TD-LTE Design and Test Equipment
TD LTE also known as LTE TDD (Long Term Evolution Time Division Duplex) is part of the 3GPP specifications for the next generation cellular technology. In China, TD-LTE will be an evolution from TD-SCDMA and will provide for asymmetric needs of mobile data usage and allow use of unpaired spectrum.
Keysight provides powerful and scalable design and test platforms that support the TD-LTE Radio Access Network (RAN) eNode B stations, and User Equipment (UE) development lifecycle. Accelerate Wireless Design and Test with Flexible, High-Performance Platforms
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Agilent’s UXM Wireless Test Set Enables New Insights into LTE-Advanced Category 6 Chipsets, Devices
Introducing the E7515A UXM wireless test set, the most highly integrated signaling test set created for functional and RF design validation in the 4G era and beyond.
Press Materials 2014-02-13
3GPP Long Term Evolution: System Overview, Product Development and Test Challenges -Application Note
This application note focuses on LTE and includes content on system overview, product development and test challenges of this new wireless communications technology.
Application Note 2009-09-08