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Premier Si/III-V Device Modeling and Characterization Solutions

Keysight provides premier solutions for characterization and modeling of cutting-edge CMOS and compound semiconductor devices. Keysight is the only vendor that provides complete end-to-end modeling solutions, from automated measurements, accurate device model extraction, comprehensive qualification to final process design kit (PDK) validation. Comprehensive modeling services are offered, supported by Keysight’s expert engineers and advanced labs (see Device Modeling Services). Some of our key device modeling and characterization EDA software solutions include:

  • IC-CAP: A versatile and user programmable industry standard for semiconductor device modeling
  • IC-CAP WaferPro: Fast and accurate automated measurement software
  • WaferPro Express: Efficient, flexible and powerful wafer-level measurement software
  • Model Builder Program (MBP): Complete Silicon turnkey device modeling software
  • Model Quality Assurance (MQA): Industry standard SPICE model signoff and acceptance software

Device modeling and characterization challenges

  • As device geometries get smaller, the need to use accurate models and to control statistical variations in device processing performance becomes ever more important
  • Circuit designers need models that can accurately predict DC behaviors, as well as RF and noise behaviors
  • Different process technologies require a variety of models that can be quickly adapted to the unique processes
  • With modeling measurements taking hours or even days, measurement control software must also work with probers and instruments to allow automated measurements across temperature

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Keysight EEsof EDA Newsletter - Product and Application News 
Keep tabs on the latest product and application news and review the archives of the Keysight EEsof EDA Newsletter.

Newsletter 2017-09-01

 
Customizing Tables Just Got Easier with a New Python Module for MQA Software 
Working with data tables is a basic skill every engineer learns early on in their career. When organized properly, tables can summarize a great deal of device data into a helpful information format, and that makes them extremely useful.

Article 2017-07-12

 
Drive Down the Cost of Test Using the ENA Series Vector Network Analyzers - Application Note 
Discussion of the contributions of the Keysight ENA series vector network analyzer to drive down the cost of test in production lines. Including an in depth analysis of the total cost of ownership.

Application Note 2017-07-05

PDF PDF 2.47 MB
How to Simplify Device Model Extraction using an Open Source User Interface 
This video shows an example of an IC-CAP custom user interface (UI) for device modeling. In the selected modeling application, the DC modeling of a Zener diode is intentionally kept simple in order to demonstrate the features of the UI.

How-To Video 2017-06-26

 
Static Random Access Memory (SRAM) Cell Modeling in MBP 2017 
This video introduces a new turnkey solution for SRAM modeling now available in Keysight’s Model Builder Program 2017. The video describes the concept of SRAM cell modeling and highlights the major challenges of that process.

Demo 2017-06-12

 
Extending the Power of IC-CAP Software with Python—PyVISA Instrument Control 
Learn how to access the full capabilities of PyVISA from IC-CAP 2016 and create transforms for instrument control and data acquisition over any supported interface.

Article 2017-05-31

 
How to Extract a BSIM4 DC Model 
This video introduces a general DC modeling and characterization flow for the BSIM4 model, which is one of the most popular models used by the industry today for bulk CMOS.

How-To Video 2017-05-24

 
SRAM Cell Model Generation and Modeling Efficiency Take Center Stage in New Software Releases 
Accurate and efficient modeling is critical to successful design, especially when it comes to the Static Random Access Memory (SRAM) cell, the minimum geometry devices in integrated circuit technology.

Article 2017-05-04

 
Model Builder Program (MBP) 
MBP is a one-stop solution that provides both automation and flexibility for silicon device modeling.

Brochure 2017-04-27

PDF PDF 907 KB
Model Quality Assurance (MQA) 
MQA provides the complete solution and framework to fabless design companies, IDMs, and foundries for SPICE model library validation, comparison, and documentation.

Brochure 2017-04-25

PDF PDF 3.12 MB
Global Device Modeling Services - Brochure 
Keysight Technologies' Device Modeling Services delivers accurate device parameters rapidly for your advanced devices.

Brochure 2017-03-16

PDF PDF 1.59 MB
Python Programming integration with IC-CAP 
Learn what versions of IC-CAP are supported and see an example of how to get the MOSFET threshold voltage using Python in this blog post.

Article 2017-03-16

 
WaferPro Express Software 
WaferPro Express software is an efficient and powerful automated measurement test platform for wafer-level characterization.

Brochure 2017-02-22

PDF PDF 2.75 MB
Why Device Modeling Services? 
IC design stands on the shoulders of device modeling and characterization.

Article 2017-02-03

 
N5393F/G PCI Express® 4.0 (Gen4) Software for Infiniium Oscilloscopes - Data Sheet 
The N5393F/G PCI Express electrical performance validation and compliance software provides accurate and automated transmitter testing devices for single and multi lane test setup reducing test time.

Data Sheet 2017-01-25

PDF PDF 1008 KB
Keysight EEsof EDA Premier Communications Design Software 
Keysight EEsof EDA premier communications design software product overview brochure.

Brochure 2017-01-24

PDF PDF 2.54 MB
Transconductance Modeling for Low-Power Design 
Raj Sodhi explains how to extract Gm near Vth using Keysight’s Model Builder Program (MBP) in 3 simple steps.

Journal 2017-01-18

 
Device Modeling 101 - What are Ft and Fmax? 
Ft and Fmax are figures of merit used to benchmark the high frequency performance of RF transistors. This blog post describes the equations for these 2 parameters and how to improve the performance of RF transistors.

Journal 2016-12-18

 
Device Modeling 101 - How to Extract Threshold Voltage of MOSFETs 
Threshold voltage (Vth) is one of the most important electrical parameters in MOSFET modeling. Learn how to extract Vth using MBP.

Journal 2016-11-17

 
The High-Frequency, High Speed Design Revolution: Why Your Design & Test Flow Will Soon Be Obsolete 
In this keynote from EDI CON USA 2016, Todd Cutler, vice president and general manager of Keysight Design & Test Software, discusses these trends and explains how, when coupled with market pressures, they are driving a revolution in the design and measurement industry.

Demo 2016-10-11

 
Unlocking Millimeter Wave Insights 
It is easy to underestimate the challenges at millimeter-wave frequencies, and this amplifies the importance of integrated tools for design, simulation, measurement, and analysis. Learn more about how Keysight is taking the mystique out of millimeter waves and unlocking new insights.

Demo 2016-09-30

 
Advanced Low-Frequency Noise Analyzer Overview 
This video will provide a brief overview of Keysight E4727A Advanced Low-Frequency Noise Analyzer (ALFNA), the next-generation system for measurement of 1/f noise and random telegraph noise. It will describe ALFNA’s innovative modular design and its technical advantages. It will also touch on wide-range applications and how they are enabled by ALFNA’s industry-leading technical specifications and rich feature set.

Product Tour 2016-08-29

 
Cascade Microtech Releases 1/f Measurement Solution With Keysight Technologies 
Cascade Microtech announces the release of a comprehensive low-frequency noise measurement solution for device modeling, characterization and reliability testing with MeasureOne solution partner Keysight Technologies.

Press Materials 2016-08-04

 
Low Frequency Noise Analyzer Technical Demo 
A more technical dive on the new Advanced Low-Frequency Noise Analyzer with WaferPro Express, which offers the unique ability to measure and model device noise across wafers. This release features a new user interface and tight integration with Keysight's WaferPro Express software, a platform that performs automated wafer-level measurements of semiconductor devices.

Demo 2016-07-20

 
Keysight Seamlessly Integrates Low-Frequency Noise Measurements in Wafer Level Solution Platform 
New Advanced Low-Frequency Noise Analyzer Offers Unique Ability to Measure and Model Device Noise Across Wafers.

Press Materials 2016-07-19

 

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