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Digital Design & Interconnect Standards - Brochure 
Brochure shows Keysight’s high-speed digital solution set , a range of essential tools, measurement and simulation—that will help cut through the challenges of gigabit digital designs.

型錄 2014-02-20

PDF PDF 6.47 MB
DDR4 TdiVW/VdiVW Bit Error Rate Measurement or Understanding Bit Error Rate 
Importance of making BER measurement calculations to form a statistical measurement of total jitter to understand the design's data valid window result and design error rates.

應用手冊 2013-01-24

PDF PDF 1.65 MB
Effective Reflection Characterization for Active Devices Using ENA Option TDR Application Note 
This application note describes Hot TDR measurement, which is an effective characterization method for the reflection of transmitter and receiver.

應用手冊 2012-01-12

Mixed Analog & Digital Signal Debug and Analysis Using a Mixed-Signal Oscilloscope 
Using a mixed analog and digital 32 bit WLAN application example, this note shows how an MSO with deep memory makes debugging today’s mixed analog and digital designs easier than ever before.

應用手冊 2009-06-01

Debugging Signal Integrity and Protocol Layers on DDR Designs 
As DDR data transmission rates increase, signal integrity and clarity become critical concerns. So one of the primary challenges with DDR is debugging failures.

應用手冊 2008-12-19

PDF PDF 984 KB
Integrated Debugging-A New Approach to Troubleshooting Your Designs with Real-Time Oscilloscopes 
Traditional debugging can be time consuming and inefficient. With Keysight Infiniium oscilloscopes, “integrated debugging” is a reality, and it leads you directly to the root cause of problems.

應用手冊 2008-01-30

Agilent Technologies and Fujitsu Microelectronics Pacific Asia Ltd. to Deliver Chipset Test Solution 

新聞資料 2007-10-24

 
Complete solutions for characterization, debug, compliance test of HDMI designs - Brochure 
This brochure discusses test solutions for HDMI. Thorough characterization and validation of HDMI-based designs

型錄 2007-10-19

PDF PDF 1.12 MB
Improve Your Time-to-Insight:Debugging Intermittent Memory Failures in DDR and DDR2 Systems 
Application Note 1575

應用手冊 2006-04-14

Planning Your Design for Debug: FPGA Dynamic Probe 

應用手冊 2005-01-26

InfiniBand System Level Debugging (AN 1382-1) 
This application note is written for R & D engineers developing InfiniBand processors and InfiniBand system designers and integrators. It covers key concepts underlying system-level debug and validation of InfiniBand systems.

應用手冊 2004-03-17

In-circuit Debug of FPGAs 
This application note covers key methods of debugging FPGAs along with technologies that reduce the number of pins needed for debug.

應用手冊 2003-05-01

Debugging Parallel RapidIO Designs 

應用手冊 2003-01-09

USB 2.0產品認証測試的除錯考量, 應用手冊1382-3 
USB 2.0產品認証測試的除錯考量, 應用手冊1382-3

應用手冊 2002-12-21

8 Hints for Debugging and Validating High-speed Buses 
8 Hints for Debugging High-speed Buses

應用手冊 2002-03-05

PDF PDF 2.24 MB
8 Hints for Debugging Siemens MCU-based Designs 
A new type of instrument, the mixed signal oscilloscope (MSO), closes the gap in MCU debugging tools. The Keysight 54645D from Hewlett-Packard combines two analog scope channels with 16 digital logic channels, so you can monitor analog and digital lines at the same time. This MSO offers more...

應用手冊 1998-11-01

PDF PDF 736 KB