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USB Design & Test

The Universal Serial Bus (USB) is an industry standard developed by the USB Implementers Forum (USB-IF), which defines standard interfaces between computers and peripherals.

USB is implemented in several forms today:

  • USB 2.0 (also known as High Speed USB) achieves 480 Mb/s data rate while retaining backwards compatibility to USB 1.1 devices.
  • USB 3.0 (also known as SuperSpeed USB) achieves 5 Gb/s data rate and implements a dual-bus architecture. One bus is a USB 2.0 bus and the other is a SuperSpeed bus.
  • USB 3.1 (also known as SuperSpeedPlus USB) achieves 10 Gb/s data rate and supercedes the USB 3.0 specification.
  • USB Type-C Connector enables smaller product designs and enhances usability by providing reversible plug orientation and direction.

Keysight’s solutions for USB applications are driven and supported by Keysight experts that are active in the USB-IF. Our involvement in standards groups and their related workshops, and specification development enables Keysight to bring the right solutions to the market when you need them.

Regardless of the USB generation design challenges you are facing, Keysight offers a complete solution set from electrical to protocol. Work with Keysight and gain insights for your best design.

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Eventi di Keysight Italia 
Benvenuti nella pagina degli eventi di Keysight Italia

Seminar

 
10G USB 3.1 – Keeping Up with the Physical Layer Test Challenges Webcast 
Original broadcast March 25, 2015

Webcast - recorded

 
ADMF: Facing the challenges of Super speed USB 3.0 Product Development  
Agilent Digital Measurement Forum (ADMF): Facing the challenges of Super speed USB Product Development

Seminar Materials 2008-11-12

PDF PDF 1.78 MB
DDR4/LPDDR4 – Overcome the Barriers of Testing and Probing High-Speed Memory Systems Webcast 
Original broadcast April 23, 2015

Webcast - recorded

 
Debugging Serial Buses In Embedded Designs using Oscilloscopes Webcast 
Live broadcast August 18, 2015; 10am PT / 1pm ET

Webcast

 
DesignCon 2014 
Jan 28-31, 2014; Santa Clara Convention Center Download papers presented, order the AEF DVD

Tradeshow

 
DesignCon 2015 
Download Keysight's papers from Technical Conference; Jan 27-29, 2014; Santa Clara Convention Center

Tradeshow

 
Discover Keysight’s New AWG: Highest Speed, Bandwidth & Channel Density 
Original broadcast September 10, 2014

Webcast - recorded

 
DisplayPort 1.3 – PHY Layer Test Requirements Webcast 
Live broadcast May 27, 2015; 10am PT / 1pm ET

Webcast

 
Electronic Measurement Events in Europe, Middle East & Africa 
Electronic Measurement events in Europe, the Middle East, and Africa - seminars, trade shows, user group meetings, webcasts, tutorials and conferences.

Seminar

 
Fixturing and Fixture Removal for Multiport Devices with Non-Standard RF Interfaces Webcast 
Original broadcast March 11, 2014

Webcast - recorded

 
HDMI Physical Layer Compliance Testing - 2.0 and Beyond Webcast 
Original broadcast September 23, 2014

Webcast - recorded

 
How to Achieve Compliance to the New 1E-16 BER Contour Spec in DDR4 
Original broadcast November 6, 2014

Webcast - recorded

 
How to Optimize Your SerDes Design During the Pre-layout Phase Webcast 
Original broadcast September 25, 2014

Webcast - recorded

 
How to Use a SERDES Channel Simulator for PAM-4 Simulations and Analysis Webcast 
Original broadcast July 23, 2015

Webcast - recorded

 
Introducing the New Infiniium V-Series High-Performance Oscilloscope Webcast 
Original broadcast April 14, 2015

Webcast - recorded

 
MIPI M-PHY, D-PHY and C-PHY Receiver Testing – Today and Tomorrow 
Original broadcast October 21, 2014

Webcast - recorded

 
MIPI Physical Layer Standards and Receiver Test Solutions Webcast 
Original broadcast May 13, 2015

Webcast - recorded

 
Network Analysis Back to Basics Webcast 
Recorded broadcast August 21, 2013

Webcast - recorded

 
Next generation BERT Ensures Signal Integrity in High-speed Digital Designs Webcast 
Original broadcast January 21, 2014

Webcast - recorded

 
Overcoming Test Challenges of 100Gb Ethernet and Beyond Webcast 
Live broadcast January 15, 2015; 10am PT / 1pm ET

Webcast

 
PAM-4 Solutions for Transmit and Receive Design Characterization Webcast 
Original broadcast October 23, 2014

Webcast - recorded

 
PCB Materials, Simulations, and Measurements for 32 Gb/s Webcast 
Original broadcast January 22, 2015

Webcast - recorded

 
Simulation-Measurement Workflow for DDR Compliance Webcast 
Original broadcast March 27, 2014

Webcast - recorded

 
SuperSpeed USB 10 Gbps (USB 3.1) Physical Layer Test Challenges Webcast 
Original broadcast Ocotber 30, 2014

Webcast - recorded

 

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