LTE-Advanced Test & Design
Learn more about additional LTE resources from Keysight including the LTE and the Evolution to 4G Wireless book
4G LTE-Advanced refers to the evolved version of LTE that is being developed by 3GPP to meet or exceed the requirements of the International Telecommunication Union (ITU) for a true fourth generation radio-communication standard known as IMT-Advanced. LTE-Advanced, of the 3GPP standard, is defined in Release 10 and all the follow on releases including Release 12. LTE-Advanced is focused on higher capacity with increased peak data rate of 1 Gbps for the downlink and 500 Mbps for the uplink, higher spectral efficiency, increased number of simultaneously active subscribers, and improved performance at cell edges, e.g. for DL 2x2 MIMO at least 2.40 bps/Hz/cell.
The main new functionalities of Release 10 for LTE-Advanced are Carrier Aggregation (CA), enhanced use of multi-antenna techniques, enhanced uplink, and support for Relay Nodes (RN).
Keysight not only addresses basic and test challenges, but also outlines the technology, describes deployment and standard milestones, and offers resources for those requiring more in-depth LTE technology information. We offer greater insight into LTE designs by providing greater insight into complex LTE technology, evolving LTE standards and how to test to them, and deeper insight into the root causes of design problems. Keysight continues to play a pivotal role in the development, revision and implementation of 3GPP and the new 4G LTE technology, as well as, continues to be the recognized leader for its contribution to the future of wireless access.
Refine the List
By Type of Content
Training & Events
By Product Category
All Product Categories
Oscilloscopes, Analyzers, Meters
Protocol Analyzers and Exercisers
- HDMI / MHL Protocol Analyzers and Generators (2)
- PCI EXPRESS® Protocol Solutions (2)
- E2960B Series PCIe Test Solutions for PCIe 1.0 and PCIe 2.0 (2)
- N5300 Series Chassis (2)
- Protocol Solutions for USB 3.0/2.0 (2)
- DigRF Protocol Test Products (2)
- SerialTek SAS/SATA BusXpert Analyzers, BusMod Error Injectors, BusGen BIST Generators (2)
- Protocol Analyzers and Exercisers
- Oscilloscopes, Analyzers, Meters
1-2 of 2
Electronic Measurement Events in Europe, Middle East & Africa
Electronic Measurement events in Europe, the Middle East, and Africa - seminars, trade shows, user group meetings, webcasts, tutorials and conferences.
Keysight's Events for United Kingdom and Ireland
Welcome to Keysight's Upcoming Events Page for United Kingdom and Ireland