, and hands-on measurement proficiency in the use of Keysight EEsof software design tools and Keysight instruments.

브로셔 2014-08-03

PDF PDF 562 KB
IC-CAP Device Modeling Software - Technical Overview 
This Technical Overview presents Keysight Technologies IC-CAP Device Modeling Software Release 2006. The IC-CAP software automates the process of accurate device characterization for today's RFIC designer.

기술 개요 2014-08-02

Keysight EEsof EDA Premier Communications Design Software - Technical Overview 
Keysight EEsof EDA premier communications design software product overview brochure.

브로셔 2014-07-31

PDF PDF 1015 KB
Model Builder Program (MBP) 
MBP is a one-stop solution that provides both automation and flexibility for silicon device modeling.

브로셔 2014-06-18

PDF PDF 1.47 MB
Advanced Modeling Solutions for Nanoscale 3D FinFETs and High-Frequency/High-Power GaN HEMTs 
Agilent announces several innovations for the 2014 release of its industry-leading suite of device modeling and characterization software tools. The suite is comprised of IC-CAP, MBP, and MQA.

보도자료 2014-06-18

 
Model Quality Assurance (MQA) 
MQA provides the complete solution and framework to fabless design companies, IDMs, and foundries for SPICE model library validation, comparison, and documentation.

브로셔 2014-06-18

PDF PDF 1.08 MB
Agilent Technologies and Cascade Microtech Announce Alliance to Streamline Wafer-Level Measurements 
Agilent Technologies and Cascade Microtech announce a strategic alliance to provide fully configured and validated RF measurement solutions that streamline wafer-level semiconductor measurements while delivering guaranteed configuration, installation and support.

보도자료 2014-06-03

 
X-Parameter Design Simulation Models - Modelithics 
X-Parameter Design Simulation Models from Modelithics and Keysight.

솔루션 개요 2014-04-30

 

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