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器件建模

是德为直流和射频半导体器件表征及建模提供硬件和软件解决方案。当前大多数领先的半导体制造商和集成器件制造商(IDMs)都采用是德工具来获得器件建模方案,以便用于芯片 CMOS、Bipolar、混合砷化镓(GaAs)、氮化镓(GaN)和许多其它器件技术。

器件建模挑战

  • 随着器件几何尺寸越来越小,使用精确模型并控制器件处理性能中的统计变量这种需求显得越来越重要。
  • 电路设计人员需要在直流以及射频和微波频率范围内可以精确预测器件行为的模型。
  • 不同的处理技术需要大量的可以迅速适应独特程序的模型。
  • 建模测量通常耗时数个小时甚至数天,测量控制软件也必须与探测器和仪器协同工作,以便在不同温度条件下执行自动测量。

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Keysight EEsof EDA Newsletter - Product and Application News 
Keep tabs on the latest product and application news and review the archives of the Keysight EEsof EDA Newsletter.

内部通讯 2014-09-09

 
WaferPro Express 
WaferPro Express software is an efficient and powerful automated measurement test platform for wafer-level characterization.

手册 2014-08-04

PDF PDF 57 KB
Wafer-level Measurement Solutions – Cascade Microtech 
Accurate and Repeatable Wafer-level Measurements from Cascade Microtech and Keysight.

Solution Brief 2014-08-04

 
EDA Support Services 
Keysight Support Services for EDA Products offers customers several benefits otherwise not available. This service is designed to help you get the most out of your software purchases.

手册 2014-08-03

PDF PDF 465 KB
Keysight EEsof EDA Software and Modular Solutions for Universities 
Keysight works in collaboration with universities to provide tools that enable education and research for the engineers of tomorrow. The brochure outlines available programs, software and hardware.

手册 2014-08-03

PDF PDF 1.44 MB
RF and Microwave Industry-Ready Student Certification Program 
This program confirms a student’s technical knowledge, design expertise, and hands-on measurement proficiency in the use of Keysight EEsof EDA software design tools and Keysight instruments.

手册 2014-08-03

PDF PDF 576 KB
IC-CAP Device Modeling Software 
Technical overview of Keysight's Integrated Circuit Characterization and Analysis Program (IC-CAP), complete and accurate parameter extraction for semiconductor device modeling

技术总览 2014-08-02

Model Quality Assurance (MQA) 
MQA provides the complete solution and framework to fabless design companies, IDMs, and foundries for SPICE model library validation, comparison, and documentation.

手册 2014-06-18

PDF PDF 1.08 MB
Advanced Modeling Solutions for Nanoscale 3D FinFETs and High-Frequency/High-Power GaN HEMTs 
Agilent announces several innovations for the 2014 release of its industry-leading suite of device modeling and characterization software tools. The suite is comprised of IC-CAP, MBP, and MQA.

新闻资料 2014-06-18

 
Model Builder Program (MBP) 
MBP is a one-stop solution that provides both automation and flexibility for silicon device modeling.

手册 2014-06-18

PDF PDF 1.47 MB
Agilent Technologies and Cascade Microtech Announce Alliance to Streamline Wafer-Level Measurements 
Agilent Technologies and Cascade Microtech announce a strategic alliance to provide fully configured and validated RF measurement solutions that streamline wafer-level semiconductor measurements while delivering guaranteed configuration, installation and support.

新闻资料 2014-06-03

 
X-Parameter Design Simulation Models - Modelithics 
X-Parameter Design Simulation Models from Modelithics and Keysight.

Solution Brief 2014-04-30

 
Agilent Technologies Announces Next-Generation System for Measuring Flicker Noise 
Agilent introduces the Agilent EEsof EDA E4727A Advanced Low-Frequency Noise Analyzer—a next-generation hardware and software system for measurement and analysis of flicker noise and random telegraph noise (RTN).

新闻资料 2014-03-13

 
Agilent Technologies Simulation and Modeling Software Selected by Nitronex for High-Power GaN Design 
Agilent announces that Nitronex, a GaAs labs company and leading producer of GaN-on-silicon RF power devices, has selected Agilent to provide a complete GaN design flow that spans both device modeling and circuit simulation.

新闻资料 2014-02-11

 
MBP and MQA Adopted by Microchip Technology for PDK Creation, Modification, Validation 
Agilent Technologies announces that Microchip Technology Inc., a leading provider of microcontroller, mixed-signal, analog and Flash-IP solutions, has adopted Agilent EEsof EDA's Model Builder Program and Model Quality Assurance software. Microchip Technology will use the software to create internal fabrication device model libraries or process design kits, modify external foundry libraries, and validate supported devices from internal and external sources.

新闻资料 2013-12-09

 
Keysight EEsof EDA Premier Communications Design Software 
The Keysight EEsof EDA catalog provides an excellent overview of all of Keysight's Electronic Design Automation (EDA) tools.

产品目录 2013-10-07

PDF PDF 8.61 MB
Keysight EEsof EDA Product Overview 
Keysight EEsof EDA premier communications design software product overview brochure.

手册 2013-09-30

PDF PDF 1.68 MB
Agilent's MBP and MQA Software Adopted by Shanghai Consortia for Advanced Device Modeling 
Agilent announces that the Shanghai Integrated Circuit Research and Development Center, a nonprofit research consortia dedicated to advancing the microelectronics industry in China, is using Agilent's Model Builder Program and Model Quality Assurance software for model extraction and verification at 45-nm process nodes.

新闻资料 2013-07-09

 
Agilent Technologies Introduces Industry’s First Solution for Modeling Power Devices 
Agilent announces that IC-CAP has been enhanced to provide full support for the B1505A Power Device Analyzer/Curve Tracer, including the instrument’s new high-power, high-current source monitor unit modules.

新闻资料 2013-06-24

 
Keysight EEsof EDA Customer Support Brochure 
Whether you are a novice or an experienced user, Keysight EEsof EDA’s customer support offerings are designed to help you every step of the way.

手册 2013-05-28

PDF PDF 681 KB
Agilent Ships Newest SPICE Model Extraction and Qualification Software 
Agilent announces shipment of the latest release of its industry-leading SPICE model extraction tool, Model Builder Program, and SPICE qualification tool, Model Quality Assurance.

新闻资料 2013-03-13

 
Agilent Technologies Launches Recognition Program for EDA Experts 
Agilent launches its Agilent Certified Expert recognition program for EDA experts. Eligible participants include individuals demonstrating a high level of expertise-both theoretical and practical-in applying Agilent EEsof EDA tools for product design and modeling.

新闻资料 2013-03-12

 
Agilent embraces GaN modeling in IC-CAP upgrade 
EETimes Design Article highlights new capabilities in IC-CAP 2013.01.

文章 2013-01-09

 
Agilent Technologies Unveils New IC-CAP Platform for Device Characterization and Modeling 
Agilent announces the latest release of its device modeling software platform, the Integrated Circuit Characterization and Analysis Program (IC-CAP).

新闻资料 2012-12-18

 
MOS-AK/GSA Modeling Working Group Holds Winter Workshop in San Francisco 
Experts Share Insight on Compact Device Modeling with Emphasis on Simulation-Aware Models.

新闻资料 2012-12-12

 

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