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Signal Integrity

Use advanced SI tools to define next-generation processes

Whether you perform signal integrity analysis independently or as a tightly integrated part of the digital design process, the breadth of tools available from Keysight can help you find problems today and prevent problems in the future. Keysight - achieve your best design.

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Keysight EEsof EDA Customer Support - Brochure 
Whether you are a novice or an experienced user, Keysight EEsof EDA’s customer support offerings are designed to help you every step of the way.

Brochure 2014-08-03

PDF PDF 175 KB
High Speed Digital Design with Advanced Design System - Brochure 
This brochure describes 3 ADS suites of applicable simulators, libraries, and capabilities for signal integrity engineers.

Brochure 2014-07-31

PDF PDF 1.33 MB
Digital Design & Interconnect Standards - Brochure 
Brochure shows Keysight’s high-speed digital solution set , a range of essential tools, measurement and simulation—that will help cut through the challenges of gigabit digital designs.

Brochure 2014-02-20

PDF PDF 6.47 MB
Keysight EEsof EDA Product Overview 
Keysight EEsof EDA premier communications design software product overview brochure.

Brochure 2013-09-30

PDF PDF 1.68 MB
Measuring Jitter in Digital Systems (AN 1448-1) - Application Brief 
This application note is for R&D designers and engineers working on high-speed digital designs. It addresses jitter measurements in digital circuits, how the different measurement techniques are best applied, and how these decisions may change as the data rates increase.

Application Note 2013-09-16

PDF PDF 1.78 MB
DDR4 TdiVW/VdiVW Bit Error Rate Measurement or Understanding Bit Error Rate 
Importance of making BER measurement calculations to form a statistical measurement of total jitter to understand the design's data valid window result and design error rates.

Application Note 2013-01-24

PDF PDF 1.65 MB
ADS W2302EP/ET, W2500EP/ET, and W2312EP/ET Transient Convolution Products 
Advanced Design System W2302EP/ET Transient Convolution Element, W2500EP/ETTransient Convolution GT Option, and W2312EP/ET Transient Convolution Distributed Computing 8-pack

Brochure 2012-10-30

PDF PDF 1.31 MB
S-parameter Series: Transforming Oscilloscope Acquisitions for De-Embedding, Embedding & Simulating 
This application note is the first in a series of s-parameter application notes and introduces us to signal acquisition and theory.

Application Note 2012-03-05

Effective Reflection Characterization for Active Devices Using ENA Option TDR Application Note 
This application note describes Hot TDR measurement, which is an effective characterization method for the reflection of transmitter and receiver.

Application Note 2012-01-12

Understanding the Kramers-Kronig Relation Using A Pictorial Proof 
The Kramers-Kronig relation lets us build a causal time-domain model from bandlimited s-parameters. This pictorial proof aids understanding of the physics of causality and hence the validity of this approach.

Application Note 2010-03-31

Using ADS for Signal Integrity Optimization 
This white paper shows how to replace a multi-dimensional sweep of a long running PRBS time-domain simulation (including manual data evaluation) by short, channel-pulse characterization in the Advanced Design System to efficiently optimize a channel.

Application Note 2009-10-19

Preselector Tuning for Amplitude Accuracy in Microwave Spectrum Analysis 
This 8 page application note introduces the technique for broadband modulated signals employed in the new MXA signal analyzer.

Application Note 2009-08-14

Signal Integrity Analysis Series Part 3: The ABCs of De-Embedding 
This Application Note focuses on Part 3: The ABCs of De-Embedding explaining different de-embedding techniques & shows how to minimize fixture effects for best results.

Application Note 2007-07-01

PDF PDF 2.44 MB
Signal Integrity Analysis Series Part 2: 4-Port TDR/VNA/PLTS - Application Note 
This Application Note focuses on part 2: those which use a 4-port TDR/VNA/PLTS.

Application Note 2007-02-21

PDF PDF 2.75 MB
Signal Integrity Analysis Series Part 1: Single-Port TDR, TDR/TDT, & 2-Port TDR - Application Note 
This Application Note focuses on part 1: those which use a single-port TDR, those which use TDR/TDT, and those which use 2-port TDR.

Application Note 2007-01-01

PDF PDF 3.50 MB
Using Clock Jitter Analysis to Reduce BER in Serial Data Applications 
This Application Note emphasizes on the emerging techniques for reference clock jitter analysis from the perspective of oscillator physics, phase noise theory, and serial data technology.

Application Note 2006-12-01

Designing High Speed Backplanes Utilizing Physical Layer Test System 
This Application Note focuses on the problems introduced into the backplane assembly design by the many linear passive components that create reflections due to impedance discontinuities.

Application Note 2006-01-18

Limitations and Accuracies of Time and Frequency Domain Analysis of Physical Layer Devices 

Application Note 2005-11-01

Understanding Signal Integrity 
This is a technical note that was featured in the AMS Newsletter, Volume 1, Issue 2. This technical note discusses the problems that engineers have with signal integrity and solutions to help address the problems.

Application Note 2002-04-18

PDF PDF 287 KB
8 Hints for Debugging and Validating High-speed Buses 
8 Hints for Debugging High-speed Buses

Application Note 2002-03-05

PDF PDF 2.24 MB
S-Parameter Techniques for Faster, More Accurate Network Design (AN 95-1) 
This Application Note is for information only. Keysight no longer sells or supports these products.

Application Note 1967-02-01

PDF PDF 3.10 MB