Keysight's X-parameters* functionality can help you overcome a key challenge in RF engineering, namely that of nonlinear impedance differences, harmonic mixing, and nonlinear reflection effects that occur when components are cascaded under large signal operating conditions. X-parameters help solve this complex cascading problem: if you measure the X-parameters of a set of components individually, you can calculate the X-parameters and hence the nonlinear transfer function of any cascade made from them. Calculations based on X-parameters are usually performed within a harmonic balance simulator environment.
Use the tabs below to locate technical resources on the development and use of X-parameters, as well as information on Related Products and Solution Partners.
See Measurement Solution Example: X-Parameter Measurements
* X-parameters" is a trademark of Keysight Technologies, Inc. The X-parameters format and underlying equations are open and documented. For more information on the use of this trademark, refer to X-parameters Open Documentation, Trademark Usage & Partnerships.
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Evénements Keysight en France
Bienvenue sur la page des événements auxquels participe Keysight en France
Electronic Measurement Events in Europe, Middle East & Africa
Electronic Measurement events in Europe, the Middle East, and Africa - seminars, trade shows, user group meetings, webcasts, tutorials and conferences.
Innovations in EDA: High Performance Digital Pre-Distortion (DPD) for Wideband Systems
Original broadcast Sept 1, 2011
Webcast - recorded
International Microwave Symposium (IMS) 2015
May 17-22, 2015; Phoenix, AZ