Contact an Expert

Serial Attached SCSI (SAS & SAS 2) Information Resource Center

Serial Attached SCSI (SAS) is a data-transfer technology for moving data to and from storage devices. SAS depends on a point-to-point serial protocol that replaces parallel SCSI bus technology that is commonly used in data centers, workstations and servers. The technology is based on a serial transmission scheme and uses an embedded clock with the 8b/10b data encoding scheme.

The SAS technology is currently at its second generation. It is referred to as SAS-2 and covers speeds of up to 6Gb/s, allowing for faster data transfer than the previous generation. Its predecessor, SAS-1 only covers speeds of up to 3Gb/s. One of the uniqueness of SAS is it offers backwards-compatibility with Serial ATA (SATA) storage devices. SATA devices may be connected to SAS backplanes, but SAS drives may not be connected to SATA backplanes.

The T10 technical committee of the International Committee for Information Technology Standards (INCITS) develops and maintains the SAS protocol and physical layers, while the SCSI Trade Association (SCSITA) promotes the technology. Keysight is an active member and contributor of the T10 and SCSITA, with consistent participation in workshops and specifications development. These resources you find here will provide you with an overview of SAS design, understand the latest measurement techniques, and illustrate design and debug approaches. Keysight - achieve your best design.

Explore YouTube Videos 

1-19 of 19

Sort:
10 Oscilloscope Innovations You’ll Want that Didn’t Exist 3 Years Ago 
Live broadcast November 12, 2014; 10am PT / 1pm ET

Webcast

 
Cable and Connector Care 
Accelerated Education Curriculum: Training for fundamentals of connector care

Classroom Training

 
DesignCon 2014 
Jan 28-31, 2014; Santa Clara Convention Center Download papers presented, order the AEF DVD

Tradeshow

 
Electronic Measurement Events in Europe, Middle East & Africa 
Electronic Measurement events in Europe, the Middle East, and Africa - seminars, trade shows, user group meetings, webcasts, tutorials and conferences.

Seminar

 
Eliminate the need for cumbersome multi-instruments setups for stress testing devices 
EMEA web seminar - Eliminate the need for cumbersome multi-instruments setups for stress testing devices

Webcast - recorded

 
European Microwave Week 2012 
European Microwave Week 2012

Tradeshow

 
How to test DisplayPort sink devices – Register here to view the recorded session. 
How to test DisplayPort sink devices – Register here to view the recorded session.

Training Materials 2009-11-22

 
Keysight's Events for United Kingdom and Ireland 
Welcome to Keysight's Upcoming Events Page for United Kingdom and Ireland

Seminar

 
Keysight's live webcasts 
Stay up to date by bookmarking this page to see the latest information on Keysight's webcasts.

Webcast

 
MIPI M-PHY, D-PHY and C-PHY Receiver Testing – Today and Tomorrow 
Original broadcast October 21, 2014

Webcast - recorded

 
New noise technology and its applications 
New noise technology and its applications – Life webcast on April, 17. Register now.

Training Materials 2008-04-08

 
Next generation BERT Ensures Signal Integrity in High-speed Digital Designs Webcast 
Original broadcast January 21, 2014

Webcast - recorded

 
PAM-4 Solutions for Transmit and Receive Design Characterization 
Live broadcast October 23, 2014; 10am PT / 1pm ET

Webcast

 
Semiconductor Parametric Test: Back to Basics Part 2 
The "Back to Basics Part 2" seminar provides practical tips and techniques on making fast pulse IV measurements and practical capacitance measurement considerations.

Webcast - recorded

 
Surmounting the Challenges of 16 Gigabit Operation with PCI Express Webcast 
Original broadcast Ocotber 1, 2014

Webcast - recorded

 
USB Test Challenges: Fast and Accurate Receiver Characterization Webcast 
Original broadcast July 16, 2014

Webcast - recorded

 
Video - Glitch free changing of timing parameters  
How to change timing parameters in real time and without glitches with the new 81160A Pulse Function Arbitrary Noise Generator

Webcast

 
View the recorded webcast - How to handle USB 3.0 physical layer test requirements 
How to handle USB 3.0 physical layer test requirements.

Training Materials 2011-11-08

 
View the recorded webcast - Introduction to MIPI device test 
Introduction to MIPI device test

Training Materials 2011-11-08