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전문가 상담

Integrating 설계 및 테스트

Connected Solutions refers to the integration of Keysight's Advanced Design System (ADS) EDA Software and Keysight instrumentation into a solution that enables design and verification capabilities.

It combines simulation and measurement, and allows the sharing of signals, measurements, algorithms, and data in both directions between the two domains.

Connected Solutions make it possible to:

  • Create simulation models from measurements.
    Connected Solutions can be used to measure existing components and create simulation models. These models can then be used in ADS to determine how the existing hardware might impact the overall performance of a system or circuit in simulation, saving design time and money.
  • Accelerate verification testing.
    Connected solutions make it easy to determine if a component or sub-system will work within the system as a whole, without having to build the whole system. Integration issues can be found and fixed earlier in the design process, reducing risk and saving design re-work time and costs.
  • Extend the capability and value of instruments.
    Connected Solutions make applications such as coded Bit Error Rate (BER) testing of a component or stimulating a device with the impaired signal that will be present in a system possible, enhancing the value of Keysight's test instrumentation.

Learn more about ADS-Instrument Links

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Oscilloscope Measurements Webcast Series 
Live and on-demand broadcasts that will teach you how to make precise measurements with its Infiniium line of real-time and sampling oscilloscopes.

웹캐스트

 
Accuracy matters: Calibration Options for Lab Standards Webcast 
Original broadcast May 19, 2016

웹캐스트

 
International Microwave Symposium (IMS) 2016 
May 22-27, 2016; San Francisco, CA

트래이드쇼

 
Supporting PAM-4 Optical Link Development Webcast 
Original broadcast December 10, 2015

웹캐스트 - recorded

 
Troubleshooting Coherent Optical Communication Systems Webcast 
Original broadcast April 22, 2015

웹캐스트 - recorded

 
MIPI M-PHY, D-PHY and C-PHY Receiver Testing – Today and Tomorrow 
Original broadcast October 21, 2014

웹캐스트 - recorded

 
Site Hazard, Safety & Risk Mitigation for Beginning Thermographers Webcast 
Original broadcast September 30, 2015

웹캐스트 - recorded

 
Best Practices to Optimize Power Meter Sensor Measurements Webcast 
Original broadcast October 21, 2015

웹캐스트 - recorded

 
Achieving Fast, Accurate Multi-Channel Power Measurements Over a Wide Dynamic Range Webcast 
Original broadcast September 9, 2015

웹캐스트 - recorded

 
Seven Best Practices to Avoid Damaging Power Meters and Sensors Webcast 
Original broadcast July 30, 2015

웹캐스트 - recorded

 
RF/uW Switching Solutions Webcast 
Original broadcast July 8, 2015

웹캐스트 - recorded

 
Addressing Multi-Channel Synchronization for MIMO and Beamforming Test Webcast 
Original broadcast April 28, 2015

웹캐스트 - recorded

 
Bridging the Gap from Benchtop to PXI: A Common Software Strategy Webcast 
Original broadcast March 26, 2015

웹캐스트 - recorded

 
One Size Does Not Fit All - Choose the Right Instrument Form Factor Webcast 
Original broadcast March 11, 2015

웹캐스트 - recorded

 
PCI Express 3.0 Compliance - Successfully Navigating the Standard Webcast 
Original broadcast May 7, 2013

웹캐스트 - recorded

 
Boundary Scan Webcast Series 
Live and on-demand webcasts

웹캐스트

 
Best practices in implementing boundary scan on limited access boards 
Original broadcast December 18, 2014

웹캐스트 - recorded

 
Testing limited access SSD boards with boundary scan and external instruments webcast 
Original broadcast December 4, 2014

웹캐스트 - recorded

 
Embedded testing of Intel Haswell and Broadwell chipsets on limited access client boards webcast 
Original broadcast November 13, 2014

웹캐스트 - recorded

 
Testing DDR on limited access boards using boundary scan silicon nails 
Original broadcast October 30, 2014

웹캐스트 - recorded

 
Maximizing test coverage of multiple limited access boards by linking multiple boundary scan chains 
Original broadcast October 9, 2014

웹캐스트 - recorded

 
Extending boundary scan tests to improve test coverage of limited access boards webcast 
Original broadcast September 25, 2014

웹캐스트 - recorded

 
Introduction to the Keysight x1149 Boundary Scan Analyzer Webcast 
Original broadcast August 26, 2014; 9am PT / 12pm ET

웹캐스트 - recorded

 
Common DFT guidelines for implementing boundary scan on limited access boards webcast 
Original broadcast September 11, 2014

웹캐스트 - recorded

 
Wideband Digital Pre-Distortion Modeling for LTE-Advanced 
Original broadcast July 26, 2012

웹캐스트 - recorded

 

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