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USB (2.0/3.0/Wireless) Design & Test Information Resource Center

USB 2.0 provides the 480 Mb/s data rate to accommodate data transfers between peripherals and computers. USB 2.0 devices are backwards compatible with USB 1.1 devices. USB 2.0 is also known as Hi-Speed USB.

USB 3.0 is a dual-bus architecture that incorporates USB 2.0 and a SuperSpeed bus (nominal data rate is 5 Gb/s).

Wireless USB is the wireless extension to USB that combines the speed and security of wired technology with the ease-of-use of wireless technology. Wireless USB supports robust high-speed wireless connectivity by utilizing the common WiMedia MB-OFDM Ultra-wideband (UWB) radio platform as developed by the WiMedia Alliance.

Specifications and compliance tests are defined by the USB Implementers Forum. The resources you find here will provide you with an overview of USB design, understand the latest measurement techniques, and illustrate design and debug approaches. Keysight – achieve your best design.

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정렬방식:
DesignCon 2014 
Jan 28-31, 2014; Santa Clara Convention Center Download papers presented, order the AEF DVD

트래이드쇼

 
Discover Keysight’s New AWG: Highest Speed, Bandwidth & Channel Density 
Live broadcast September 10, 2014; 10am PT / 1pm ET

웹캐스트

 
Next generation BERT Ensures Signal Integrity in High-speed Digital Designs Webcast 
Original broadcast January 21, 2014

웹캐스트 - recorded

 
USB Test Challenges: Fast and Accurate Receiver Characterization Webcast 
Original broadcast July 16, 2014

웹캐스트 - recorded

 
View the recorded webcast - How to handle USB 3.0 physical layer test requirements 
How to handle USB 3.0 physical layer test requirements.

교육 자료 2011-11-08