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USB and Type-C™ Cable and Connector

The Universal Serial Bus (USB) is an industry standard developed by the USB Implementers Forum (USB-IF), which defines standard interfaces between computers and peripherals.

USB is implemented in several forms today:
 

  • USB 2.0 (also known as High Speed USB) achieves 480 Mb/s data rate while retaining backwards compatibility to USB 1.1 devices.
  • USB 3.1 Gen 1 (also known as SuperSpeed USB) achieves 5 Gb/s data rate and implements a dual-bus architecture. One bus is a USB 2.0 bus and the other is a SuperSpeed bus.
     
  • USB 3.1 Gen 2 (also known as SuperSpeedPlus USB) achieves 10 Gb/s data rate.
     
  • USB-C cable and connector enables smaller product designs, enhances usability by providing reversible plug orientation and direction, and establishes a power delivery and charging infrastructure. Multiple serial standards including USB, Thunderbolt, DisplayPort and MHL, have announced support for the Type-C connector.

Keysight’s design and test solutions for USB and USB-C applications are driven and supported by Keysight experts that are active in the USB-IF. Our involvement in standards groups and their related workshops, and specification development enables Keysight to bring the right solutions to the market when you need them.

Regardless of which USB generation or USB Type-C design and test challenges you are facing, Keysight offers a complete solution set from simulation to compliance.

Keysight RF and Digital Learning Center - A commitment to learning with industry experts

HARDWARE + SOFTWARE + PEOPLE = USB and Type-C Insights

View USB and Type-C design and test solution examples.
 

Explore YouTube Videos 

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PCIe 4.0 Physical Layer Transmitter and Receiver Testing Webcast 
Live broadcast April 5, 2017

Webcast

 
Demystifying Vias in High-Speed PCB Design Webcast 
Original broadcast March 23, 2017

Webcast - recorded

 
DDR4/LPDDR4 Testing – Best Practices to Get to Market Faster Webcast 
Live broadcast April 20 , 2017; 10am PT / 1pm ET

Webcast

 
Test with Data Analytics to Enable Faster Time to Market Webcast 
Original broadcast March 8, 2017

Webcast - recorded

 
Analyze and Optimize 32- to 56- Gbps Serial Link Channels Webcast 
Original broadcast January 26, 2017

Webcast - recorded

 
Overcoming 400G Test Challenges using PAM-4 Webcast 
Original broadcast December 13, 2016

Webcast - recorded

 
PCI Express®: Techniques for 16 Gbit Deployment Webcast 
Original broadcast September 27, 2016

Webcast - recorded

 
PAM-4 Designs – Advanced Characterization and Debug Solutions Webcast 
Original broadcast May 18, 2016

Webcast - recorded

 
Practical Approach for Signal Integrity Analysis of High Data Rate Channels Webcast 
Original broadcast July 28, 2016

Webcast - recorded

 
DisplayPort 1.3 over Type-C: Taming the Gotchas!  
Original broadcast May 3, 2016

Webcast - recorded

 
Identify and Eliminate Crosstalk from Your Designs Using Oscilloscopes Webcast 
Original broadcast April 20, 2016

Webcast - recorded

 
MIPI M-PHY, D-PHY and C-PHY Receiver Testing – Today and Tomorrow 
Original broadcast October 21, 2014

Webcast - recorded

 
Introducing the New Infiniium V-Series High-Performance Oscilloscope Webcast 
Original broadcast April 14, 2015

Webcast - recorded

 
Next generation BERT Ensures Signal Integrity in High-speed Digital Designs Webcast 
Original broadcast January 21, 2014

Webcast - recorded

 
Network Analysis Back to Basics Webcast 
Recorded broadcast August 21, 2013

Webcast - recorded

 
Fixturing and Fixture Removal for Multiport Devices with Non-Standard RF Interfaces Webcast 
Original broadcast March 11, 2014

Webcast - recorded

 
View the recorded webcast - How to handle USB 3.0 physical layer test requirements 
How to handle USB 3.0 physical layer test requirements.

Training Materials 2011-11-08

 
ADMF: Facing the challenges of Super speed USB 3.0 Product Development  
Agilent Digital Measurement Forum (ADMF): Facing the challenges of Super speed USB Product Development

Seminar Materials 2008-11-12

PDF PDF 1.78 MB