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DDR Memory Design & Test

Double Data Rate (DDR) Synchronous Dynamic Random Access Memory (SDRAM) is implemented in several forms today:

  • DDR, DDR1, DDR2, DDR3, DDR4 – advancing generations of DDR technology with progressively faster data rates and clock frequencies
  • LPDDR, LPDDR2, LPDDR3, LPDDR4 – generations of low-power DDR targeted for mobile devices
  • GDDR5 – graphical DDR targeted for graphics boards
  • UFS – universal flash storage, the next generation of mobile storage

Keysight’s solutions for DDR memory applications are driven and supported by Keysight experts that are active in the Joint Electronic Devices Engineering Council (JEDEC). Our involvement in standards groups and their related workshops, and specification development enables Keysight to bring the right solutions to the market when our customers need them.

Regardless of the DDR generation design challenges you are facing, Keysight offers a complete solution set from electrical to protocol. Work with Keysight and gain insights for your best design.

See measurement solution examples to discover specific solutions for your DDR and memory needs.
 

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Keysight eventos en España 
Bienvenido a la página de eventos organizados por Keysight en España.

Seminar

 
Best practices in implementing boundary scan on limited access boards 
Live broadcast December 18, 2014; 9am PT / 12pm ET

Webcast

 
Boundary Scan Webcast Series 
Live and on-demand webcasts

Webcast

 
Common DFT guidelines for implementing boundary scan on limited access boards webcast 
Original broadcast September 11, 2014

Webcast - recorded

 
DesignCon 2014 
Jan 28-31, 2014; Santa Clara Convention Center Download papers presented, order the AEF DVD

Tradeshow

 
Electronic Measurement Events in Europe, Middle East & Africa 
Electronic Measurement events in Europe, the Middle East, and Africa - seminars, trade shows, user group meetings, webcasts, tutorials and conferences.

Seminar

 
Embedded testing of Intel Haswell and Broadwell chipsets on limited access client boards webcast 
Original broadcast November 13, 2014

Webcast - recorded

 
Extending boundary scan tests to improve test coverage of limited access boards webcast 
Original broadcast September 25, 2014

Webcast - recorded

 
Introduction to the Keysight x1149 Boundary Scan Analyzer Webcast 
Original broadcast August 26, 2014; 9am PT / 12pm ET

Webcast - recorded

 
Maximizing test coverage of multiple limited access boards by linking multiple boundary scan chains 
Original broadcast October 9, 2014

Webcast - recorded

 
Testing DDR on limited access boards using boundary scan silicon nails 
Original broadcast October 30, 2014

Webcast - recorded

 
Testing limited access SSD boards with boundary scan and external instruments webcast 
Live broadcast December 4, 2014; 9am PT / 12pm ET

Webcast