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Serial ATA (SATA) Design & Test Resource Center

Every generation change of digital standards introduces new risks. We see it firsthand when creating our products and working with engineers like you. Keysight's solution set for each generation of SATA covers the challenges for each standard: eSATA, mSATA, and USM. Regardless of the SATA design challenges you are facing, Keysight offers a complete solution. Work with Keysight and achieve your best design.

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10G USB 3.1 – Keeping Up with the Physical Layer Test Challenges Webcast 
Original broadcast March 25, 2015

Webcast - recorded

 
DDR4/LPDDR4 – Overcome the Barriers of Testing and Probing High-Speed Memory Systems Webcast 
Original broadcast April 23, 2015

Webcast - recorded

 
DesignCon 2014 
Jan 28-31, 2014; Santa Clara Convention Center Download papers presented, order the AEF DVD

Tradeshow

 
DesignCon 2015 
Download Keysight's papers from Technical Conference; Jan 27-29, 2015; Santa Clara Convention Center

Tradeshow

 
DisplayPort 1.3 – PHY Layer Test Requirements Webcast 
Live broadcast May 27, 2015; 10am PT / 1pm ET

Webcast

 
Electronic Measurement Events in Europe, Middle East & Africa 
Electronic Measurement events in Europe, the Middle East, and Africa - seminars, trade shows, user group meetings, webcasts, tutorials and conferences.

Seminar

 
How to Use a SERDES Channel Simulator for PAM-4 Simulations and Analysis Webcast 
Original broadcast July 23, 2015

Webcast - recorded

 
Introducing the New Infiniium V-Series High-Performance Oscilloscope Webcast 
Original broadcast April 14, 2015

Webcast - recorded

 
Overcoming Test Challenges of 100Gb Ethernet and Beyond Webcast 
Live broadcast January 15, 2015; 10am PT / 1pm ET

Webcast

 
PCB Materials, Simulations, and Measurements for 32 Gb/s Webcast 
Original broadcast January 22, 2015

Webcast - recorded