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USB Type-C™ Interface

The Universal Serial Bus (USB) is an industry standard developed by the USB Implementers Forum (USB-IF), which defines standard interfaces between computers and peripherals. The USB Type-C connector is the latest development in the USB-IF that not only is a low profile high data rate connector but is orientation independent, part of a new paradigm in power delivery AND now includes the three major interface technologies for high speed data: USB3.1, Thunderbolt3 and DisplayPort. Designs using the Type-C connector can provide much more value and power to the consumer. As an implementer of these interfaces, you will need a complete feature set for physical layer testing from a partner you can rely on.

Serial Data Interfaces that operate over the Type-C connector:

  • USB 2.0 (also known as High Speed USB) achieves 480 Mb/s data rate while retaining backwards compatibility to USB 1.1 devices.
  • USB 3.1 Gen 1 and Gen 2, also known as SuperSpeed USB (5Gbs) and Superspeed Plus(10Gbs). These links operate in dual simplex mode (one RX and one TX lane).
  • Thunderbolt 3 (TBT3) runs as an alternate mode over the Type-C connector and achieves 40Gbs composite over two lanes in forward and reverse directions.
  • DPoC (DisplayPort over Type-C): the preferred display interface now runs over the USB Type-C as an alternate mode and two modes are possible: 4 lanes in one direction with composite bit rate up to 32.4Gbs or 2 lanes in one direction simultaneously with USB3.1 RX and TX lanes active.
  • Mobile High Definition Link (MHL): MHL operates as an Alternate mode and conveys HDMI encoded information over 1 or 2 lanes.
  • High Definition Multimedia Interface (HDMI): HDMI LA defined the HDMI operation as an alternate mode over the Type-C connector for data rates not exceeding 3.4Gbs (maximum display data throughput equaling 10.2Gbs).
  • USB-Power Delivery 2: USBPD2 operates at low data rates, but establishes power contracts between link partners where power providers and consumers are identified as well the voltage and current limits.

 

USB Type-C™ Keysight Measurement Solutions

Keysight’s design and test solutions for USB Type-C applications are driven and supported by Keysight experts who are active in the standards bodies that incorporate the connector: USB-IF and VESA. Our involvement in standards groups and their related workshops, and specification development enables Keysight to bring the right solutions to the market when you need them.

Keysight is the only company that has standard-accepted solutions for USB, TBT3 and DP for Transmitter Test, Receiver test, and Cable test.

While Keysight focuses on Compliance Testing and provides the Hardware and software to assure compliance, we also emphasize solutions in simulation as well as full characterization (corner testing) of the USB Type-C physical layer.

Keysight RF and Digital Learning Center - A commitment to learning with industry experts

HARDWARE + SOFTWARE + PEOPLE = USB and Type-C Insights

Explore YouTube Videos 

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Mastering Signal Integrity and Power Integrity Design Seminar 
Various dates and locations in 2017

Seminar

 
Advanced Measurement Seminar 2017 
Various dates and locations in 2017

Seminar

 
USB Type-C Physical Layer Design Webcast 
Live broadcast November 9, 2017; 10am PT / 1pm ET

Webcast - recorded

 
Test with Data Analytics to Enable Faster Time to Market Webcast 
Original broadcast March 8, 2017

Webcast - recorded

 
Thermal Effects, Power Integrity, and Your PCB 
Original broadcast July 27, 2017

Webcast - recorded

 
Keysight Test-Drive 2017 
Various dates and locations in 2017

Seminar

 
Lightwave/400G Symposium 2017  
Santa Clara, CA; June 8, 2017

Seminar

 
DDR4/LPDDR4 Testing – Best Practices to Get to Market Faster Webcast 
Original broadcast April 20, 2017

Webcast - recorded

 
PCIe 4.0 Physical Layer Transmitter and Receiver Testing Webcast 
Live broadcast April 5, 2017

Webcast

 
Demystifying Vias in High-Speed PCB Design Webcast 
Original broadcast March 23, 2017

Webcast - recorded

 
Analyze and Optimize 32- to 56- Gbps Serial Link Channels Webcast 
Original broadcast January 26, 2017

Webcast - recorded

 
Overcoming 400G Test Challenges using PAM-4 Webcast 
Original broadcast December 13, 2016

Webcast - recorded

 
MIPI M-PHY, D-PHY and C-PHY Receiver Testing – Today and Tomorrow 
Original broadcast October 21, 2014

Webcast - recorded

 
Introducing the New Infiniium V-Series High-Performance Oscilloscope Webcast 
Original broadcast April 14, 2015

Webcast - recorded

 
Next generation BERT Ensures Signal Integrity in High-speed Digital Designs Webcast 
Original broadcast January 21, 2014

Webcast - recorded

 
Network Analysis Back to Basics Webcast 
Recorded broadcast August 21, 2013

Webcast - recorded

 
Fixturing and Fixture Removal for Multiport Devices with Non-Standard RF Interfaces Webcast 
Original broadcast March 11, 2014

Webcast - recorded

 
View the recorded webcast - How to handle USB 3.0 physical layer test requirements 
How to handle USB 3.0 physical layer test requirements.

Training Materials 2011-11-08

 
ADMF: Facing the challenges of Super speed USB 3.0 Product Development  
Agilent Digital Measurement Forum (ADMF): Facing the challenges of Super speed USB Product Development

Seminar Materials 2008-11-12

PDF PDF 1.78 MB