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器件建模

是德为直流和射频半导体器件表征及建模提供硬件和软件解决方案。当前大多数领先的半导体制造商和集成器件制造商(IDMs)都采用是德工具来获得器件建模方案,以便用于芯片 CMOS、Bipolar、混合砷化镓(GaAs)、氮化镓(GaN)和许多其它器件技术。

器件建模挑战

  • 随着器件几何尺寸越来越小,使用精确模型并控制器件处理性能中的统计变量这种需求显得越来越重要。
  • 电路设计人员需要在直流以及射频和微波频率范围内可以精确预测器件行为的模型。
  • 不同的处理技术需要大量的可以迅速适应独特程序的模型。
  • 建模测量通常耗时数个小时甚至数天,测量控制软件也必须与探测器和仪器协同工作,以便在不同温度条件下执行自动测量。

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Keysight EEsof EDA Newsletter - Product and Application News 
Keep tabs on the latest product and application news and review the archives of the Keysight EEsof EDA Newsletter.

内部通讯 2016-12-01

 
Keysight EEsof EDA Premier Communications Design Software 
Keysight EEsof EDA premier communications design software product overview brochure.

手册 2016-11-15

PDF PDF 2.59 MB
The High-Frequency, High Speed Design Revolution: Why Your Design & Test Flow Will Soon Be Obsolete 
In this keynote from EDI CON USA 2016, Todd Cutler, vice president and general manager of Keysight Design & Test Software, discusses these trends and explains how, when coupled with market pressures, they are driving a revolution in the design and measurement industry.

基本演示 2016-10-11

 
Unlocking Millimeter Wave Insights 
It is easy to underestimate the challenges at millimeter-wave frequencies, and this amplifies the importance of integrated tools for design, simulation, measurement, and analysis. Learn more about how Keysight is taking the mystique out of millimeter waves and unlocking new insights.

基本演示 2016-09-30

 
Advanced Low-Frequency Noise Analyzer Overview 
This video will provide a brief overview of Keysight E4727A Advanced Low-Frequency Noise Analyzer (ALFNA), the next-generation system for measurement of 1/f noise and random telegraph noise. It will describe ALFNA’s innovative modular design and its technical advantages. It will also touch on wide-range applications and how they are enabled by ALFNA’s industry-leading technical specifications and rich feature set.

产品展示 2016-08-29

 
Cascade Microtech Releases 1/f Measurement Solution With Keysight Technologies 
Cascade Microtech announces the release of a comprehensive low-frequency noise measurement solution for device modeling, characterization and reliability testing with MeasureOne solution partner Keysight Technologies.

新闻资料 2016-08-04

 
Low Frequency Noise Analyzer Technical Demo 
A more technical dive on the new Advanced Low-Frequency Noise Analyzer with WaferPro Express, which offers the unique ability to measure and model device noise across wafers. This release features a new user interface and tight integration with Keysight's WaferPro Express software, a platform that performs automated wafer-level measurements of semiconductor devices.

基本演示 2016-07-20

 
Keysight Seamlessly Integrates Low-Frequency Noise Measurements in Wafer Level Solution Platform 
New Advanced Low-Frequency Noise Analyzer Offers Unique Ability to Measure and Model Device Noise Across Wafers.

新闻资料 2016-07-19

 
Introducing the 2016 Advanced Low-Frequency Noise Analyzer 
The new Advanced Low-Frequency Noise Analyzer Offers Unique Ability to Measure and Model Device Noise Across Wafers. This release features a new user interface and tight integration with Keysight's WaferPro Express software, a platform that performs automated wafer-level measurements of semiconductor devices.

基本演示 2016-07-18

 
Follow Keysight EEsof EDA on Twitter! 
Twitter enables you to keep current on news and updates with Keysight EEsof through the exchange of quick, frequent answers to one simple question: What are you doing?

内部通讯 2016-07-14

 
是德科技实现对磁性传感器的噪声测量 
是德科技实现对磁性传感器的噪声测量

应用说明 2016-06-24

Low-Frequency Noise Measurements with the E4727A and Their Applications 
This application note covers noise basics (1/f and white), applications of noise measurements and analysis, and how noise measurement challenges are addressed by the E4727A A-LFNA.

应用说明 2016-04-28

PDF PDF 2.39 MB
Keysight Announces Strategic Collaboration with San'an-IC to Release PDKs for HBT, pHEMT Processes 
Keysight announces that it has signed a memorandum of understanding (MoU) with Xiamen San'an Integrated Circuit Co. Ltd. (San'an-IC) to collaborate on an advanced process design kits (PDKs) for its HBT and pHEMT processes based on Advanced Design System (ADS) software.

新闻资料 2016-04-22

 
How to Accurately Measure and Validate S-Parameters for Transistor Modeling 
This video explains and demonstrates a method to develop accurate Spice models based on verified S-parameter measurements. The video walks you through the entire modeling flow for two RF spiral inductors using IC-CAP.

视频演示 2016-04-04

 
Keysight Unveils Latest Release of its Device Modeling and Characterization Software Tool Suite 
Keysight announces the newest release of its industry-leading device modeling and characterization software suite: IC-CAP 2016, MBP 2016, and MQA 2016.

新闻资料 2016-02-22

 
How to Model RF Passive Devices: Spiral Inductors 
This video explains and demonstrates a method to develop accurate Spice models based on verified S-parameter measurements. The video walks you through the entire modeling flow for two RF spiral inductors using IC-CAP.

视频演示 2016-02-11

 
模型质量检验(MQA)软件 
MQA 为无晶圆厂设计公司、IDM 和制造商提供完整的解决方案和框架,以进行 SPICE 模型库验证、比较和归档。

手册 2016-01-25

PDF PDF 3.13 MB
Model Builder Program(MBP)软件 
MBP 是提供自动和灵活的硅器件建模的一站式解决方案。

手册 2016-01-25

PDF PDF 930 KB
Model Builder Program (MBP) 
MBP is a one-stop solution that provides both automation and flexibility for silicon device modeling.

手册 2016-01-25

PDF PDF 930 KB
Model Quality Assurance (MQA) 
MQA provides the complete solution and framework to fabless design companies, IDMs, and foundries for SPICE model library validation, comparison, and documentation.

手册 2016-01-25

PDF PDF 3.13 MB
Low-Frequency Noise Measurement System Adopted by China CEPREI Laboratory for Reliability Studies 
Keysight announces that CEPREI Laboratory has successfully adopted the Keysight EEsof EDA E4727A Advanced Low-Frequency Noise Analyzer (A-LFNA) for measurement and analysis of flicker noise (1/f noise) and random telegraph noise (RTN) during its reliability studies of semiconductor devices including MOSFETs, HEMTs and TFTs.

新闻资料 2016-01-25

 
TS-8989 Automotive Body and Safety Test Reference Solution – Configuration Guide 
This configuration guide contains information to help you configure your body and safety test reference solution with the TS-8989 functional tester, and tailor the system to meet your requirements.

配置指南 2016-01-20

PDF PDF 2.55 MB
Leti to collaborate with Keysight Technologies to enable expansion of FD-SOI technology 
CEA-Leti announces it has signed an agreement with Keysight Technologies, a device-modeling software supplier, to adapt Leti’s UTSOI extraction flow methodology within Keysight’s device modeling solutions for high-volume SPICE model generation.

新闻资料 2015-12-08

 
Keysight Selects Fraunhofer EMFT as its First Low-Frequency Noise Reference Center for EMEAI 
Keysight announces that Fraunhofer Research Institution for Microsystems and Solid State Technologies EMFT (Fraunhofer EMFT) is the first low-frequency noise measurements reference center able to demonstrate the Keysight EEsof EDAs E4727A Advanced Low-Frequency Noise Analyzer in Europe, the Middle East, Africa and India (EMEAI).

新闻资料 2015-11-04

 
How to Model RF Passive Devices: Capacitors and Resistors 
This video explains and demonstrates a method to develop accurate Spice models from verified S-parameter measurements. The video walks you through the entire modeling flow for an on-wafer capacitor using IC-CAP.

视频演示 2015-10-27

 

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