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Design & Test Integration

Turn great ideas into validated products—faster

In RF comms development, aggressive specs and evolving technologies shouldn’t slow you down. Keep moving forward with Keysight’s RF workflow environment: It’s the comprehensive way to simulate, measure and analyze communications components and systems. Through application-specific solutions, we can help you achieve greater levels of confidence in your designs, products and schedules. The foundation is proven software and hardware products that let you leverage our decades of experience in high-frequency systems. Accelerate with Keysight and turn great ideas into validated products—faster.

See Measurement Solution Example: Digital Pre-Distortion (DPD)

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Accelerate FPGA Debug by Applying Latest Tools and Methods Webcast 
Original broadcast June 10, 2014

Webcast - recorded

 
ADS-SystemVue Linkages 
SystemVue and ADS both have key strengths for designers doing baseband DSP, RF circuits and components, and the system architects who partition and verify these systems. Learn how to connect these worlds into a unified flow.

Seminar Materials 2010-10-19

PDF PDF 2.06 MB
Best practices in implementing boundary scan on limited access boards 
Live broadcast December 18, 2014; 9am PT / 12pm ET

Webcast

 
Boundary Scan Webcast Series 
Live and on-demand webcasts

Webcast

 
Common DFT guidelines for implementing boundary scan on limited access boards webcast 
Original broadcast September 11, 2014

Webcast - recorded

 
Conquering the High Power Source-Sink Test Challenge Webcast 
Original broadcast June 18, 2014

Webcast - recorded

 
Create Complex and 2-Channel Signals with Trueform Generators Webcast 
Original broadcast August 7, 2014

Webcast - recorded

 
DesignCon 2014 
Jan 28-31, 2014; Santa Clara Convention Center Download papers presented, order the AEF DVD

Tradeshow

 
Discover Keysight’s New AWG: Highest Speed, Bandwidth & Channel Density 
Original broadcast September 10, 2014

Webcast - recorded

 
Embedded testing of Intel Haswell and Broadwell chipsets on limited access client boards webcast 
Original broadcast November 13, 2014

Webcast - recorded

 
Extending boundary scan tests to improve test coverage of limited access boards webcast 
Original broadcast September 25, 2014

Webcast - recorded

 
Introduction to the Keysight x1149 Boundary Scan Analyzer Webcast 
Original broadcast August 26, 2014; 9am PT / 12pm ET

Webcast - recorded

 
Maximizing test coverage of multiple limited access boards by linking multiple boundary scan chains 
Original broadcast October 9, 2014

Webcast - recorded

 
MIPI M-PHY, D-PHY and C-PHY Receiver Testing – Today and Tomorrow 
Original broadcast October 21, 2014

Webcast - recorded

 
Oscilloscope Measurements Webcast Series 
Live and on-demand broadcasts that will teach you how to make precise measurements with its Infiniium line of real-time and sampling oscilloscopes.

Webcast

 
PAM-4 Solutions for Transmit and Receive Design Characterization 
Original broadcast October 23, 2014

Webcast - recorded

 
PCI Express 3.0 Compliance - Successfully Navigating the Standard Webcast 
Original broadcast May 7, 2013

Webcast - recorded

 
Protect Your Device Against Power-Related Damage During Test Webcast 
Original broadcast August 20, 2014

Webcast - recorded

 
Testing DDR on limited access boards using boundary scan silicon nails 
Original broadcast October 30, 2014

Webcast - recorded

 
Testing limited access SSD boards with boundary scan and external instruments webcast 
Live broadcast December 4, 2014; 9am PT / 12pm ET

Webcast

 
Tips, Techniques, and Examples on Using your System Power Supply to Improve Test Throughput Webcast 
Live broadcast April 30, 2014; 10am PT / 1pm ET

Webcast

 
Wideband Digital Pre-Distortion Modeling for LTE-Advanced 
Original broadcast July 26, 2012

Webcast - recorded

 
Wideband Digital Pre-Distortion Modeling for LTE-Advanced Webcast Slides 
Slides from the July 26, 2012 webcast

Seminar Materials 2012-07-26

PDF PDF 2.99 MB