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DDR Memory Design & Test

Double Data Rate (DDR) Synchronous Dynamic Random Access Memory (SDRAM) is implemented in several forms today – the original DDR (also called DDR1), DDR2 which improved performance and lowered power consumption, DDR3 with even better performance, and low-power DDR (LPDDR), that is targeted for mobile devices.

Keysight is an active member of JEDEC, with consistent participation in workshops and specification issues. These resources you find here will provide you with an overview of DDR design, understand the latest measurement techniques, and illustrate design and debug approaches.

Use the matrix below to discover specific solutions for your DDR needs.

  Simulation Functional Test (Oscilloscope) Validation (Logic Analyzers Probing Solutions
DDR2 Learn more Learn more Learn more Learn more
DDR3 Learn more Learn more Learn more Learn more
DDR4 Planned Learn more Learn more  
LPDDR2 Learn more Learn more Learn more  
LPDDR3 Planned Learn more Learn more  
GDDRS Planned Learn more    

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1-8 / 8

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Common DFT guidelines for implementing boundary scan on limited access boards webcast 
Original broadcast September 11, 2014

웹캐스트 - recorded

 
Embedded testing of Intel Haswell and Broadwell chipsets on limited access client boards webcast 
Original broadcast November 13, 2014

웹캐스트 - recorded

 
Extending boundary scan tests to improve test coverage of limited access boards webcast 
Original broadcast September 25, 2014

웹캐스트 - recorded

 
Fixture De-embedding Techniques for 28 Gb/s Transmitter Measurements Webcast 
Live broadcast January 23, 2014; 10am PT/1pm ET/19:00 CET

웹캐스트 - recorded

 
Introduction to the Keysight x1149 Boundary Scan Analyzer Webcast 
Original broadcast August 26, 2014; 9am PT / 12pm ET

웹캐스트 - recorded

 
Maximizing test coverage of multiple limited access boards by linking multiple boundary scan chains 
Original broadcast October 9, 2014

웹캐스트 - recorded

 
Next generation BERT Ensures Signal Integrity in High-speed Digital Designs Webcast 
Original broadcast January 21, 2014

웹캐스트 - recorded

 
Testing DDR on limited access boards using boundary scan silicon nails 
Original broadcast October 30, 2014

웹캐스트 - recorded