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Integrating 설계 및 테스트

Connected Solutions refers to the integration of Keysight's Advanced Design System (ADS) EDA Software and Keysight instrumentation into a solution that enables design and verification capabilities.

It combines simulation and measurement, and allows the sharing of signals, measurements, algorithms, and data in both directions between the two domains.

Connected Solutions make it possible to:

  • Create simulation models from measurements.
    Connected Solutions can be used to measure existing components and create simulation models. These models can then be used in ADS to determine how the existing hardware might impact the overall performance of a system or circuit in simulation, saving design time and money.
  • Accelerate verification testing.
    Connected solutions make it easy to determine if a component or sub-system will work within the system as a whole, without having to build the whole system. Integration issues can be found and fixed earlier in the design process, reducing risk and saving design re-work time and costs.
  • Extend the capability and value of instruments.
    Connected Solutions make applications such as coded Bit Error Rate (BER) testing of a component or stimulating a device with the impaired signal that will be present in a system possible, enhancing the value of Keysight's test instrumentation.

Learn more about ADS-Instrument Links

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Accelerate FPGA Debug by Applying Latest Tools and Methods Webcast 
Original broadcast June 10, 2014

웹캐스트 - recorded

 
ADS-SystemVue Linkages 
SystemVue and ADS both have key strengths for designers doing baseband DSP, RF circuits and components, and the system architects who partition and verify these systems. Learn how to connect these worlds into a unified flow.

세미나 프리젠테이션 2010-10-19

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Best practices in implementing boundary scan on limited access boards 
Live broadcast December 18, 2014; 9am PT / 12pm ET

웹캐스트

 
Boundary Scan for Testing On-Board DDRs Webcast 
Original broadcast October 22, 2013

웹캐스트 - recorded

 
Boundary Scan Webcast Series 
Live and on-demand webcasts

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Common DFT guidelines for implementing boundary scan on limited access boards webcast 
Original broadcast September 11, 2014

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Conquering the High Power Source-Sink Test Challenge Webcast 
Original broadcast June 18, 2014

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Create Complex and 2-Channel Signals with Trueform Generators Webcast 
Original broadcast August 7, 2014

웹캐스트 - recorded

 
DesignCon 2014 
Jan 28-31, 2014; Santa Clara Convention Center Download papers presented, order the AEF DVD

트래이드쇼

 
Discover Keysight’s New AWG: Highest Speed, Bandwidth & Channel Density 
Original broadcast September 10, 2014

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Embedded testing of Intel Haswell and Broadwell chipsets on limited access client boards webcast 
Live broadcast November 13, 2014; 9am PT / 12pm ET

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Extending boundary scan tests to improve test coverage of limited access boards webcast 
Original broadcast September 25, 2014

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Introduction to the Keysight x1149 Boundary Scan Analyzer Webcast 
Original broadcast August 26, 2014; 9am PT / 12pm ET

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Maximizing test coverage of multiple limited access boards by linking multiple boundary scan chains 
Original broadcast October 9, 2014

웹캐스트 - recorded

 
MIPI M-PHY, D-PHY and C-PHY Receiver Testing – Today and Tomorrow 
Live broadcast Ocotber 21, 2014; 10am PT / 1pm ET

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Oscilloscope Measurements Webcast Series 
Live and on-demand broadcasts that will teach you how to make precise measurements with its Infiniium line of real-time and sampling oscilloscopes.

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PAM-4 Solutions for Transmit and Receive Design Characterization 
Live broadcast October 23, 2014; 10am PT / 1pm ET

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PCI Express 3.0 Compliance - Successfully Navigating the Standard Webcast 
Original broadcast May 7, 2013

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Protect Your Device Against Power-Related Damage During Test Webcast 
Original broadcast August 20, 2014

웹캐스트 - recorded

 
Testing DDR on limited access boards using boundary scan silicon nails 
Live broadcast October 30, 2014; 9am PT / 12pm ET

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Testing limited access SSD boards with boundary scan and external instruments webcast 
Live broadcast December 4, 2014; 9am PT / 12pm ET

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Tips, Techniques, and Examples on Using your System Power Supply to Improve Test Throughput Webcast 
Live broadcast April 30, 2014; 10am PT / 1pm ET

웹캐스트

 
Wideband Digital Pre-Distortion Modeling for LTE-Advanced 
Original broadcast July 26, 2012

웹캐스트 - recorded

 
Wideband Digital Pre-Distortion Modeling for LTE-Advanced Webcast Slides 
Slides from the July 26, 2012 webcast

세미나 프리젠테이션 2012-07-26

PDF PDF 2.99 MB