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X-Parameters

NVNA Nonlinear Measurements and ADS Simulation and DesignKeysight's X-parameters* functionality can help you overcome a key challenge in RF engineering, namely that of nonlinear impedance differences, harmonic mixing, and nonlinear reflection effects that occur when components are cascaded under large signal operating conditions. X-parameters help solve this complex cascading problem: if you measure the X-parameters of a set of components individually, you can calculate the X-parameters and hence the nonlinear transfer function of any cascade made from them. Calculations based on X-parameters are usually performed within a harmonic balance simulator environment.

Use the tabs below to locate technical resources on the development and use of X-parameters, as well as information on Related Products and Solution Partners.

See Measurement Solution Example: X-Parameter Measurements

X-parameters" is a trademark of Keysight Technologies, Inc. The X-parameters format and underlying equations are open and documented. For more information on the use of this trademark, refer to X-parameters Open Documentation, Trademark Usage & Partnerships.

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X-parameter Videos on YouTube 
X-parameter Video Library playlist in Keysight EEsof EDA's Channel on YouTube.

Demo 2014-08-06

 
Helping you focus where it counts in aerospace and defense - Brochure 
This brochure covers the latest A/D test resources focused on Radar, EW, Satellite, MicComm and SDR.

Brochure 2014-08-01

PDF PDF 8.68 MB
Genesys 2014 Delivers Breakthrough Modulated RF Analysis for Circuit, System Design 
Keysight announces the latest release of Genesys 2014.

Press Materials 2014-05-27

 
Agilent Technologies Engineers Author X-Parameters* Book 
Agilent Technologies Engineers Author X-Parameters* Book

Press Materials 2013-10-30

 
Keysight EEsof EDA Premier Communications Design Software 
The Keysight EEsof EDA catalog provides an excellent overview of all of Keysight's Electronic Design Automation (EDA) tools.

Catalog 2013-10-07

PDF PDF 8.61 MB
Industry Publications on X-Parameters 
A number if important industry publications on X-parameters.

Article 2013-07-12

 
Simulation and Measurement-based X-parameter Models for Power Amplifiers with Envelope Tracking 
An investigation of envelope tracking power amplifiers using simulation-based and measurement-based frequency domain static XP models.

Article 2013-06-30

PDF PDF 544 KB
Agilent Technologies Commits $90 Million Gift of Software to Georgia Institute of Technology 
Agilent announces the largest in-kind software donation ever in its longstanding relationship with the Georgia Institute of Technology.

Press Materials 2013-02-04

 
EDN's 19th Annual Innovation Awards Finalists: Agilent's PNA-X NVNA 

Article 2012-11-30

 
Agilent Technologies Ships Newest GoldenGate Software Release for RFIC Designers 
Agilent announces shipment of its GoldenGate 2012.10 RFIC simulation, verification and analysis software.

Press Materials 2012-11-16

 
Agilent Technologies Collaborates with Thales to Apply X-parameters* Technology to RF System Design 
Agilent announces that its ongoing collaboration with Thales, a global technology leader for the defense and security and the aerospace and transport markets, has expanded the reach of X-parameters technology to wideband super-heterodyne receiver applications.

Press Materials 2012-06-20

 
Agilent to Demonstrate Its Newest RF/Microwave Design and Test Products at IMS 
Agilent will demonstrate its newest design and test products for advanced RF and microwave research, development and manufacturing at the 2012 IEEE MTT-S International Microwave Symposium (Booth 1015), June 17-22, at the Palais des congrès de Montréal.

Press Materials 2012-06-04

 
Agilent Technologies' Newest GoldenGate Software Release Accelerates Design Verification 
Agilent announced the latest release of its RFIC simulation, verification and analysis software, GoldenGate 2012.

Press Materials 2012-06-04

 
Agilent Announces Availability of Mitsubishi Electric's Nonlinear RF Model Library for ADS 
Agilent announces that the latest model library for Mitsubishi Electric's nonlinear GaAs and GaN RF devices is now available for use with Advanced Design System (ADS).

Press Materials 2012-01-12

 
Nonlinear Vector Network Analyzer (NVNA) Brochure 
NVNA provides the critical leap in technology to go beyond linear S-parameters, allowing efficient and accurate analysis and design of active devices under real world operating conditions.

Brochure 2011-09-20

PDF PDF 1.44 MB
Agilent Technologies Advances X-Parameters Innovations  
Agilent announces the latest wave of X-parameter innovations designed to further advance their use and support the industry's rapidly increasing interest in the technology.

Press Materials 2011-06-08

 
Time-domain Simulations of High-speed Links with X parameters 

Press Materials 2011-03-24

 
X-parameters Aid MMIC Design 
Microwaves & RF article on how models based X-parameters can provide insights into the linear and nonlinear behavior of key components in wireless systems, including power amplifiers and mixers.

Journal 2010-07-15

 
A Simplified Extension of X-parameters to Describe Memory Effects for Wideband Modulated Signals 
Model memory effects of microwave amplifiers in the case of wideband modulated signals.

Application Note 2010-05-05

PDF PDF 616 Bytes
Microwave Journal Cover Article: X-parameters Fundamentally Changing Nonlinear Microwave Design 
Provides an overview of the invention and need for x-parameters to model the behavior of non-linear devices. This is an article reprint from Microwave Journal, Issue March 2010, Vol.53. No.3

Article 2010-03-25

PDF PDF 771 KB
X-Parameters: Commercial Implementations for the Latest Technology Enable Mainstream Applications 
This article reprint from Microwave Journal introduces advances in commercially available solutions for characterization, modeling, and design of nonlinear components and systems based on X-parameters

Article 2009-10-09

PDF PDF 1.92 GB
Video Demos on Generating X-Parameters from Circuit Level Designs 
This four part series of demonstration videos shows how to generate X-parameters from circuits.

Demo 2009-09-28

 
Agilent Technologies Unveils Newest Solutions for Microwave, RF, Wireless, Radar Test 
At the 2009 European Microwave Conference.

Press Materials 2009-09-22

 
Solutions for Characterizing and Designing Linear Active Devices 
This short application brief discusses how to accurately characterize a devices’ nonlinear behavior.

Application Note 2009-08-21

X-parameters News 
Press Releases related to Agilent's X-parameters

Press Materials 2009-08-21

 

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