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デバイス・モデリング

Keysightでは、DC、CV、ノイズ、RF測定用のハードウェア/ソフトウェア・デバイス・モデリング・ソリューションを提供しています。

Keysightの測定システムは、KeysightのIC-CAP(Integrated Circuit Characterization and Analysis Program)ソフトウェアを使って、設定、制御、自動化を容易に実行できます。KeysightのIP-CAPは、業界最高のデバイス・モデリング測定/パラメータ抽出ソフトウェアであり、精密なDC、CV、Sパラメータ評価に基づいて、詳細なノンリニア・モデル・パラメータ・セットを抽出するために使用できます。IC-CAPでは、簡単に測定をセットアップし、回路シミュレーションと最適化を実行できます。また、Spectre、HSPICE、Eldo、KeysightのAdvanced Design System(ADS)などの 一般的なシミュレータのリストから回路シミュレータを選択できます。

RF/DCパラメータ測定ソリューション

推奨のIC-CAPデバイス・モデリング構成では、DC、CV、ノイズ、RFデバイス測定を実行できます。これらの構成には、半導体デバイスの正確な評価に必要なバイアス回路、ケーブル、アダプタが付属します。IC-CAPデバイス・モデリング構成は、Cascade Microtech社やSuss社などの主要なオンウェーハ測定用プローブ・ステーションと組み合わせて使用できます。

RF評価のためのSパラメータ測定には、KeysightのPNAネットワーク・アナライザが使用されます。DCおよびCV測定には、KeysightのB1500、4156またはE5720半導体パラメータ・アナライザが使用されます。Keysight 11612T/V-Kxx高周波バイアス回路は、測定システムと被試験デバイスとの間の容易なリモート接続を実現し、測定確度が向上します。詳細については、 デバイス・モデリング用推奨モデリング構成を参照してください。

オプションのインストール/スタートアップ支援

測定ハードウェアの統合、インストール、スタートアップの支援を追加サービスとして提供いたします。Keysight EEsof EDA窓口までお問い合わせください。

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Keysight EEsof EDAユーザ向けメールマガジン -- しみゅレター 
キーサイトEDAソリューションの技術情報やアプリケーション情報を定期的にお知らせするEメールニュースレターです。

ニュースレター 2016-11-28

 
The High-Frequency, High Speed Design Revolution: Why Your Design & Test Flow Will Soon Be Obsolete 
In this keynote from EDI CON USA 2016, Todd Cutler, vice president and general manager of Keysight Design & Test Software, discusses these trends and explains how, when coupled with market pressures, they are driving a revolution in the design and measurement industry.

デモ 2016-10-11

 
Unlocking Millimeter Wave Insights 
It is easy to underestimate the challenges at millimeter-wave frequencies, and this amplifies the importance of integrated tools for design, simulation, measurement, and analysis. Learn more about how Keysight is taking the mystique out of millimeter waves and unlocking new insights.

デモ 2016-09-30

 
Advanced Low-Frequency Noise Analyzer Overview 
This video will provide a brief overview of Keysight E4727A Advanced Low-Frequency Noise Analyzer (ALFNA), the next-generation system for measurement of 1/f noise and random telegraph noise. It will describe ALFNA’s innovative modular design and its technical advantages. It will also touch on wide-range applications and how they are enabled by ALFNA’s industry-leading technical specifications and rich feature set.

製品紹介ビデオ 2016-08-29

 
Cascade Microtech Releases 1/f Measurement Solution With Keysight Technologies 
Cascade Microtech announces the release of a comprehensive low-frequency noise measurement solution for device modeling, characterization and reliability testing with MeasureOne solution partner Keysight Technologies.

プレス資料 2016-08-04

 
Low Frequency Noise Analyzer Technical Demo 
A more technical dive on the new Advanced Low-Frequency Noise Analyzer with WaferPro Express, which offers the unique ability to measure and model device noise across wafers. This release features a new user interface and tight integration with Keysight's WaferPro Express software, a platform that performs automated wafer-level measurements of semiconductor devices.

デモ 2016-07-20

 
Keysight Seamlessly Integrates Low-Frequency Noise Measurements in Wafer Level Solution Platform 
New Advanced Low-Frequency Noise Analyzer Offers Unique Ability to Measure and Model Device Noise Across Wafers.

プレス資料 2016-07-19

 
Introducing the 2016 Advanced Low-Frequency Noise Analyzer 
The new Advanced Low-Frequency Noise Analyzer Offers Unique Ability to Measure and Model Device Noise Across Wafers. This release features a new user interface and tight integration with Keysight's WaferPro Express software, a platform that performs automated wafer-level measurements of semiconductor devices.

デモ 2016-07-18

 
Follow Keysight EEsof EDA on Twitter! 
Twitter enables you to keep current on news and updates with Keysight EEsof through the exchange of quick, frequent answers to one simple question: What are you doing?

ニュースレター 2016-07-14

 
Low-Frequency Noise Measurements with the E4727A and Their Applications 
This application note covers noise basics (1/f and white), applications of noise measurements and analysis, and how noise measurement challenges are addressed by the E4727A A-LFNA.

アプリケーション・ノート 2016-04-28

PDF PDF 2.39 MB
Keysight Announces Strategic Collaboration with San'an-IC to Release PDKs for HBT, pHEMT Processes 
Keysight announces that it has signed a memorandum of understanding (MoU) with Xiamen San'an Integrated Circuit Co. Ltd. (San'an-IC) to collaborate on an advanced process design kits (PDKs) for its HBT and pHEMT processes based on Advanced Design System (ADS) software.

プレス資料 2016-04-22

 
How to Accurately Measure and Validate S-Parameters for Transistor Modeling 
This video explains and demonstrates a method to develop accurate Spice models based on verified S-parameter measurements. The video walks you through the entire modeling flow for two RF spiral inductors using IC-CAP.

使用法の説明ビデオ 2016-04-04

 
Enabling Noise Measurements on Magnetic Sensors 
This document describes how to use the Keysight E4727A Advanced Low-Frequency Noise Analyzer to simplify noise measurements on magnetic sensors.

アプリケーション・ノート 2016-03-24

Keysight Unveils Latest Release of its Device Modeling and Characterization Software Tool Suite 
Keysight announces the newest release of its industry-leading device modeling and characterization software suite: IC-CAP 2016, MBP 2016, and MQA 2016.

プレス資料 2016-02-22

 
How to Model RF Passive Devices: Spiral Inductors 
This video explains and demonstrates a method to develop accurate Spice models based on verified S-parameter measurements. The video walks you through the entire modeling flow for two RF spiral inductors using IC-CAP.

使用法の説明ビデオ 2016-02-11

 
Low-Frequency Noise Measurement System Adopted by China CEPREI Laboratory for Reliability Studies 
Keysight announces that CEPREI Laboratory has successfully adopted the Keysight EEsof EDA E4727A Advanced Low-Frequency Noise Analyzer (A-LFNA) for measurement and analysis of flicker noise (1/f noise) and random telegraph noise (RTN) during its reliability studies of semiconductor devices including MOSFETs, HEMTs and TFTs.

プレス資料 2016-01-25

 
TS-8989 Automotive Body and Safety Test Reference Solution – Configuration Guide 
This configuration guide contains information to help you configure your body and safety test reference solution with the TS-8989 functional tester, and tailor the system to meet your requirements.

構成ガイド 2016-01-20

PDF PDF 2.55 MB
Leti to collaborate with Keysight Technologies to enable expansion of FD-SOI technology 
CEA-Leti announces it has signed an agreement with Keysight Technologies, a device-modeling software supplier, to adapt Leti’s UTSOI extraction flow methodology within Keysight’s device modeling solutions for high-volume SPICE model generation.

プレス資料 2015-12-08

 
Keysight Selects Fraunhofer EMFT as its First Low-Frequency Noise Reference Center for EMEAI 
Keysight announces that Fraunhofer Research Institution for Microsystems and Solid State Technologies EMFT (Fraunhofer EMFT) is the first low-frequency noise measurements reference center able to demonstrate the Keysight EEsof EDAs E4727A Advanced Low-Frequency Noise Analyzer in Europe, the Middle East, Africa and India (EMEAI).

プレス資料 2015-11-04

 
How to Model RF Passive Devices: Capacitors and Resistors 
This video explains and demonstrates a method to develop accurate Spice models from verified S-parameter measurements. The video walks you through the entire modeling flow for an on-wafer capacitor using IC-CAP.

使用法の説明ビデオ 2015-10-27

 
Keysight Technologies to Demonstrate Latest Simulation Software Solutions at CSICS 
Keysight announces it will demonstrate its latest RF circuit, system and 3-D electromagnetic design and electro-thermal simulation software solutions at the Compound Semiconductor IC Symposium (CSICS 2015), Sheraton New Orleans, Booth 601, New Orleans, Oct. 11-14.

プレス資料 2015-10-08

 
デバイスモデリング用の推奨モデリング構成 
デバイスモデリング用のIC-CAP推奨モデリング構成

構成ガイド 2015-10-07

 
How to Model a BJT Bipolar Junction Transistor 
This video covers the basics of bipolar junction transistor (BJT) modeling and illustrates an easy step-by-step procedure to extract the model parameters of the popular Gummel-Poon (GP) model. While the GP model was introduced in the early 1970’s, it still enjoys a wide popularity in electronic device modeling and many modeling engineers consider it a classic and an excellent starting point for getting familiar with modeling in general.

使用法の説明ビデオ 2015-08-28

 
Keysight Technologies' University Educational Support Programs Now in More Than 200 Universities 
Keysight announces that more than 200 universities in North America are now participating in the Keysight EEsof EDA University Educational Support Programs, which provide several thousand students with EDA software licenses.

プレス資料 2015-08-20

 
Keysight Technologies to Demonstrate Latest EDA Software Solutions at 52nd Annual DAC 
Keysight announces it will demonstrate its latest electronic design automation software for microwave, RF, high-frequency, high-speed digital, RF system, electronic system level, circuit, 3-D electromagnetic, physical design and device-modeling applications at the Design Automation Conference (DAC) 2015, Booth 2020, San Francisco, June 8-10.

プレス資料 2015-06-08

 

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