聯絡是德專家

LXI – 區域網路儀器延伸技術

區域網路(LAN)無所不在, 而且數量不斷增加,因此,有越來越多測試系統也開始支援 LAN 標準。現在,LXI 進一步將乙太網路(Ethernet)和全球網路的威力,注入測試系統中。LXI 聯盟將 LAN 技術標準化並延伸其應用範圍,讓使用者能夠隨時、隨心所欲在本地、遠端、分散式地點,執行系統設計。有了 LXI 標準,您可快速開發所需的測試系統,並且繼續發展未來需要的下一代系統。 LXI:為您帶來新契機。

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排序:
PXI Functional Test - TTCI 
PXI Functional Test Solution from TTCI and Keysight.

解決方案簡介 2014-05-14

 
Open Test Platform - LXinstruments 
LXI Functional Test Solutions from LXinstruments and Keysight.

解決方案簡介 2014-04-30

 
LXI Instrumentation applied to bioanalytical electrical characterization 

專文 2014-04-07

 
測試儀器模擬器 
WinSoft 和 Keysight 合作開發的測試儀器模擬解決方案。

解決方案簡介 2014-04-07

 
ECN article: Remote Wireless Test With LXI 
Article reprinted with approval from ECN magazine.

專文 2014-04-07

 
The LXI System You Didn’t Know You Were Using  
The Evaluation Engineering article talks about the strength and stealth of LXI and Ethernet connectivity.

專文 2014-04-07

 
Optimize burn-in test with the Keysight 34980A multifunction switch/measure unit apnote overview 
This application overview will discuss the complexities of burn-in test based on the Keysight 340980A switch/measure unit

應用手冊 2013-01-31

PDF PDF 440 KB
6 Hints for Enhancing Measurement Integrity in RF/Microwave Test Systems 

應用手冊 2012-04-30

LXI 新聞稿 

新聞資料 2010-03-16

 
是德 LXI 產品型錄 
The Keysight LXI Brochure shows you how to open the door to simpler system creation

型錄 2010-01-19

 
Getting Test Programs Up and Running Quickly with Driver Tracing and I/O Monitor 
This note helps you create an example program and then shows you how to use driver tracing and IO Monitor to examine, verify and troubleshoot I/O activity in IVI-COM drivers.

應用手冊 2009-05-05

Using IVI For Your Instrument Driver - Application Note 
This application note describes the use of IVI drivers in your test system to determine when IVI is the right choice

應用手冊 2008-11-14

Building Hybrid Test Systems. Ensuring success in two common development scenarios - Application Not 
Application Note 1465-33. When you migrate to a hybrid system that includes LXI along with GPIB, VXI, PXI, or any other architecture, two scenarios are most typical, minimum development time and maximum overall performance

應用手冊 2008-10-15

新一代的測試:LXI 概述 (AN 1465-30) 
新一代的測試:LXI 概述 (AN 1465-30)

促銷資料 2008-04-21

PDF PDF 1.89 MB
Tips for Optimizing Test System Performance in Linux Soft Real-Time Applications (AN 1465-31) 
This application note offers several tips for optimizing the soft real-time performance of off-the-shelf Linux systems.

應用手冊 2008-02-19

Using Linux to Control USB Instruments (AN 1465-30) - Application Note 
Keysight’s USB instruments are compatible with USBTMC, a vendor-independent device class for test and measurement resources. This application note explains how USBTMC works and how you can use the generic services to control your USB instruments.

應用手冊 2007-11-07

LXI Test System Provides Flexibility for Testing Automobile Antenna Amplifiers 

應用手冊 2007-10-30

PDF PDF 213 KB
Using Linux to Control LXI Instruments Through VXI-11 (AN 1465-28) 
VXI-11 is one of two alternative protocols used by most LAN-based instruments. It is based on RPC (Remote Procedure Calls). This application note explains how VXI-11 works and discusses a number of programming examples.

應用手冊 2007-07-08

測試系統發展指南: 測試工程師必備的完整手冊 

應用手冊 2007-06-27

Using Linux To Control LXI Instruments Through TCP (AN 1465-29) 
TCP is one of two alternative protocols used by most LAN-based instruments. It is the more elegant from a programming standpoint. This application note explains how instrument control works through TCP.

應用手冊 2007-06-13

AN1465-26 修改 GPIB 系統以納入 LAN/LXI 
本應用手冊將帶您瀏覽在一般 GPIB 測試系統中更換一台儀器的整個程序,並介紹如何利用系統軟體內的簡單變更完成這項工作。

應用手冊 2007-05-10

Using Linux in Your Test Systems: Linux Basics (AN 1465-27) 
If you haven’t used Linux in test applications, this document will provide a detailed overview. Topics include: A brief Linux history, why use Linux, free tools available for application development and an instrument control overview.

應用手冊 2007-05-08

Cathodic Protection of Steel in Concrete Using LXI 
This document discusss Cathodic protection as a remarkable technique that can substantially extend the life of a building structure by impeding corrosion.

應用手冊 2007-04-25

PDF PDF 390 KB
Using LXI to Boost Throughput in Semiconductor Manufacturing 
This document is a case study that discusses the successful customer implementation of a Keysight LXI solution for a multinational semiconductor manufacturer

應用手冊 2007-04-25

PDF PDF 234 KB
Standardized Core Makes Building and Supporting a Functional Test System Easier and Less Costly 
This note demonstrates how to use LXI instruments to create a standardized core - the open test platform (OTP), for building test systems.

應用手冊 2007-02-23

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